LED SUBSTRATE THICKNESS
Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description Remember that old acronym, GIGO? Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be of a certain quality to ensure maximum yield. Excessive TTV, Bow, and Warp lead to premature LED failure. LED manufacturers need to inspect incoming wafers. Wafer producers also need to check and control TTV, Bow and Warp. The market for sapphire wafers, driven by the growth in LED manufacturing, is booming. While the price [...]
Thermal Expansion on Automobile Engine
For years the sole purpose of the oil pan was to act as a reservoir for the engine lubricant. Some modern engines now utilize the pan as a structural component. It is machined from a rigid steel or aluminum casting and designed to support the lower portion of the crankshaft bearings and rear main seal. This development has introduced a potential problem area that must be analyzed. As engines go through heating and cooling cycles it is essential that the engine block and oil pan expand and contract at nearly the same rate. If not, stresses can be introduced [...]
Sales Network
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Portable Engine Balancing: Solving the Small Jet MRO Capacity Crunch
Introduction As the business and regional aviation sector continues its rapid growth, maintenance, repair, and overhaul (MRO) providers are struggling to keep up with demand. Portable engine-balancing technology allows maintenance teams—even less experienced staff—to perform precise vibration assessment and rapid, oneshot balancing onsite. Business Jet Fleet Growth Outpaces MRO Infrastructure The business aviation market has experienced unprecedented growth in recent years, with an increasing number of companies and private owners investing in small business jets for both personal and corporate travel. Increases in fractional ownership models and charter services are also helping drive growth. According to recent industry reports, [...]
PIEZO STAGE POSITIONING
Industry Consumer Electronics Applications Piezo Stage Measurement Type Positioning Description Positioning stages using piezoelectric stack actuators (PEA) have very high resolution. However, it is difficult to achieve precise dynamic motion tracking using traditional linear controllers such as PID due to the inherent hysteresis nonlinearity of piezoelectric materials and the phase lag associated with such controllers. Capacitance Sensors are ideal for measuring the actual piezo stage position and correcting for the inherent nonlinearity through closed loop feedback. They have the stability, bandwidth and high resolution needed to do the job. [...]
WAFER QA/QC AFTER SLICING AND POLISHING
Industry Semiconductor Applications Wafer Qa/Qc After Slicing And Polishing Measurement Type Surface Description When wafers are sliced up with wire saws, they are measured to make sure they are within the specified thickness, with minimal bow, warp, and TTV. After initial measurement, they are sorted and sent for polishing. Since polishing removes material and smoothes out the rough surfaces they need to be measured again to ensure they meet thickness guidelines and quality standards. Solution: MTI Instruments manufactures multiple systems to perform thickness measurements. From semi automated Proforma 300SA to manual wafer [...]
Piezoelectric Signal Conditioning with MTI Charge Amplifiers: From Portable 55CA/41CA to Rack-Mount CA1800 Solutions
Piezoelectric sensors deliver critical data for turbine balancing, structural health monitoring, and vibration analysis, only when paired with proper signal conditioning. Extracting clean, phase-accurate signals in environments with electromagnetic interference, temperature shifts, and cable effects remains a persistent challenge. Signal conditioning bridges the gap between the sensor and the measurement system. MTI Instruments offers a comprehensive portfolio of charge amplifiers designed to address the challenges of piezoelectric signal conditioning challenges across diverse applications. From the portable 55CA and 41CA units engineered for field turbine balancing to the multi-channel CA1800 rack-mount system for laboratory testing, MTI's line-up provides scalable solutions for [...]
ABOUT WAFER BOW AND WARP MEASUREMENT SYSTEMS
Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness encountered during a scan pattern or series of point measurements. TTV is expressed in microns or mils (thousandths of an inch). ASTM F534 3.1.2: The deviation of the center point of the median surface of a free, unclamped wafer from the median [...]
Accelerometer Signal Conditioning: From Charge to Voltage Conversion Explained
A piezoelectric accelerometer generates a tiny electrical charge when it vibrates. That charge, measured in picocoulombs, contains valuable information about machinery health, structural integrity, or performance characteristics. But here’s the problem: you can’t measure it reliably without proper signal conditioning. One of the fundamental challenges lies in the nature of the signal itself: high-impedance charge outputs generated by piezoelectric sensors versus the low-impedance voltage signals required by data acquisition systems and analyzers. Without proper signal conditioning, even the most accurate accelerometer can produce distorted, noisy, or unstable results. This creates a challenge for engineers working with vibration measurement systems. In [...]
LITHOGRAPHY OPTICS POSITION FOCUS
Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex lens systems such as those found in atomic force microscopes, vision inspection machines and photolithography tools. In a multi-million dollar photolithography tool, high accuracy, nanometer resolution and maximum thermal stability are absolutely critical to maintain proper focus and obtain integrated circuit line widths as small as 45 nanometers. Additionally, most systems demand low power consumption and maximum heat dissipation to eliminate any adverse affects from [...]