PAxx Power Analyzers using External Current Sensors: Application Notes

Current Sensors use two main techniques. A current transformer divides current. So for instance a 100:1 current transformer would see an input of 10A and output 100mA. Note that this technique is only useful for AC current. When using a current transformer you can directly input the current into one [...]

Google Scholar

Visit and View "GaGe Digitizer" on Google Scholar Visit and View "GaGe Applied Technologies" on Google Scholar Google Scholar is a dedicated search site for scholarly literature that includes academic research papers, technical articles, [...]

  • Semiconductor Wafer Measurement

The Cost of Failing to Inspect Semiconductor Wafers

This is the second of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for [...]

Cable & Wire Troubleshooting Made Easy

Cable & Wire Troubleshooting Made Easy Using MTI Instruments’ 1510A Precision Signal/Function Generator Aviation, Aerospace, Defense, Drones Energy (Hydro, Wind, Nuclear, Oil, Gas) Transportation (Automotive, Rail) Mining/Science Medical (Electromedical, [...]

  • 11 - material-calibration

led substrate sapphire thickness

N/A led substrate sapphire thickness Displacement Remember that old acronym, GIGO?  Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be [...]

Dynamic Measurement of Armature Gaps

Introduction In large motors and generators, the air gap needed to separate the revolving rotor from the stator should be as small as possible. This reduces the magnetizing power requirement which needs to be large [...]

  • Mikrotrak Lasers set up to measure thickness of extruded sheet metal

Thickness Information of Composite Materials

Thickness Information of Composite Materials Industrial Thickness Information Of Composite Materials Thickness Description Introduction: Composite materials consist of two or more materials which include a [...]

  • 01 - 1510A-with-case

Signal Generator Calibrates Strain Gauge Electronics

Signal Generator Calibrates Strain Gauge Electronics Industrial, Automotive, Transportation, Research & Development, Civil Engineering Calibration of Strain Gauge Electronics Amplitude; Bending, Tensile & Compression Description [...]

  • Alternating magnetic field and eddy currents

Signal Generator Simulates Eddy Current Probe

Signal Generator Simulates Eddy Current Probe Industrial, Power Generation, Automotive, Power Generation, R& D, Solar Simulation of Eddy Current Probe Gap, Amplitude, Displacement, Positioning, Thickness Description [...]

  • coplanarity

Capacitance Sensors Facilitate 3D IC Construction

Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's [...]

  • Setup for Semiconductor Wafer Lapping and Displacement Measurement

Semiconductor Wafer Lapping and Displacement Measurement

Semiconductor Wafer Lapping and Displacement Measurement Semiconductor Semiconductor Wafer Manufacturing Displacement Description Semiconductor Wafer Lapping and Displacement Measurement This application note explains how MTI's Accumeasure [...]

  • opposing probes in a fixture

Capacitance Sensors Track Brake Rotor Thickness Variation

Capacitance Sensors Track Brake Rotor Thickness Variation Automotive, Aviation/Aerospace Brake Rotor Testing & Manufacturing Displacement, Amplitude Description [Application Note 51018]Today’s cars and trucks offer unprecedented fuel [...]

  • Manufacturing facility rollers

Monitor Roller Gaps and Parallelism

Monitor Roller Gaps and Parallelism Industrial Printing, Calendering, Crushing Gap Easy Roller Gap Measurement Ensures Calendering Success Many roll-to-roll finishing processes typically use [...]

  • 08 - mti-2100

Displacement Measurement by Fiber Optics

Displacement Measurement by Fiber Optics Semiconductor, Research & Development 3D IC Construction Displacement, Vibration Description The Fotonic™ Sensor is a non-contact instrument which uses the [...]

  • small oscillatory motions

Dynamic Measurement of Small Oscillatory Motions

Dynamic Measurement of Small Oscillatory Motions Research & Development Piezoelectric Stack Motion Fotonic Systems Displacement Description This application note describes the measurement of a very small [...]

  • MTI Charge Amplifier

Ideal Charge Amplifier for Piezo Electric Transducers

Ideal Charge Amplifier for Piezo Electric Transducers Aviation (Turbine Engines), Automotive Research and Development, Industrial Manufacturing Vibration Monitoring: Turbine Engines; Vehicle Testing Pressure Monitoring: Combustion Engines; Pumps, Turbines [...]

Vibration and Balancing Systems: The Spectrum Plot

The Spectrum Plot – Types of Aircraft Vibration One of the least understood features of the PBS series of vibration analyzers is the spectrum function. The spectrum functionality is a more difficult function to [...]

  • Illustration of Capacitance Probe above grounded conductor with air gap and insulator in between

Thickness Measurement of Dielectric Materials

Thickness Measurement of Dielectric Materials Manufacturing EV Battery Production Thickness, Distance --- Description --- Introduction Many applications, both in manufacturing and research, require precise material thickness [...]

Wafer Characterization

Semiconductor Wafer Characterization Surface Description Thickness Measurement ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness [...]

  • Sensor

In-Situ Particle Detection

In-Situ Particle Detection Research & Development In-Situ Particle Detection Presence/Absence Description Introduction:  Foreign particles in food stuffs, plant produce, grains, etc. can lead to customer [...]

  • Stainless Steel Tube

Nuclear Heat Exchanger Vibration

Nuclear Heat Exchanger Vibration Power Generation Nuclear Heat Exchanger Vibration Amplitude Description Introduction: Power plants, particularly nuclear power plants, require heat exchangers to cool down [...]

  • Grey Block

Solenoid Door Latches

Solenoid Door Latches Aviation/ Aerospace Solenoid Door Latches Displacement Description A key supplier to the aerospace industry who manufactures many types of solenoid door latches [...]

  • View of software scan pattern for silicon wafer measurement

Brake Rotors

Brake Rotors Automotive Brake Rotors Surface Description Introduction Under normal operating conditions brake rotors are subjected to extreme temperatures and forces, which can cause rotor distortion [...]

  • Tire Tread

Tire Tread Measurement

Tire Tread Measurement Automotive Tire Tread Inspection Depth Description Tire manufacturers and Used Tire Reuse Centers want to satisfy their customers, and protect themselves from [...]

  • Manufacturing

Piezoelectric Device Amplitude

Piezoelectric Device Amplitude Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description Measuring Piezoelectric device amplitude including piezoceramic, 1-3 PZT/polymer [...]

  • Manufacturing

Angle Measurement And Monitoring

Angle Measurement And Monitoring Industrial Angle Measurement And Monitoring Robot Guide Description Introduction So what do sheet metal, speakers, and wine bottles all have in common? [...]

  • Ceramic Sheets

Piezoelectric Stack Motion

Piezoelectric Stack Motion Research & Development Piezoelectric Stack Motion Displacement Description Fotonic sensors are ideal for making dynamic measurement of very small oscillatory motions. Using the [...]

  • Wafer Measurements

Thickness and TTV of Semiconducting Wafers

Thickness and TTV of Semiconducting Wafers Semiconductor Thickness And TTV Of Semiconducting Wafers Thickness Description Introduction:  Silicon wafers are ordinarily highly conductive and easy to [...]

  • Microchip

Lithography Optics Position Focus

Lithography Optics Position Focus Semiconductor Lithography Optics Position Focus Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex lens [...]

  • 08 - camera-shield.jpg

Camera Shield Measurement

Camera Shield Measurement Consumer Electronics Camera shield measurement Surface Equipment Setup Equipment Used DTS-25-04 laser head Rotary Stage PC with Digital Microtrak Basic Support software [...]

  • 11 - 2D_tiretread

Tire Tread Measurement with 2D Laser

Tire Tread Measurement with 2D Laser Automotive Tire Tread Measurement with 2D Laser Depth Description To ensure customer safety and extend product life, tire manufacturers [...]

  • Wind Turbines

Gap Monitor Keeps Wind Turbines Running

Gap Monitor Keeps Wind Turbines Running Power Generation Wind Turbine Gap Monitoring Distance, Gap, Tolerance Description [Application Note 21218] Wind turbine production has been steadily [...]

  • Manufacturing

Windshield Manufacturing

Windshield Manufacturing Automotive Windshield Manufacturing Tolerances Description In order to maintain proper profile and thickness within a glass furnace the extrusion plate spacing must be [...]

  • Paving Roller

Road Surface Quality

Road Surface Quality Transportation Road Surface Quality Surface Description Introduction Various Departments of Transportation (DOTs), both nationally and internationally, are developing and incorporating automated road [...]

  • Microtrak 4

DC Motor / Commutator Bar

DC Motor / Commutator Bar Industrial Dc Motor / Commutator Bar Depth Description Using a MTI Microtrak 4 laser triangulation sensor to measure a DC [...]

  • Sheet Rock

Cement Board Quality Control

Cement Board Quality Control Industrial Cement Board Quality Control Dimensions Description Introduction: Cement backer board is used as underlayment for tile floors, walls and counter [...]

  • structure of inlet and die lip

Extruder Die Flatness

Extruder Die Flatness Industrial Extruder Die Flatness Thickness Description Introduction: Extruder dies have a flatness specification that must be maintained or the parts being extruded [...]

  • Manufacturing Sensor

Powdered Metal Level

Powdered Metal Level Industrial Powdered Metal Level Level Description Many precision and no-precision metal parts are made from powdered metal. The metal may be placed in [...]

  • Grey Block

Ice Detection

Ice Detection Industrial Ice Detection Presence/Absence Description Introduction:  Ships take in water from outside the hull to cool the engines and other auxiliary equipment. The [...]

  • Concrete Bricks

Fill Height Of Construction Blocks

Fill Height Of Construction Blocks Industrial Fill Height Of Construction Blocks Dimensions Description Introduction: When you construct a concrete block wall, the dimensions of the [...]

  • Turbine Blades

Blade Tip Clearance

Blade Tip Clearance Power Generation Blade Tip Clearance Tolerances Description Introduction Large turbines are periodically torn down, inspected, and rebuilt. Turbine blade clearance to the [...]

  • Motor

Tolerances of Armature Gaps

Tolerances of Armature Gaps Power Generation Tolerances Of Armature Gaps Tolerances Description Introduction In large motors and generators, the air gap needed to separate the [...]

  • Drill Heads

Ultrasonic Horn Vibration

Ultrasonic Horn Vibration Research & Development Ultrasonic Horn Vibration Amplitude Description An “ultrasonic horn” is the device which concentrates this energy and applies it to [...]

  • 270-958

Wafer Measurement – Ungrounded

Wafer Measurement - Ungrounded Semiconductor Wafer Measurement - Ungrounded Metrology Description MTI Instruments Inc. has developed a thickness measurement device that eliminates the effect of [...]

Wafer Thickness, Bow, Warp And TTV

Semiconductor Wafer Thickness, Bow, Warp And Ttv Surface Description Thickness Measurement ASTM F657: The distance through a wafer between corresponding points on the front [...]

  • Conveyor Belt

Tape Cartridge Movement

Tape Cartridge Movement Semiconductor Tape Cartridge Movement Positioning Description Researchers are presently working on drives with track widths in the 5 to 1 micron region. For [...]

  • Cutouts

Wafer QA/QC After Slicing And Polishing

Wafer QA/QC After Slicing And Polishing Semiconductor Wafer Qa/Qc After Slicing And Polishing Surface Description Introduction: When wafers are sliced up with wire saws, they are [...]

  • Manufacturing

Height Gap Of Inkjet Printers

Height Gap Of Inkjet Printers Consumer Electronics Height Gap Of Inkjet Printers Positioning Description Introduction:  Inkjet printers require a certain distance between the inkjet print [...]

  • Computer Motherboard

Electronics Parts Profiling

Electronics Parts Profiling Consumer Electronics Electronics Parts Profiling Thickness Description MTI's 2D laser sensors can be used to scan 3D profiles of items such as [...]

  • Manufacturing

Glass Thickness

Glass Thickness Consumer Electronics Glass Thickness Thickness Description Did you know that glass thickness can be measured with a capacitance probe? You will need some [...]

  • Power Box

Piezo Stage Positioning

Piezo Stage Positioning Consumer Electronics Piezo Stage Positioning Description Positioning stages using piezoelectric stack actuators (PEA) have very high resolution. However, it is difficult to [...]

Thread Checking

Automotive Thread Checking Presence/Absence Description Manual thread inspection is slow, not always reliable and tedious for the inspector. Manufacturers have struggled to come up [...]

  • Press

Spindle Run Out

Spindle Run Out Automotive Spindle Run Out Distance Description Rotating targets frequently have an intermittent, uncertain or nonexistent ground path. This introduces unwanted noise, instability, [...]

  • Manufacturing

Grinding Process

Grinding Process Automotive Grinding Process Surface Description A cylindrical grinding process finishes most wheel spindle surfaces. It is essential that this grinding process leave a [...]

  • Oil in liquid

Oil Film Thickness Measurement

Oil Film Thickness Measurement Automotive Oil Film Level Description A top marine engine manufacturer commissioned MTI Instruments to design and manufacture a non-contact sensor to [...]

  • Nut

Brake Rotors Thickness Variation

Brake Rotors Thickness Variation Automotive Brake Rotors Thickness Variation Surface Description Introduction Driving cross country or cross town, we give little thought to the operation or [...]

  • Fan

Torque Converter

Torque Converter Automotive Torque Converter Surface Description Since minute defects in the torque converter casing wall thickness can result in unacceptable and dangerous torque converter [...]

  • Manufacturing

Thermal Expansion On Automobile Engine

Thermal Expansion On Automobile Engine Automotive Thermal Expansion On Automobile Engine Dimensions Description For years the sole purpose of the oil pan was to act [...]

  • Manufacturing

Sheet Metal Monitoring

Sheet Metal Monitoring Automotive Sheet Metal Monitoring Thickness Description Introduction: When sheet metal is formed in a continuous process it needs monitoring during the actual [...]

  • Circuit Board

Wire Bonding

Wire Bonding Semiconductor Wire Bonding Level Description Introduction:  Machine automation frequently involves measuring small distances extremely accurately. Wire Bonding is one such application with some challenging [...]

  • Stack of black discs

GaAs Substrate Thickness Measurement

GaAs Substrate Thickness Measurement Semiconductor Gaas Substrate Thickness Measurement Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction:  Silicon wafers are ordinarily highly conductive [...]

  • Microchips

Photolithography Using Capacitance Sensors

Photolithography Using Capacitance Sensors Semiconductor Photolithography Using Capacitance Sensors Positioning Description When it comes to photolithography, how accurate are our sensors? Accurate enough to measure [...]

  • Silicon Carbide Wafer Demand is High

About Wafer Bow And Warp Measurement Systems

Semiconductor/Solar Wafer Bow And Warp Metrology/Surface About Wafer Bow And Warp Measurement Systems Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between [...]

TORQUE CONVERTER

Industry Automotive Applications Torque Converter Measurement Type Surface Description Since minute defects in the torque converter casing wall thickness can result in unacceptable and [...]

Windshield Manufacturing

Industry Automotive Applications Oil Film Measurement Type Level Description In order to maintain proper profile and thickness within a glass furnace the extrusion plate [...]

  • 03 - Brake-Rotor-Thickness-Variation.jpg

BRAKE ROTORS THICKNESS VARIATION

Industry Automotive Applications Brake Rotors Thickness Variation Measurement Type Surface Description Driving cross country or cross town, we give little thought to the operation [...]

OIL FILM THICKNESS MEASUREMENT

Industry Automotive Applications Oil Film Measurement Type Level Description A top marine engine manufacturer commissioned MTI Instruments to design and manufacture a non-contact sensor [...]

  • spindle run-out measurement

SPINDLE RUN OUT

Industry Automotive Applications Spindle Run Out Measurement Type Positioning Description Rotating targets frequently have an intermittent, uncertain or nonexistent ground path. This introduces unwanted [...]

  • 11 - material-calibration

GAAS SUBSTRATE THICKNESS MEASUREMENT

Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive [...]

  • 11 - probe_gap

LED SUBSTRATE THICKNESS

Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description Remember that old acronym, GIGO?  Garbage in garbage out, it can apply to [...]

PIEZO STAGE POSITIONING

Industry Consumer Electronics Applications Piezo Stage Measurement Type Positioning Description Positioning stages using piezoelectric stack actuators (PEA) have very high resolution. However, it is [...]

WAFER MEASUREMENT – UNGROUNDED

Industry Semiconductor Applications Wafer Measurement – Ungrounded Measurement Type Metrology Description MTI Instruments Inc. has developed a thickness measurement device that eliminates the effect [...]

LITHOGRAPHY OPTICS POSITION FOCUS

Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex [...]

  • 11 - Brake

BRAKE ROTORS

Industry Automotive Applications Brake Rotors Measurement Type Surface Description Under normal operating conditions brake rotors are subjected to extreme temperatures and forces, which can cause [...]

GLASS THICKNESS

Industry Consumer Electronics Applications Glass Thickness Measurement Type Thickness Description Did you know that glass thickness can be measured with a capacitance probe? You [...]

HEIGHT GAP OF INKJET PRINTERS

Industry Consumer Electronics Applications Height Gap Of Inkjet Printers Measurement Type Positioning Description Introduction:  Inkjet printers require a certain distance between the inkjet print [...]

Why Disc Geometry Matters In Wafer Production

This is the first of three articles in Semiconductor Wafer Measurement for Increased Profitability. The second article examines the cost of failing to inspect semiconductor wafers. The third article describes the benefits of using [...]

Wafer Stress Analysis Using the 300iSA

Wafer Stress Analysis Using MTI Instruments Proforma 300iSAWafer processing involves several stages that may translate into mechanical alterations. Sometimes these alterations can cause deformities that render the wafer either unusable or that put it marginally [...]

  • Figure 1 CMP

CMP and Capacitance-Based Semiconductor Wafer Measurement

Chemical mechanical polishing (CMP) uses chemical oxidation and mechanical abrasion to selectively remove material from semiconductor wafers in order to achieve very high levels of planarity. The planarity, or flatness, of these wafers is [...]

MEMS and Capacitance-Based Semiconductor Wafer Measurement

MEMS Technology and Capacitance-Based Wafer Measurement Micro-electrical-mechanical systems (MEMS) are tiny devices that house electrical and mechanical components on a single silicon chip or integrated circuit (IC). They integrate mechanical structures with electronics that [...]

  • wafer backgrinding 1

Wafer Backgrinding and Semiconductor Thickness Measurements

Wafer backgrinding is the first step in semiconductor packaging, the process of encasing one or more discrete semiconductor devices or integrated circuits (IC) for protection. Known also as wafer thinning or wafer lapping, backgrinding [...]

Silicon Carbide vs. Silicon in EV Power Electronics

Compare silicon carbide vs. silicon for electric vehicle (EV) power electronics and learn about SiC wafer measurement. As demand for electric vehicles (EVs) continues to grow, manufacturers are comparing two semiconductor technologies, silicon [...]

  • Accumeasure Solutions

Transducer Selection for High Resolution Applications

High resolution applications do not always require an interferometer. If you want to make accurate measurements in the micron to picometer range, then an MTI Digital Accumeasure D100 HD or D200 system may be [...]

Measure Wafer Bow, Warp and TTV with Capacitance

The flatness of silicon wafers used to manufacture integrated circuits is controlled to tight tolerances to help ensure that the whole wafer is sufficiently flat for lithographic processing. To ensure your wafer manufacturing process [...]

  • MTI-2100 Fotonic Sensor

Fiber Optic Sensor Measures Very Small Movements in Piezo Stacks

MTI Instruments, a global supplier of precision measurement solutions, has released an application note that explains how to measure very small movements in piezo devices that convert mechanical energy into electrical energy. Precision measurement [...]

  • backup - Wafer-Manufacturing

Five Common Mistakes with Semiconductor Wafer Measurement

Semiconductor wafer measurement requires a high degree of precision. The right metrology equipment and inspection processes are important, but so is procedural consistency and attention to detail. If you’re not getting the results you [...]

  • Capacitance Probes

Capacitance Probes: Five Things You Need to Know

Capacitance probes are non-contact measurement devices with a capacitance sensor inside a protective shell or housing. They use cables and connectors to integrate with amplifiers and are an important part of capacitance measurement systems. [...]

  • Capacitance Sensors

Capacitance Sensors: Three Things You Need to Know

Capacitance sensors are precision measurement tools for process automation, quality control, and tool automation control. They’re used in a many different industries and are suitable for virtually any application where accuracy is paramount. There’s [...]

  • Typical closed-loop control system

How to Implement a Complete Digital Closed Loop Control System

Co-authored by Don Welch, Director of Engineering and Business Development Cory Bufi, Software Engineer Isaac Abbott,Product Innovation Engineer – PBS Group Request Whitepaper Today’s electronic designs often call for reasonably fast and precise [...]

  • Fiber Optic Sensors

Fiber Optic Sensors Help Stop Subway Shutdown

Fiber optic sensors will help keep commuters moving between Manhattan and Brooklyn this year and beyond. Recently, New York Governor Andrew Cuomo announced that New York City’s Metropolitan Transit Authority (MTA) would not close [...]

  • Capacitance probe detecting water contamination

Oiling System Uses Capacitive Sensing to Detect Water Contamination

Water contamination can reduce the life of lubricants and increase the frequency of maintenance and repairs. If corrective action isn’t taken before an out-of-limit incident occurs, operational costs can escalate. When unplanned maintenance disrupts operations, [...]