Review for Republishing
Welcome to Vitrek's Knowledge Center! As the industry leader for test, measurement and high-speed data acquisition, we are proud to provide a wealth of knowledge and resources for our industries and markets we serve. Use the links below to learn more about Vitrek's vast portfolio of products. Measurement Fundamentals [...]
Signal Generator Calibrates Strain Gauge Electronics Industrial, Automotive, Transportation, Research & Development, Civil Engineering Calibration of Strain Gauge Electronics Amplitude; Bending, Tensile & Compression Description [Application Note 31218] The strain gauge has been in use many years and is the fundamental sensing element for many [...]
Signal Generator Simulates Eddy Current Probe Industrial, Power Generation, Automotive, Power Generation, R& D, Solar Simulation of Eddy Current Probe Gap, Amplitude, Displacement, Positioning, Thickness Description [Application Note 31218] Non-contact eddy current probes can be used to measure the position, or position change, of conductive [...]
Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting [...]
Adding a Digital Panel Meter to MTI Analog Output Products Consumer Electronics Electronics Parts Profiling Thickness Description Some MTI Products with Analog outputs, Accumeasure 9000 and Microtrak 3 laser  How To Use Digital Displays with Analog Outputs MTI Microtrak 3 Lasers and some [...]
Thickness Gauge Measurement With Conductive Wafers and Thin Films Consumer Electronics Electronics Parts Profiling Thickness Description Using MTI's capacitive thickness gauge Proforma 300i with conductive wafers and thin films G = (a+b+t1+t2 ) Where G is the fixed gap between two probes When making [...]
Measuring Piezoelectric Properties with Fiber Optics Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description MTI-2000 Fotonic Sensor Introduction Researchers from the University of Arizona used the MTI-2000 Fotonic Sensor to measure the indirect piezoelectric properties (d33) and [...]
Semiconductor Wafer Lapping and Displacement Measurement Semiconductor Semiconductor Wafer Manufacturing Displacement Description Semiconductor Wafer Lapping and Displacement Measurement This application note explains how MTI's Accumeasure technology was used with a lapping machine to measure displacement (wafer material removal) and determine the new semiconductor wafer thickness. [...]
Cable & Wire Troubleshooting Made Easy Using MTI Instruments’ 1510A Precision Signal/Function Generator Aviation, Aerospace, Defense, Drones Energy (Hydro, Wind, Nuclear, Oil, Gas) Transportation (Automotive, Rail) Mining/Science Medical (Electromedical, Electro -therapeutic) Environmental Control (Construction / Roads, Water Management) Integrity of Electrical Cabling/Wire Continuity/Resistivity Analysis Signal Integrity Validation [...]
N/A led substrate sapphire thickness Displacement Remember that old acronym, GIGO?  Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be of a certain quality to ensure maximum yield. EXCESSIVE TTV, BOW, AND WARP LEAD TO PREMATURE LED FAILURE LED MANUFACTURERS [...]
