Thickness and TTV of Semiconducting Wafers
Thickness and TTV of Semiconducting Wafers Semiconductor Thickness And TTV Of Semiconducting Wafers Thickness Description Introduction:  Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk resistivity (>10k Ohm/cm) is a little more difficult because the wafers act as non-conductive insulators in a capacitive sensors measuring field. Fortunately, MTI has a solution to this problem. Solution:  It’s possible to measure the thickness and TTV of high resistivity semiconducting wafers (like GaAs) [...]
Lithography Optics Position Focus
Lithography Optics Position Focus Semiconductor Lithography Optics Position Focus Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex lens systems such as those found in atomic force microscopes, vision inspection machines and photolithography tools. In a multi-million dollar photolithography tool, high accuracy, nanometer resolution and maximum thermal stability are absolutely critical to maintain proper focus and obtain integrated circuit line widths as small as 45 nanometers. Additionally, most systems demand low power consumption and maximum heat dissipation to eliminate any adverse affects from temperature [...]
Camera Shield Measurement
Camera Shield Measurement Consumer Electronics Camera shield measurement Surface Equipment Setup Equipment Used DTS-25-04 laser head Rotary Stage PC with Digital Microtrak Basic Support software Setup: Power is automatic mode. Filter is 100Hz Sample rate is 1000 samples sec The head was operated in diffuse mode (not specular/tilted) Validation of Setup The setup should be validated by performing a total runout scan on the rotary stage with no target present. The stage should be cleaned with Isopropyl alcohol and allowed to dry prior to the scan. This reduces any dust [...]
Tire Tread Measurement with 2D Laser
Tire Tread Measurement with 2D Laser Automotive Tire Tread Measurement with 2D Laser Depth Why Accurate Tire Tread Measurement Matters To maximize safety and tire longevity, modern tire manufacturers are adopting 100% tire inspection systems that include tread depth measurement, defect detection, and pattern recognition. Inadequate tire tread depth can lead to reduced traction, poor braking, and potential tire failure. Surface anomalies like blistering, bubbles, or belt overlap may cause runout, road noise, or even catastrophic failure. With consumer expectations rising and regulatory standards tightening, tire OEMs and testing labs need precise, [...]
About GaGe
About GaGe GaGe, a Vitrek brand established in 1987, is a US-based producer of high-speed data acquisition solutions. It features a portfolio of the highest-performance digitizers renowned for sustaining the maximum effective number of bits (ENOB) over a wide signal frequency range. Additional advantages include quality signal conditioning and signal fidelity features, PC oscilloscope software, and powerful SDKs for custom application development used in applications for signal analysis, lidar, ultrasound imaging and non-destructive testing, communications, particle physics, mass spectroscopy, and more. GaGe brand products include solutions previously available from Signatec and KineticSystems. GaGe’s product offering includes [...]
Gap Monitor Keeps Wind Turbines Running
Gap Monitor Keeps Wind Turbines Running Power Generation Wind Turbine Gap Monitoring Distance, Gap, Tolerance Description [Application Note 21218] Wind turbine production has been steadily increasing to meet growing demand for renewable energy. As power outputs and the number of installations climb, maintenance becomes ever more critical. Operators want to minimize downtime and protect against catastrophic failure. The ability to predict when maintenance will be required can go a long way to ensure these goals are met. Gap monitoring sensors from MTI Instruments help wind turbine operators predict impending [...]
MTI-Website Download Access
Please complete the form below to access MTI downloadable documents. MTI Instruments by Vitrek 900 N. State Street Lockport, IL 60441 Phone: (815) 838-0005 Fax: (518) 218-2506 sales@mtiinstruments.com
Portable Vibration/Balancing System Simplifies Jet Engine Testing
Portable Vibration/Balancing System Simplifies Jet Engine Testing Aviation/Aerospace, Power Generation Jet Engine Testing Amplitude Description [Application Note 32818-2] Overall gas turbine engine vibration may be considered the summation of vibration contributions from various moving parts within the engine. The ability to correlate vibration magnitude with specific moving parts helps engineers ascertain and correct the sources of vibration. Problem Commercial and military aviation rely on vibration analysis and trim balancing to establish such correlations. Vibration analysis detects discrepancies in rotational machine dynamics; trim balancing is used to reduce vibration amplitudes of [...]
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Please complete the form below to be added to Vitrek's Distribution Lists. You may unsubscribe at any time by emailing unsubscribe@vitrek.com. MTI Instruments by Vitrek 900 N. State Street Lockport, IL 60441 Phone: (800) 342-2203 Outside North America: (518) 218-2550 Fax: (518) 218-2506 sales@mtiinstruments.com
Push-Pull Capacitance Sensor Measures Ungrounded Targets
Push-Pull Capacitance Sensor Measures Ungrounded Targets Solar, Semiconductor Measurement of Ungrounded Targets Thickness, Metrology Description [Application Note 50318] Today’s semiconductor and solar industries drive the demand for thinner wafers to conserve silicon and fulfill new IC applications. To meet this demand, wafer fabricators seek greater dimensional control of their silicon products. Non-contacting capacitance sensors offer the precision, accuracy, and speed needed to measure flatness, thickness variation, and other critical dimensions. Typically, the standard capacitance sensor acts as one plate of a classical two-plate capacitive gap measurement scenario. The grounded target [...]