About Amanda McDonald

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So far Amanda McDonald has created 31 blog entries.

Manual vs. Semi-Automated Metrology Systems: An Analysis

In the world of precision measurement, metrology systems play a vital role. Choosing the right system – manual or semi-automated – can significantly impact the efficiency, accuracy, and overall productivity of your operations. As a provider of both manual and semi-automated metrology systems, MTI Instruments is uniquely capable of comparing their features, benefits, and what [...]

2023-10-16T05:35:59-07:00Blog, MTI Blog|

A Season of Learning: Unpacking Vitrek’s Fall Webinar Schedule!

As autumn leaves begin to fall, it’s time to cozy up with a hot cup of coffee and immerse yourself in a season of learning with Vitrek. We are excited to announce our Fall Webinar Schedule, an array of enlightening sessions designed to expand your knowledge and skills in the field of electrical safety testing [...]

2023-10-03T06:45:27-07:00Blog|

The Cost of Failing to Inspect Semiconductor Wafers

This is the second of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Most semiconductor wafers are made of silicon, the second most common element in the Earth’s [...]

GaGe Whitepaper: Wide Bandwidth Digitizer Provides Essential Data Processing in an Innovative Real-Time Channel Sounder for 5G Applications

Wide Bandwidth Digitizer Provides Essential Data Processing in an Innovative Real-Time Channel Sounder for 5G Applications By Gerald Allgaier, GaGe ( a Vitrek Brand) Introduction Orange Labs, the research & development division of the French telecommunications multi-national, Orange, presented a paper[1] at the 13th European Conference on Antennas and Propagation (EUCAP 2019) [...]

Case-In-Point: Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig

Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig Leverage MTI Instruments’ digital Accumeasure system to measure the thickness of the material used as anode and cathode plates in rechargeable Li-Ion battery cells Many roll-to-roll finishing processes typically use a calender, or series of hard pressure rollers, to [...]

The Basics of Insulation Resistance Testing and Why It’s So Important

An insulating material is one that resists electricity trying to flow through it. Insulators help resist shock and short circuits, making electrical insulation one of the most critical components in any building or system. This also means that measuring resistance is especially important, and you must have a clear understanding of the resistance levels [...]

Whitepaper: Three Vibration/Balancing Solutions for the Aviation Industry

Three Vibration/Balancing Solutions for the Aviation Industry MTI Instruments Offers a Variety of Solutions for Commercial, Regional & Military Jet Engine Balancing Applications Introduction Throughout the aviation industry, whether commercial or military, jet engine vibration is an everyday concern. Maintenance, repair, and overhaul crews worldwide are tasked with monitoring aircraft engine [...]

New Video from MTI! Closed-loop System to Monitor and Control Conductive Film Thickness During Manufacturing

Closed-loop System to Monitor and Control Conductive Film Thickness During Manufacturing This animation demonstrates how Accumeasure with capacitance probes can be used as a solution to measure and control conductive film thickness in a production line where these measurements can be fed back to a controller which adjusts the roller(s) to increase or [...]

Safety Recommendations for Setting Up a Hipot Testing Workstation

Hipot testing is necessary for ensuring the electrical safety compliance of electronic equipment. However, testing the voltage on commercial equipment can result in errors and even death if the operators have not been properly trained on the importance of establishing a safe testing environment. Before any tests are performed, operators should be thoroughly trained on [...]

WAFER MEASUREMENT – UNGROUNDED

Industry Semiconductor Applications Wafer Measurement – Ungrounded Measurement Type Metrology Description MTI Instruments Inc. has developed a thickness measurement device that eliminates the effect of varying target conductivity. Called the Push-Pull probe, it’s a unique version of the AccumeasureTM amplifier series. This special design provides accurate surface [...]

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