High-Performance Digitizers in Semiconductor Manufacturing Applications PC-based high-speed, high-resolution digitizers perform critical data acquisition functions during semiconductor fabrication, die packaging, and final chip testing. Introduction Data acquisition is a critical element of quality control and compliance testing during three stages of semiconductor manufacture. The first stage is fabrication, in which single-crystal semiconductor wafers are subject to various operations that leave them imprinted with micro-circuitry patterns. During the second stage, the wafers are diced up into individual silicon “die” that are packaged into final chips. The third stage involves functional testing of the final chips to [...]