Digital Accumeasure Gen 3
The Accumeasure D capacitance displacement sensor series amplifier is a revolutionary design that uses the latest technology to convert a highly reliable capacitive electric field measurement (displacement) directly into a highly precise 24 bit digital reading to accurately measure position, thickness, motion and vibration.
About Digital Accumeasure Gen 3
Our new capacitance amplifier converts the probe capacitance directly to target gap (distance). This direct conversion approach eliminates errors that traditional analog amplifiers have due to analog filtering, linearization, range extension and the summing of channels to obtain thickness or step measurements. With the Accumeasure D series, filter frequency response, sample rate, linearization and probe range are all digitally controlled. This ensures the most accurate data capture, lossless processing and the freedom from having to purchase additional acquisition hardware.
The standard feature quadrature encoder input, provides probe positional information simultaneously with its displacement signal by synchronizing displacement measurements to the probe position to provide accurate surface profiles of various conducting and semi-conducting targets. MTI’s Digital Accumeasure capacitance displacement sensor amplifiers comes standard with 24 bit USB/Ethernet digital output. The analog output model includes the analog output in addition to the standard digital output. Both may be used simultaneously. This is ideal for closed loop applications or integration into systems that require analog.
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Product Info | Technical Specifications | |||||||||||
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P/N | Model | Accuracy | Stand-Off | Resolution | Interface | Type | Frequency Response | Request Info | ||||
8000-6454-100 | DIGITAL D100 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | USB | 1-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D100 QUAD | ||||
8000-6454-110 | DIGITAL D110 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 1-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D110 QUAD | ||||
8000-6454-200 | DIGITAL D200 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | USB | 2-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D200 QUAD | ||||
8000-6454-201 | DIGITAL D201 QUAD | 0.01% FSR | Select PP Probes | up to sub-nanometer (select probes for specifications) | USB | 2-channel (PP) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D201 QUAD | ||||
8000-6454-202 | DIGITAL D202 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | USB | 2-channel (180) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D202 QUAD | ||||
8000-6454-210 | DIGITAL D210 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 2-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D210 QUAD | ||||
8000-6454-211 | DIGITAL D211 QUAD | 0.01% FSR | Select PP Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 2-channel (PP) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D211 QUAD | ||||
8000-6454-212 | DIGITAL D212 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 2-channel (180) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D212 QUAD | ||||
8000-6454-300 | DIGITAL D300 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | USB | 3-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D300 QUAD | ||||
8000-6454-310 | DIGITAL D310 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 3-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D310 QUAD | ||||
8000-6454-400 | DIGITAL D400 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | USB | 4-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D400 QUAD | ||||
8000-6454-401 | DIGITAL D401 QUAD | 0.01% FSR | Select PP Probes | up to sub-nanometer (select probes for specifications) | USB | 4-channel (PP) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D401 QUAD | ||||
8000-6454-402 | DIGITAL D402 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | USB | 4-channel (180) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D402 QUAD | ||||
8000-6454-410 | DIGITAL D410 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 4-channel (SE) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D410 QUAD | ||||
8000-6454-411 | DIGITAL D411 QUAD | 0.01% FSR | Select PP Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 4-channel (PP) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D411 QUAD | ||||
8000-6454-412 | DIGITAL D412 QUAD | 0.01% FSR | Select Capacitance Probes | up to sub-nanometer (select probes for specifications) | Analog and USB | 4-channel (180) | User Selectable 50Hz to 5kHz | Request Information on DIGITAL D412 QUAD |
Industry | Measurement Type | Applications |
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Semiconductor | Positioning | Photolithography using capacitance sensors |
Semiconductor | Positioning | Lithography Optics position focus |
Semiconductor | Thickness | LED substrate thickness |
Semiconductor | Thickness | GaAs substrate thickness measurement |
Semiconductor | Metrology | Wafer Measurement – Ungrounded |
Solar | Metrology | Wafer Bow and Warp |
Consumer Electronics | Thickness | Glass Thickness |
Consumer Electronics | Positioning | Piezo Stage |
Automotive | Distance | Spindle Run out |
Automotive | Level | Oil Film |
Automotive | Surface | Brake rotors thickness variation |
Automotive | Tolerances | Windshield Manufacturing |
Power Generation | Tolerances | Tolerances of Armature Gaps |
Research & Development | Presence/Absence | In-situ particle detection |
Automotive | Surface | Brake Rotors |
Semiconductor | Thickness | Thickness and TTV of semiconducting wafers |
Introduction to the Digital Accumeasure D400
Basic Setup
Measuring various materials
Measuring HP Printer Laser Head
Copper Foil Step Height Measurement
Push Pull Capacitance Probes for Differential Measurement
How do I determine the correct probe sensors for my application?
MTI’s New Non-Contact Hybrid Probe
P/N | Image | Model | Product Description |
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8000-6925 | Power Supply | DIN mount (includes power cord and 24VDC harness) | |
8000-6887 | Ethernet Cable | RJ45 to RJ45, 2.1 meter (7ft) | |
8000-6929 | USB Interface Cable | Micro USB-Male to USB Micro USB-Male, 1 meter (3.1ft) | |
8000-6882 | DIN Rail Section | 250mm (10inch) din rail for wall mounting power supply | |
8000-6889 | T-Connector | Synchronization adapter to daisy chain multiple systems | |
8000-6888 | Sync Cable | Cable to sync multiple systems (SMA-M to SMA-M) | |
7500-6811 | Fixture | Non-conductIve Material Fixture |
Accumeasure Analog Capacitance SystemUltra-high Precision Capacitive gap or displacement measurement gauge offering nanometer accuracy and stability.Request Quote Data SheetAccumeasure System 9000 is a high-resolution, capacitance-based instrument that … | |
Accumeasure AS-500 Modular Capacitance Rack SystemMulti-channel capacitance system designed for displacement, position and gap measurementRequest Quote Download Data Sheet Compact by design, the Accumeasure TM 500 capacitve sensing sensor is … | |
Capacitance Displacement and Gap Measurement ProbesHigh resolution, low cost sensors to measure gap and displacement in industries such as semiconductor, electronics, R&D applications and many more. For … |
A Deeper Look at the Biggest Features of Our Accumeasure Gen 3
MTI Instruments is proud to introduce the latest addition to our cutting-edge product line, the Accumeasure Gen 3. As a leader in the industry, we are committed to providing advanced solutions, and our latest offering is designed to deliver the kind of performance and ease of use you deserve.
Our Accumeasure Gen 3 is more than just an upgrade from its predecessors. This device is equipped with a revolutionary design that fully utilizes the latest technology to provide accurate and reliable measurements. It comes standard with a 24-bit USB/Ethernet digital output, allowing for seamless integration with your existing systems.
Key features like the ability to reduce noise while increasing resolution add to the versatility and value of the Accumeasure Gen 3. This means you can get more precise readings, even in challenging conditions. The new unit is a lower-noise amplifier than our Gen 2 model, ensuring optimal performance at all times.
Explore the Accumeasure Gen 3 in full detail when you get your hands on one. Contact MTI today to learn more.
How Non-Contact Capacitive Displacement Sensors Like Ours Have Changed the Game
Non-contact capacitive displacement sensors, such as the Accumeasure Gen 3 by MTI Instruments, have truly revolutionized many organizations. These innovative devices have brought about a paradigm shift in how measurements are conducted, offering an array of benefits that traditional methods simply cannot match.
Solar panel production relies heavily on exact measurements to ensure optimal functionality and energy output. The ability of non-contact capacitive displacement sensors to deliver highly accurate measurements without physical contact is crucial in avoiding damage to delicate solar cells during production. Their high resolution facilitates the detection of minute defects that might impact the panels’ performance, thereby enhancing quality control.
The automotive industry also reaps substantial benefits from these advanced sensors. From checking the uniformity of paint layers on a car body to monitoring the thickness of brake discs, non-contact capacitive displacement sensors provide reliable data without interfering with the materials being measured.
Semiconductor manufacturing also requires numerous stages where precise measurements are vital. For instance, during wafer production, even the slightest variation in thickness can lead to significant issues. Non-contact capacitive displacement sensors have proven invaluable for facilitating the consistent production of high-quality semiconductors, which is fundamental to the functioning of various electronic devices we rely on daily.
Do You Need a Digital Capacitance Displacement Sensor? Ask Yourself These Questions
Investing in a digital capacitance displacement sensor like our Accumeasure Gen 3 is a significant decision. Therefore, it’s important to understand whether this technology will meet your unique needs. Here are a few questions to consider:
- Do you need to measure non-conductive materials?
- Are you looking for a solution that offers high precision and resolution?
- Do you require a tool that can effectively reduce noise for more precise readings?
If you answered ‘yes’ to any of these questions, the Accumeasure Gen 3 could be the perfect fit for your needs.
Pair Your Capacitance Sensors With Additional Non-Contact Measurement Products From MTI
At MTI Instruments, we offer more than just capacitance sensors. We have a comprehensive range of non-contact measurement products designed to enhance your operations. Check out our Accumeasure HD and other options in our product line. Whether you’re looking for a displacement gauge, signal amplifier, or other advanced operating tools, we’ve got your back.
Ready to Upgrade Your Measurements with Accumeasure Gen 3? Get in Touch Today!
The Accumeasure Gen 3 opens up a world of superior performance, reliability, and versatility. Are you ready to experience the difference our Accumeasure Gen 3 can make in your operations? Contact MTI Instruments today. We’re prepared to assist you in making the most informed decision for your measurement needs.