Industry-Semiconductor-Vitrek

Vitrek Highlights Growing Importance of Wafer Stress Characterization for Advanced Semiconductor Manufacturing MTI Instruments Proforma™ non-contact wafer metrology systems help manufacturers optimize thin-film processes, improve process control, and increase production yield. Lockport, IL — July 28, 2026— Vitrek, a leading manufacturer of precision test and measurement equipment, highlighted the growing importance of wafer stress measurement in semiconductor manufacturing as advanced packaging, heterogeneous integration, silicon carbide (SiC), gallium nitride (GaN), MEMS, and photonics applications continue to drive demand for tighter process control, improved manufacturing consistency, and higher device reliability. As semiconductor manufacturing processes become increasingly complex, engineers are [...]

Vitrek Highlights Growing Importance of Wafer Stress Characterization for Advanced Semiconductor Manufacturing MTI Instruments Proforma systems help semiconductor manufacturers monitor backside processing for HBM, chiplets and next-generation computing devices LOCKPORT, Il — September 23, 2026 — Vitrek is highlighting the growing importance of precision wafer-thickness measurement as semiconductor manufacturers expand production of GPU/AI Engines, high-bandwidth memory, Traditional CPUs, Programmable logic, and Power Semiconductors. Advanced packaging technologies combine logic, memory, interposers and specialized dies within tightly controlled structures. To meet package-height and integration requirements, wafers often undergo backside grinding, polishing and other thinning operations. As wafers become thinner, [...]