News & Events

News & Events2023-12-05T05:45:23-08:00

Latest News!

Past News Releases

Upcoming Events…

2024

ATX-West – Booth # 3448
February 6-8-Anaheim, CA

Past Events

2023 Events

ATX Show – Booth # 3446
Anaheim, CA – February 7-9

APEC – Booth # 320
Orlando, FL – March 19-23

Dixie Crows Symposium – Booth # 49
Robins AFB, GA – March 21-22

Measurement Science Symposium – Booth 36
Disneyland, CA – April 4-7

MRO Americas – Booth 4516
Atlanta, GA – April 18-20

Del Mar Manufacturing Show – Booth # 524
San Diego, CA – April 26-27

Electrical Wire Processing Technology Expo – Booth #412
Milwaukee, WI – May 17-18

ASNT Research Symposium 2023
Columbus, OH – June 26-30

Semicon West 2023 – Booth 6180N
San Francisco, CA – July 11-13

MRO-Asia-Booth 726
Singapore-September 27-28

NBAA-BACE Business Aviation Convention-Booth C12636
Las Vegas, NV – October 17-19

APEC – Booth # 1503
Houston, TX – March 20-24

Dixie Crows Symposium – Booth #34
Robins AFB, GA – March 20-23

Del Mar Manufacturing Show – San Diego, CA
Booth #528 – May 4-5

Del Mar Manufacturing Show – San Diego, CA
Booth #528 – May 4-5

MSC Show – Booth #109
Anaheim, CA – May 16-19

IEEE ISPCE 2022
San Diego, CA – September 20-22

ATE San Diego Test Symposium
Roselle, CA – October 18

AOC Old Crows Convention – Visit us at the GigaTronics booth!
Washington, DC – October 25

ASNT Conference – Booth # 1111
Nashville, TN – October 31-November 3

NBA BACE Trade Show – Booth # 4688
Orlando, FL – October 18-20

ATX-West Booth # 3465
August 10-12 – Anaheim, CA

Lightfair – Booth # 2612
October 27-29 – New York City, NY

MSC Symposium – Booth #108
November 15-17 – Disneyland, CA

SEMICON – Booth #2043
December 7-9 – San Francisco, CA

ATX-West Booth # 3478
February 11-13 – Anaheim, CA

SAMPE Symposium – Booth #2
March 4 – Lancaster, CA

APEC Booth # 2145 – EVENT CANCELLED
March 17-18 – New Orleans, LA

* Be sure to check out our technical presentation at the APEC Show titled Power Source Testing: It’s More Than Just Efficiency!  Stay tuned for more details!

MSC Symposium – Booth #108 – Cancelled for 2020
March 24-27 – Disneyland, CA

PSES ISPCE Symposium
May 12-13 – Chicago, IL – Cancelled

ATX-East – Booth #130
New York, NY – June 11-13

Lightfair – Booth #3988
Philadelphia, PA – May 21-23, 2019

MSC Advancement in Measurement Technology Symposium – Booth # 108
Anaheim, CA – April 16-19

ViaSat Tech Fair
Carlsbad, CA – April 17, 2019

Del Mar Manufacturing Show (DMEMS) – Booth #524
San Diego, CA – May 1-2, 2019

ISPCE Symposium on Product Compliance Engineering
San Jose, CA – May 6-8, 2019

APEC Conference – Booth # 1170
Anaheim, CA – March 18-20, 2019
Check out our video from APEC 2019!

IEEE North Jersey Symposium
E. Hanover, NJ – October 3

PSES Safety Summit
San Diego, CA – October 8

San Diego Test Equipment Symposium
Roselle, CA – November 12

Articles

Article: Advanced Test Equipment Enables LED Lighting Manufacturers to Ensure Compliance with Standards-August, 2022-Designing-Electronics.com

Download a PDF Copy of this Article Download a PDF Copy of this Article

Why You Need Automotive Cable Tests Before Cars Hit the Road

The automotive industry deals with some of the most technologically diverse pieces of commercially available machinery worldwide — cars and trucks. As these machines continue [...]

A Comprehensive Guide to Non-Contact Sensors and Their Applications

A Comprehensive Guide to Non-Contact Sensors and Their ApplicationsSensors, both contact and non-contact, are crucial devices that allow the monitoring, detection, and reaction to conditions [...]

How Aircraft Operators Reduce Downtime While “Sweating the Assets”

In a recent article called “UPS Gives Old Jets New Life,” Bloomberg reports how United Parcel Service (UPS) is replacing the cockpit computers on [...]

Navy Orders Avionics Test and Measurement Systems

The U.S. Navy wants new avionics test and measurement systems. Under the terms of a $109-million award, the Naval Air Warfare Center Aircraft Division [...]

Functions & Features of Advanced Hipot Testers – as published in Test & Measurement Tips – 6/18

Functions and Features of Advanced Hipot Testers June 18, 2018 by Lee Teschler Modern instruments help to check whether manufactured equipment meets the proliferating variety [...]

Vendors Support Hipot, Insulation-Resistance and Ground-Bond Tests- as seen in Rick’s Blog on the EE Website – 7/18

Vendors Support Hipot, Insulation-Resistance and Ground Bond Tests by Rick Nelson - Evaluation Engineering - July 2018 To meet the requirements of your electrical safety [...]

Picking the Right Hipot Tester For The Job – as published in Power Systems Design Magazine – 9/2018

Picking the Right Hipot Tester for the Job Understanding the testing requirements and standards will ultimately save testing time and cost. By Kevin Clark, CEO, [...]

Application Notes

Digital Capacitance Sensor Provides Closed-Loop Piezo Positioning Control

Digital Capacitance Sensor Provides Closed-Loop Piezo Positioning Control Consumer Electronics, Industrial Closed-Loop Piezo Positioning Control Positioning, Robot Guide [...]

Signal Generator Tests Charge Amplifier Gain, Frequency Response

Testing Charge Amplifier Gain and Frequency Response with a Signal Generator Aviation/Aerospace, Industrial, Power Generation, Research & Development Charge [...]

Interfacing MTI’s Digital Accumeasure to Measurement Computing’s DASYLab with Modbus

Interfacing MTI's Digital Accumeasure to Measurement Computing's DASYLab with Modbus Interfacing MTI's Digital Accumeasure to Measurement Computing's DASYLab with [...]

MTI’s Accumeasure HD Amplifier vs. SmarAct’s PicoScale Interferometer

MTI's Accumeasure HD Amplifier vs. SmarAct's PicoScale Interferometer Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf [...]

Wireless Measurement of Very Small Gap Changes Inside Rotating Machinery

Solar, Semiconductor Measurement of Ungrounded Targets Thickness, Metrology Description Description This application note describes how to use capacitance for [...]

Ideal Charge Amplifier for Piezo Electric Transducers

Ideal Charge Amplifier for Piezo Electric Transducers Aviation (Turbine Engines), Automotive Research and Development, Industrial Manufacturing Vibration Monitoring: Turbine [...]

Case-In-Point: Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig

Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig     Leverage MTI Instruments’ digital Accumeasure [...]

Case-In-Point: High-Accuracy Capacitive Thickness Measurement Optimizes Li-Ion EV Battery Plate Qualities

High-Accuracy Capacitive Thickness Measurement Optimizes Li-Ion EV Battery Plate Qualities EV Battery manufacturers need to measure EV battery plate thickness with a high [...]

MTI App Note: Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig

Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig Leverage MTI Instruments' digital Accumeasure system to measure the [...]

MTI Application Note: How to Achieve <1um Accuracy When Measuring Roller Gap

How to Achieve <1um Accuracy When Measuring Roller Gap Roller Gap Measurement with MTI Digital Accumeasure Capacitive Probes Many roll-to-roll finishing processes typically use [...]

GaGe Application Note: Creating a Data Link Signal Integrity Test Platform

Creating a Data Link Signal Integrity Test Platform This application note describes how a manufacturer of data links utilizes GaGe Instruments’ PC-based high-speed [...]

MTI Application Note: Security of Flight Doors Improved Through Use of MTI-2100 Fotonic Sensor

Security of Flight Doors Improved Through Use of MTI-2100 Fotonic Sensor Increased Safety & Reliability for Aircraft Cockpit Doors NTSB safety records point [...]

MTI Application Note: Testing for Connector Failure Due To Vibration or Shock

Testing for Connector Failure Due to Vibration or Shock Mobile Communications Equipment Needs Reliable Connectors That Will Not Disconnect with Shock [...]

Application Note: How to Ensure Your LED Lighting Products Meet Industry Standards

Testing for performance, energy effeciency, consumption verification, quality and safety compliance during product development. Introduction Manufacturers and [...]

GaGe Application Note: Creating a Data Link Signal Integrity Test Platform

Download a PDF Copy of this App Note Data Link Device Testing The data link device under test (Figure 1) is characterized by comparing [...]

A Comprehensive Guide to Non-Contact Sensors and Their Applications

A Comprehensive Guide to Non-Contact Sensors and Their ApplicationsSensors, both contact and non-contact, are crucial devices that allow the monitoring, detection, and reaction to conditions [...]

Vitrek’s Automated Testing System Simplifies and Speeds Automotive Cable/Harness Testing

Vitrek's Automated Testing System Simplifies and Speeds Automotive Cable/Harness Testing Testing system combines a hipot tester with Vitrek’s 964i switching system and [...]

The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology

This is the third of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry [...]

Why Disc Geometry Matters In Wafer Production

This is the first of three articles in Semiconductor Wafer Measurement for Increased Profitability. The second article examines the cost of failing to inspect [...]

How Capacitive Measurement Can Help Reduce Packaging Waste

Product packaging is often made of lightweight polymeric foams or plastic sheets and films. These materials are relatively inexpensive, but manufacturers still want to [...]

Advantages of Measuring Semiconductor Thin Film Thickness with Capacitance

Semiconductor Thin Films: Measuring Thickness with Capacitance In the semiconductor industry, thin films are deposited onto silicon and other wafer materials one atomic layer [...]

Contact vs. Non-Contact Measurement and Linear Displacement Sensors

Contact vs. Non-Contact Measurement and Linear Displacement Sensors Linear displacement sensors are used to measure the distance between two points or two plane surfaces. [...]

Using Capacitance Sensors for Non-Conductive Material Measurement

Non-Conductive Material Measurement with Capacitance Sensors Capacitance sensors are non-contact devices that can be used to obtain position, thickness, and dynamic measurements with a [...]

Wafer Stress Analysis Using the 300iSA

Wafer Stress Analysis Using MTI Instruments Proforma 300iSAWafer processing involves several stages that may translate into mechanical alterations. Sometimes these alterations can cause deformities that [...]

Capacitance Probes vs. Strain Gauges in Piezo Flexure Stages

Capacitance probes with pico-positioning sensors can be embedded in piezo flexure stages. With minor mounting modifications, these non-contact probes provide significantly greater accuracy than [...]

CMP and Capacitance-Based Semiconductor Wafer Measurement

Chemical mechanical polishing (CMP) uses chemical oxidation and mechanical abrasion to selectively remove material from semiconductor wafers in order to achieve very high levels [...]

MTI Instrument’s PBS ROI Calculator: See How Much Money You Can Save

Ensuring the proper operation of your aircraft engine is essential to complying with manufacturers guidelines for the safety and longevity of the aircraft. Ensuring [...]

MEMS and Capacitance-Based Semiconductor Wafer Measurement

MEMS Technology and Capacitance-Based Wafer Measurement Micro-electrical-mechanical systems (MEMS) are tiny devices that house electrical and mechanical components on a single silicon chip or [...]

Measuring the Step Height Thickness of Non- Woven Conductive Films

Establishing and maintaining product quality throughout the production process is a common challenge of all manufacturers.  How does an organization ensure the optimal output [...]

Wafer Backgrinding and Semiconductor Thickness Measurements

Wafer backgrinding is the first step in semiconductor packaging, the process of encasing one or more discrete semiconductor devices or integrated circuits (IC) for [...]

Silicon Carbide vs. Silicon in EV Power Electronics

Compare silicon carbide vs. silicon for electric vehicle (EV) power electronics and learn about SiC wafer measurement. As demand for electric vehicles (EVs) [...]

EV Batteries Need Thickness Gauging for Lower Costs and Higher Performance

EV batteries need to cost less and last longer. Until the e-mobility industry solves these challenges, electric vehicle (EV) adoption won’t match the hype [...]

Transducer Selection for High Resolution Applications

High resolution applications do not always require an interferometer. If you want to make accurate measurements in the micron to picometer range, then an [...]

High Resolution Semiconductor Wafer Measurements at Lower Costs

MTI's Proforma technology characterizes semiconductor wafers in terms of bow and warp, thickness, total thickness variation (TTV) and center thickness. Until recently, [...]

Measure Wafer Bow, Warp and TTV with Capacitance

The flatness of silicon wafers used to manufacture integrated circuits is controlled to tight tolerances to help ensure that the whole wafer is sufficiently [...]

How to Measure Dielectric Separator Thickness in EV Batteries

The International Energy Agency predicts that as many as 125 million electric vehicles (EVs) will be on the road by 2030. At the heart [...]

Capacitance Sensing Provides Two Ways to Measure EV Battery Plate Thickness

MTI Instruments has released an application note that explains how to use capacitance to measure the thickness of the lithium battery plates in electric [...]

How Aviation MROs Can Maximize Labor Efficiency and Asset Uptime

MTI Instruments is supplying the aviation industry with solutions to the skilled labor shortage and reduced equipment availability. No, our Albany, New York company [...]

Trends in High Resolution Sensors for Semiconductor Metrology and Inspection

High resolution sensors are supporting improvements in semiconductor metrology and inspection at vital points in the production process. Because the fabrication of semiconductor wafers [...]

Position, Displacement, and Vibration Measurement with Precision, High Resolution, and Flexibility

The MTI-2100 Fotonic™ sensor uses advanced fiber optics and electronics to precisely measure position, displacement, and vibration. This high-resolution, non-contact metrology system supports a [...]

How the Aviation Industry Solves Vibration and Balancing Challenges

The aviation industry spends significant amounts of time and money on problems caused by engine vibration. Imbalance, the most common cause of engine vibration, [...]

Five Common Mistakes with Semiconductor Wafer Measurement

Semiconductor wafer measurement requires a high degree of precision. The right metrology equipment and inspection processes are important, but so is procedural consistency and [...]

3D Integrated Circuits Use Capacitive Sensing to Ensure Coplanarity

Three-dimensional (3D) integrated circuits (ICs) feature silicon wafers and dies that are stacked vertically for improved device performance. By using the Z-axis, 3D ICs [...]

White Papers

MTI Instruments Whitepaper: Capacitance Guide to Industrial Applications

Whitepaper: Why Capacitance? Benefits and Applications of Digital Capacitive Sensors

GaGe Whitepaper: Wide Bandwidth Digitizer Provides Essential Data Processing in an Innovative Real-Time Channel Sounder for 5G Applications

GaGe Whitepaper: Real-Time High-Speed Data Acquisition on PC-Based System Platforms

White Paper: Cable & Connector Test System Facilitates Multi-Point High Voltage/Current Testing

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