Press Release: Vitrek to Showcase Transformative Accumeasure™ Capacitance Sensors at SEMICON West 2025
Vitrek to Showcase Transformative Accumeasure™ Capacitance Sensors at SEMICON West 2025 Bringing a New a Level of Precision, Affordability for Semiconductor Wafer Makers Lockport, IL, October 1, 2025 – Vitrek, LLC (“Vitrek”) a leader in high-performance test and measurement equipment, announced today that it will showcase its expanded Accumeasure capacitance measurement product line at the SEMICON West exhibition on October 7-9, 2025, at the Phoenix Convention Center in Phoenix, Arizona. Along with the established Accumeasure analog and digital test systems will be samples of the Accumeasure HD, offering the highest-resolution non-contact capacitance system in the world. Developed [...]
Press Release: Vitrek Launches Next Gen Compliance Test Automation Software
Vitrek Launches Next Gen Compliance Test Automation Software Introducing QT Insite™ — Vitrek’s Latest Advancement in High Voltage Test Automation Lockport, IL—January 29, 2025— Vitrek, a US-based manufacturer of high-end test, measurement and signal recording equipment, announced today that it has introduced a new test automation software package — QT Insite. This, the latest in their line of Quick Test software releases, is distinguished by its streamlined use of system resources and robust features. Designed to work with Vitrek’s 95X, 98X and V7X series of hipot testers as well as the company’s 964i high-voltage switches, QT Insite [...]
Press Release: PBS eXpress Engine Vibration Technology Debuts at Aerospace Test & Development Show
PBS eXpress Engine Vibration Technology Debuts at Aerospace Test & Development Show A Transformative Opportunity for Regional and Business Operators Lockport, IL, September 25, 2025 – Vitrek, LLC (“Vitrek”), a leader in high-performance test and measurement equipment, announced today that it will showcase its PBS eXpress Vibration Measurement and Engine Rotor Balancing System at the Aerospace Test & Development Show on September 30 - October 1 in Toulouse, France. While launched in the U.S., this marks the system’s first major demonstration at a European industry event. Developed by Vitrek, the MTI PBS eXpress is designed specifically to [...]
LITHOGRAPHY OPTICS POSITION FOCUS
Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex lens systems such as those found in atomic force microscopes, vision inspection machines and photolithography tools. In a multi-million dollar photolithography tool, high accuracy, nanometer resolution and maximum thermal stability are absolutely critical to maintain proper focus and obtain integrated circuit line widths as small as 45 nanometers. Additionally, most systems demand low power consumption and maximum heat dissipation to eliminate any adverse affects from [...]
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12.
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12. Using the Vitrek PA900 Precision Harmonic Power Analyzer Introduction Compliance with electromagnetic compatibility (EMC) standards is mandatory for electrical and electronic equipment sold in many global markets. Among these, the IEC61000-3-2 and IEC61000-3-12 standards specify limits for harmonic current emissions of equipment connected to low-voltage public supply systems. These limits ensure that individual devices do not contribute excessively to harmonic distortion on the power grid, which can lead to overheating in transformers, nuisance tripping of breakers, and interference with other equipment. The Vitrek PA900 Precision Power [...]
GAAS SUBSTRATE THICKNESS MEASUREMENT
Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk resistivity (>10k Ohm/cm) is a little more difficult because the wafers act as non-conductive insulators in a capacitive sensor’s measuring field. Fortunately, MTI has a solution to this problem. Solution: It’s possible to measure the thickness and TTV of high resistivity semiconducting wafers (like GaAs) using non-contact capacitive [...]
Spindle Run Out
Industry Automotive Applications Spindle Run Out Measurement Type Positioning Description Rotating targets frequently have an intermittent, uncertain or nonexistent ground path. This introduces unwanted noise, instability, drift and reduces accuracy of the measurement. MTI Instruments offers a unique “Push-Pull” capacitance measurement system that does not require a grounded target. It utilizes two probes, built into one body, that work together to complete the ground path. One probe pushes current into the brake rotor while the adjacent probe pulls the current out. The result is a “clean”, consistent electrical sensing path. As the [...]
CAPACITANCE SENSORS FACILITATE 3D IC CONSTRUCTION
[Application Note 70518] To boost device performance, today’s semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting the Z-axis avoids the power and footprint penalties associated with two-dimensional processes. Implementing the rationale, however, is not so simple. Going vertical requires coplanar surfaces to make contact with all pins, pads, and pillars. Problem Typically, manufacturers measure the angle and gap between two planes to determine coplanarity. Bonding tool actuators rely on these angle/gap measurements to adjust components and make sure all device pins and/or solder balls reside on the [...]
CAMERA SHIELD MEASUREMENT
Equipment Setup Equipment Used DTS-25-04 laser head Rotary Stage PC with Digital Microtrak Basic Support software Setup Power is automatic mode. Filter is 100Hz Sample rate is 1000 samples sec The head was operated in diffuse mode (not specular/tilted) Validation of Setup The setup should be validated by performing a total runout scan on the rotary stage with no target present. The stage should be cleaned with Isopropyl alcohol and allowed to dry prior to the scan. This reduces any dust or dirt accumulation which will give a false reading of runout. A 360-degree runout of the rotary table, [...]
MONITOR ROLLER GAPS AND PARALLELISM
Easy Roller Gap Measurement Ensures Calendering Success Many roll-to-roll finishing processes typically use a calender, or series of hard pressure rollers, to deliver smooth, high-quality products of plastic, textile, or paper (Fig 1). Ensuring a consistent material thickness, however, depends on the ability to monitor, and maintain, a precise gap between rollers. This application note describes a quick and easy means for roller gap measurement. Problem Establishing a roller gap and checking for parallelism across roller width can be a slow and cumbersome procedure. Manual measurement requires multiple sized feeler gauges which can introduce errors. Misinterpreting feeler gauge drag, [...]






