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Vitrek Knowledge Center

Welcome to Vitrek's Knowledge Center! As the industry leader for test, measurement and high-speed data acquisition, we are proud to provide a wealth of knowledge and resources for our industries and markets we serve.   Use the links below to learn more about Vitrek's vast portfolio of products. Measurement Fundamentals [...]

2023-07-28T11:14:27-07:00

Capacitance Sensors Facilitate 3D IC Construction

Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting [...]

Adding a Digital Panel Meter to MTI Analog Output Products

Adding a Digital Panel Meter to MTI Analog Output Products Consumer Electronics Electronics Parts Profiling Thickness Description Some MTI Products with Analog outputs, Accumeasure 9000 and Microtrak 3 laser  How To Use Digital Displays with Analog Outputs MTI Microtrak 3 Lasers and some [...]

Thickness Gauge Measurement With Conductive Wafers and Thin Films

Thickness Gauge Measurement With Conductive Wafers and Thin Films Consumer Electronics Electronics Parts Profiling Thickness Description Using MTI's capacitive thickness gauge Proforma 300i with conductive wafers and thin films G = (a+b+t1+t2 ) Where G is the fixed gap between two probes When making [...]

Measuring Piezoelectric Properties with Fiber Optics

Measuring Piezoelectric Properties with Fiber Optics Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description MTI-2000 Fotonic Sensor Introduction Researchers from the University of Arizona used the MTI-2000 Fotonic Sensor to measure the indirect piezoelectric properties (d33) and [...]

Semiconductor Wafer Lapping and Displacement Measurement

Semiconductor Wafer Lapping and Displacement Measurement Semiconductor Semiconductor Wafer Manufacturing Displacement Description Semiconductor Wafer Lapping and Displacement Measurement This application note explains how MTI's Accumeasure technology was used with a lapping machine to measure displacement (wafer material removal) and determine the new semiconductor wafer thickness. [...]

Cable & Wire Troubleshooting Made Easy

Cable & Wire Troubleshooting Made Easy Using MTI Instruments 1510A Precision Signal/Function Generator Aviation, Aerospace, Defense, Drones Energy (Hydro, Wind, Nuclear, Oil, Gas) Transportation (Automotive, Rail) Mining/Science Medical (Electromedical, Electro -therapeutic) Environmental Control (Construction / Roads, Water Management) Integrity of Electrical Cabling/Wire Continuity/Resistivity Analysis Signal Integrity Validation [...]

led substrate sapphire thickness

N/A led substrate sapphire thickness Displacement Remember that old acronym, GIGO?  Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be of a certain quality to ensure maximum yield. EXCESSIVE TTV, BOW, AND WARP LEAD TO PREMATURE LED FAILURE LED MANUFACTURERS [...]

Dynamic Measurement of Armature Gaps

Introduction In large motors and generators, the air gap needed to separate the revolving rotor from the stator should be as small as possible. This reduces the magnetizing power requirement which needs to be large enough to prevent contact between the two, despite manufacturing tolerances on their dimensions or movement resulting from mechanical deflection or [...]

Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution

Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution Animation showing a system setup used to measure the thickness of thin conductive films such as electric vehicle (EV) battery electrodes. Description Learn how to measure EV battery plate thickness with MTI’s Digital Accumeasure, a high-precision capacitance [...]

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