For information or support on legacy products contact MTI Instruments directly at MTISales@Vitrek.com. Accumeasure Wireless A low bandwidth solution for applications where wires are impossible. View Legacy Product Gap Measurement Probes A high-speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and [...]
https://www.youtube.com/watch?v=nGkbpG2sz_k Learn More Download this brochure to learn more about the Proforma 300i wafer measurement system for semiconducting and semi-insulating wafers. This article in AZO Sensors also provides information.
Valued PBS customers and partners: MTI Instruments prides itself on providing consistent, quality experiences for our customers. We recognize the importance of having products you can rely on to perform required functions consistently and accurately. As with any aging system, components become obsolete, parts become subject to wear and tear, software becomes vulnerable to [...]
Step Height Measurement (Thickness) of Copper Foil or EV Battery Film on a Roller Rig Leverage MTI Instruments’ digital Accumeasure system to measure the thickness of the material used as anode and cathode plates in rechargeable Li-Ion battery cells Many roll-to-roll finishing processes typically use a calender, or series of [...]
Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk [...]
Industry Semiconductor Applications Wafer Qa/Qc After Slicing And Polishing Measurement Type Surface Description When wafers are sliced up with wire saws, they are measured to make sure they are within the specified thickness, with minimal bow, warp, and TTV. After initial measurement, they are sorted [...]
Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness encountered [...]
Industry Consumer Electronics Applications Glass Thickness Measurement Type Thickness Description Did you know that glass thickness can be measured with a capacitance probe? You will need some equipment: Digital Accumeasure D200 ASP-2500-CTA Dielectric probe (The capacitance probe has a sensing area of 11.25 mm) [...]
MTI Instruments’ 1520 Portable Signal Simulator/Calibrator Wins Silver in LEAP Award’s “Test & Measurement” Category Prestigious Leadership in Engineering Achievement Program (LEAP) competition celebrates innovation in engineering design. The 1520’s clever game console design features a glove-friendly, two-handed controller and a color touchscreen for viewing high-precision graphical waveforms in the field. [...]
