Press Release: MTI Instruments’ WiFi-Enabled 1520 Portable Signal Simulator/Calibrator Brings Enhanced Functionality, Laboratory-Grade Accuracy Directly to Flightline and Test-Cell GalleryPress Release: MTI Instruments’ WiFi-Enabled 1520 Portable Signal Simulator/Calibrator Brings Enhanced Functionality, Laboratory-Grade Accuracy Directly to Flightline and Test-Cell
Brand-MTI, Industry-Aerospace, Industry-Government/Military, Industry-Manufacturing, Industry: Transportation, New & Press Releases, News-MTI-PBS, Press Releases-Vitrek, Products-MTI-Signal Generators, z1
Press Release: MTI Instruments’ WiFi-Enabled 1520 Portable Signal Simulator/Calibrator Brings Enhanced Functionality, Laboratory-Grade Accuracy Directly to Flightline and Test-Cell
MTI Instruments’ WiFi-Enabled 1520 Portable Signal Simulator/Calibrator Brings Enhanced Functionality, Laboratory-Grade Accuracy Directly to Flightline and Test-Cell Rugged and portable, the 1520 signal simulator offers up to 10 hours of battery life and extends remote operation; Market-leading visualization and ergonomic features for testing/calibrating sensor-driven aviation systems; Unique WiFi capability eliminates need for second technician to conduct tests . . . Lockport, IL — May 3, 2022 — MTI Instruments, a U.S.-based manufacturer of advanced test and measurement equipment, introduces the 1520 Signal Simulator and Calibrator offering market-leading WiFi connectivity, ergonomic and visualization features, and up to 10 hours [...]
Laser Measurement & Characterization of Flat Panel Displays
Laser Measurement & Characterization of Flat Panel Displays Customer Case This customer's application involves the characterization of flat panel displays (used in laptop computers, computer game displays, etc.) via laser scanning. The laser is bounced off a number of mirrors and then through lenses, from which it is scattered. The scattered laser light must then be analyzed in order to determine the quality of the flat panel display. This laser measurement system is used not only by flat panel display industries, but also by disk drive manufacturers to analyze platter quality and, in the near future, for characterizing silicon [...]
Press Release: Vitrek Acquires MTI Instruments, Expanding Its Portfolio of Precision Measurement Solutions GalleryPress Release: Vitrek Acquires MTI Instruments, Expanding Its Portfolio of Precision Measurement Solutions
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Press Release: Vitrek Acquires MTI Instruments, Expanding Its Portfolio of Precision Measurement Solutions
Vitrek Acquires MTI Instruments, Expanding Its Portfolio of Precision Measurement Solutions Vitrek's product portfolio now includes precision measurement tools for applications including turbine balancing and vibration analysis and non-contact measurements Poway, CA - April 13, 2022 — Vitrek, the leader in high-voltage test and measurement equipment and board-level data acquisition systems, announces the acquisition of MTI Instruments, a U.S.-based manufacturer of sophisticated test and measurement equipment. MTI Instruments' precision tools, systems and solutions are utilized in non-contact metrology, position, displacement and vibration applications within the design, QA/QC, manufacturing, production, test and research markets. Products include: Turbine Engine/Rotating Machine [...]
Laser Signals Striking Silicon-Diode Target
Laser Signals Striking Silicon-Diode Target Customer Case The customer wants to capture the output of some silicon diodes looking at a laser target. The typical signal is anywhere from 20mv to 1V in amplitude and 0 to 15ns in length. There are up to 16 of these diodes that are looking at the same target. Each diode has a different filter so the post-trigger depth and amplitude-scale must be user-adjustable. Their main interest is to sample and digitize the signals for archiving, with later retrieval and plotting. Fancy software is not needed for display as the data is gathered [...]
Soluna Holdings Announces Sale of its MTI Instruments Business
$10.75 Million Sale Price Allows for Further Acceleration of Cryptocurrency Mining Business Soluna Holdings, Inc. (“SHI” or the “Company”), (NASDAQ: SLNH), the parent company of Soluna Computing, Inc. (“SCI”), a developer of green data centers for cryptocurrency mining and other intensive computing, today announced the sale of its MTI Instruments subsidiary to Vitrek LLC, a strategic buyer in the test and measurement space. Per the sale agreement, the Buyer is acquiring 100% of the common stock of MTI Instruments for $10.75 million. With the sale completed, Soluna Holdings expects that it will be solely focused on developing and monetizing [...]
Optical Scanning of Drive Media
Optical Scanning of Drive Media Customer Case The customer's application is optical scanning for drive testing. The goal is to identify burnt or damaged spots on the disk. The scanning system is generally used in Quality Control, Head-Disk Interaction and Failure Analysis. There is a need for continuous acquisition during the spiral scan. The speed of the disk is 10,000 RPM and the requirement is to capture 65,000 to 80,000 samples each revolution. A single channel is needed for the acquisition at 10 MegaSamples/second or greater. High vertical resolution will aid in measuring the properties and ultimately the degradation [...]
White Paper: High Performance Test Equipment Assures LED Lighting Products Comply with Industry Standards GalleryWhite Paper: High Performance Test Equipment Assures LED Lighting Products Comply with Industry Standards
Brand-Vitrek, Industry-Consumer Products, Industry-Lighting, News-Industry, News-Vitrek, Products-Vitrek, Whitepapers-Vitrek, z1
White Paper: High Performance Test Equipment Assures LED Lighting Products Comply with Industry Standards
Introduction Manufacturers and users of LED lighting applications need to be assured that their products will be qualified according to a multitude of reliability and efficiency standards. In addition to voluntary initiatives and programs like EnergyStar, mandatory standards and specifications for the lighting industry must be kept in mind during project development, including the latest IES LM-79-19 and the ANSI C82.16 documents. This article gives an overview of relevant lighting standards and specifications for LED lighting products. It also describes the features of Vitrek’s test equipment, including the PA900 power analyzer — featuring built-in lighting specifications — as [...]
Disk Drive Track Scanning
Disk Drive Track Scanning Customer Case The customer is trying to digitize an 83 millisecond long signal coming out of a disk mounted on a rotary motor. This corresponds to one full revolution of the disk. The analog signal coming out of the Device Under Test (DUT) is of approximately 2 MHz bandwidth. Currently, the customer is sampling at 10 MSPS and would like to increase the oversampling to get better time resolution. At present, they are using a CompuScope 225 - 1M, which has sufficient memory to digitize the entire revolution in on-board memory at the 10 MSPS [...]
The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology GalleryThe Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology
Application Notes-MTI, Brand-MTI, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, News-MTI-Metrology, Products-MTI-Semiconductor/Metrology, z1
The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology
This is the third of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The second article examines the cost of failing to inspect semiconductor wafers. Fully automated systems that can load, scan, and unload wafers are fast, convenient, and efficient at high volumes. They’re useful for checking every wafer in every batch, but these systems are expensive. Semi-automated and manual systems cost significantly less and are generally used for lower volumes; however, they’re also easy-to-use and can make fast, accurate measurements that support production flow. Semi-automated and [...]
Why Disc Geometry Matters In Wafer Production GalleryWhy Disc Geometry Matters In Wafer Production
Application Notes-MTI, Brand-MTI, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, News-MTI-Metrology, Products-MTI-Semiconductor/Metrology, z1
Why Disc Geometry Matters In Wafer Production
This is the first of three articles in Semiconductor Wafer Measurement for Increased Profitability. The second article examines the cost of failing to inspect semiconductor wafers. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec after cutting, it may be possible to reprocess the wafer. Cutting is only the first [...]