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Press Release: Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics

Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics Vitrek 95X Series offers 100 pico-amp resolution for detecting micro-level insulation defects in safety-critical industries. Lockport, IL—February 11, 2026 — Vitrek, a US-based manufacturer of high-precision test and measurement equipment, offers the 95X Series hipot tester with 100 pico-amp leakage current resolution for detecting micro-level insulation defects in safety-critical industries. Designed for medical devices, aerospace avionics, and high-reliability electronics, the Vitrek 95X Series ensures that early-stage insulation degradation is detected before catastrophic failures occur. Why 100 Pico-Amp Resolution Matters [...]

By |February 4th, 2026|Categories: New & Press Releases, News-Events, News-MTI, Press Releases-GaGe, Press Releases-MTI, Press Releases-Vitrek|Comments Off on Press Release: Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics

Press Release: Accumeasure Capacitive Wafer Measurement Tools Reduce Start-up Costs for Specialty Fabs & Their Tier Ones

Accumeasure™ Capacitive Wafer Measurement Tools Reduce Start-up Costs for Specialty Fabs & Their Tier Ones Vitrek’s Cost-Sensitive Accumeasure Capacitance-Based Metrology System Simplifies the Development of Adaptable High-Precision Equipment—Especially in USA Lockport, IL — February 5, 2026 — Vitrek, a US-based leader in precision measurement instruments, today announced the expanded capabilities of its MTI Accumeasure Capacitance Technology.  Designed to make high-precision wafer metrology more accessible to start-up and smaller niche semiconductor equipment makers, Vitrek’s Accumeasure technology provides a compact, cost-effective alternative to traditional high-end optical systems that are often too bulky or expensive for new market entrants. Key [...]

By |February 4th, 2026|Categories: New & Press Releases, News-MTI-Metrology, Press Releases, Press Releases-MTI|Comments Off on Press Release: Accumeasure Capacitive Wafer Measurement Tools Reduce Start-up Costs for Specialty Fabs & Their Tier Ones

Press Release: MTI Instruments’ Proforma 300iSA Handles Critical Multi-Material Wafer Inspection for a Rapidly Evolving Industry

MTI Instruments’ Proforma 300iSA Handles Critical Multi-Material Wafer Inspection for a Rapidly Evolving Industry Universal semi-automated platform measures diverse wafer materials and surfaces with SEMI and ASTM standard compliance. Lockport, IL—20 January 2026-Vitrek announced today that its Proforma 300iSA semi-automated metrology system has proven capable of supporting wafer inspection across a growing range of semiconductor materials, wafer sizes, and surface finishes including silicon (Si), silicon carbide (SiC), gallium arsenide (GaAs), and indium phosphide (InP). Inspection systems are being pushed to handle more various materials and tighter processes as device manufacturers move beyond traditional silicone into compound semiconductors [...]

By |January 20th, 2026|Categories: New & Press Releases, News-MTI-Metrology, Press Releases, Press Releases-MTI|Comments Off on Press Release: MTI Instruments’ Proforma 300iSA Handles Critical Multi-Material Wafer Inspection for a Rapidly Evolving Industry

Radio Astronomy Measurements Using a GaGe RazorMax Digitizer

Radio Astronomy Measurements Using a GaGe RazorMax Digitizer Introduction Radio astronomy relies on highly sensitive measurements of weak electromagnetic emissions originating from cosmic sources, including galactic hydrogen clouds, star-forming regions, pulsars, and the Cosmic Microwave Background (CMB). These emissions typically fall below 10 GHz, spanning the radio-frequency (RF) and microwave bands. In many cosmological studies—particularly those investigating early-universe star formation—signals of interest are concentrated well below 300 MHz. In the application described here, a customer is monitoring astronomical RF emissions centered near 100 MHz, originating from extremely distant sources. At [...]

By |January 13th, 2026|Categories: Brand-GaGe, Knowledge Center-GaGe, News-GaGe, Whitepapers-GaGe|Comments Off on Radio Astronomy Measurements Using a GaGe RazorMax Digitizer

Hipot Tester Promotion: Order a Vitrek Hipot Tester & Receive a Free TL-115X!

V7X & 95X Hipot Testers Engineered for Accuracy — Built in America TL-115X NEMA 5 POWER SOCKET TEST ADAPTER LEAD SET TL-115x Test Adapter Lead Sets are compact accessories designed for seamless use with Vitrek’s hipot electrical safety testers and are available in two configurations to match different testing needs. The TL-115-1 provides a standard 115 V NEMA 5-15 power-socket interface for efficient dielectric (hipot) testing of corded devices, while the TL-115-2 adds integrated ground bond test capability, allowing both tests to be performed using a single adapter set. The TL-115-3 [...]

By |January 6th, 2026|Categories: Brand-Vitrek, News-All Brands, News-Vitrek, Products-Vitrek-Power-Analyzer, Promotions|Comments Off on Hipot Tester Promotion: Order a Vitrek Hipot Tester & Receive a Free TL-115X!

Press Release: Today’s Wafer Designs Put Premium on Precision— 300i Increases ROI

Today’s Wafer Designs Put Premium on Precision— 300i Increases ROI Value of incoming wafer inspection with 300i’s ±0.25µm accuracy far outweighs potential for costly downstream yield losses Lockport, IL, - December 16, 2025- Semiconductor fabrication facilities risk substantial financial exposure from incoming wafers defects. With typical lot sizes of 25 wafers and finished wafer values ranging from $4,000 to $17,000, depending on complexity, a single contaminated lot can translate into  $100,000 to $425,000 in processed material losses – plus  the costs of  production delays,   Vitrek’s affordable Proforma 300i manual metrology system, provides the precision needed to insure y [...]

By |December 3rd, 2025|Categories: New & Press Releases, News-MTI-Metrology, Press Releases, Press Releases-MTI|Comments Off on Press Release: Today’s Wafer Designs Put Premium on Precision— 300i Increases ROI

Press Release: MTI’s Proforma 300iSA Combines SEMI and ASTM Standard Compliance in Space-Efficient Benchtop Design

MTI's Proforma 300iSA Combines SEMI and ASTM Standard Compliance in Space-Efficient Benchtop Design The Proforma 300iSA combines ASTM and SEMI standard measurements in a compact, desktop system for flexible semiconductor metrology. Lockport, IL, November 18, 2025 – Vitrek, a leading U.S. designer of precision measurement systems, has introduced the MTI Instruments Proforma 300iSA Semi-Automated Metrology System. The benchtop system delivers full SEMI and ASTM compliance in a compact footprint—offering laboratory-grade precision without the space demands of traditional floor-mounted equipment. “The Proforma 300iSA represents a fundamental shift in how manufacturers approach precision metrology,” said Todd Stukenberg, President at [...]

By |November 18th, 2025|Categories: Industry-Semiconductor-MTI, New & Press Releases, News, News-MTI-Instrumentation, Press Releases, Press Releases-MTI|Comments Off on Press Release: MTI’s Proforma 300iSA Combines SEMI and ASTM Standard Compliance in Space-Efficient Benchtop Design

Press Release: Vitrek Breakthrough: Time-Saving MTI “Trim Balance Wizard” Now Available for Mid-Frame Jet Engine MROs

Vitrek Breakthrough: Time-Saving MTI “Trim Balance Wizard” Available for Mid-Frame Jet Engine MROs Innovative Trim Balance Wizard Enables Fast Turbine Balancing by Novice Technicians. Lockport, IL—November 5, 2025 — Vitrek, LLC, a maker of high- precision measurement equipment, has integrated the MTI Trim Balance Wizard, an advanced guided-balancing interface into its PBS eXpress turbine vibration and balancing system for smaller frame jet engines. The Trim Balance Wizard functionality was previously only available to large jet makers and MROs as part of the standard PBS product line. Now incorporated into the PBS eXpress this same labor-saving technology is [...]

By |October 28th, 2025|Categories: Industry-Aerospace, Industry-Government/Military, New & Press Releases, News-All Brands, News-MTI-PBS, News-Product Updates, Press Releases-MTI|Comments Off on Press Release: Vitrek Breakthrough: Time-Saving MTI “Trim Balance Wizard” Now Available for Mid-Frame Jet Engine MROs

Press Release: Vitrek, LLC Appoints Todd J. Stukenberg as President

Vitrek, LLC Appoints Todd J. Stukenberg as President Lockport, IL, October 22, 2025— Vitrek, LLC (“Vitrek”), a leading provider of high-performance industrial test and measurement equipment, is pleased to announce the appointment of Todd J. Stukenberg as its new President. Stukenberg brings more than 20 years of experience in advanced testing and measurement, along with a proven track record in global marketing program development and execution, talent management, and strategic planning. In his new role, Stukenberg will focus on driving growth across key industries—including semiconductors and aerospace—by leveraging Vitrek’s portfolio of innovative and complementary brands: Vitrek, MTI [...]

By |October 20th, 2025|Categories: New & Press Releases, News-Events, News-MTI, Press Releases-GaGe, Press Releases-MTI, Press Releases-Vitrek|Comments Off on Press Release: Vitrek, LLC Appoints Todd J. Stukenberg as President

Press Release: Vitrek to Showcase Transformative Accumeasure™ Capacitance Sensors at SEMICON West 2025

Vitrek to Showcase Transformative Accumeasure™ Capacitance Sensors at SEMICON West 2025 Bringing a New a Level of Precision, Affordability for Semiconductor Wafer Makers Lockport, IL, October 1, 2025 – Vitrek, LLC (“Vitrek”) a leader in high-performance test and measurement equipment, announced today that it will showcase its expanded Accumeasure capacitance measurement product line at the SEMICON West exhibition on October 7-9, 2025, at the Phoenix Convention Center in Phoenix, Arizona. Along with the established Accumeasure analog and digital test systems will be samples of the Accumeasure HD, offering the highest-resolution non-contact capacitance system in the world.  Developed [...]

By |September 29th, 2025|Categories: New & Press Releases, News-Events, News-MTI, Press Releases-GaGe, Press Releases-MTI, Press Releases-Vitrek|Comments Off on Press Release: Vitrek to Showcase Transformative Accumeasure™ Capacitance Sensors at SEMICON West 2025
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