ABOUT WAFER BOW AND WARP MEASUREMENT SYSTEMS
Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness encountered during a scan pattern or series of point measurements. TTV is expressed in microns or mils (thousandths of an inch). ASTM F534 3.1.2: The deviation of the center point of the median surface of a free, unclamped wafer from the median [...]
Press Release: Legacy Military Avionics Test Systems Gain New Life with Modern Digitizer Technology from Vitrek GalleryPress Release: Legacy Military Avionics Test Systems Gain New Life with Modern Digitizer Technology from Vitrek
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Press Release: Legacy Military Avionics Test Systems Gain New Life with Modern Digitizer Technology from Vitrek
Legacy Military Avionics Test Systems Gain New Life with Modern Digitizer Technology from Vitrek GaGe high-speed digitizers help aerospace and defense organizations modernize aging test platforms without costly full-system replacement. Lockport, IL—May 7, 2025— Vitrek, a US-based manufacturer of high-end test, measurement and signal recording equipment, announced today that its GaGe high-speed digitizers are helping aerospace and defense organizations modernize legacy avionics test systems by replacing obsolete waveform acquisition hardware while preserving existing software, workflows, and validated procedures. Many military test systems remain mission-critical decades after deployment, but aging digitizers, oscilloscopes, and custom instruments have become difficult [...]
Press Release: Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics GalleryPress Release: Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics
New & Press Releases, News-Events, News-MTI, Press Releases-GaGe, Press Releases-MTI, Press Releases-Vitrek
Press Release: Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics
Vitrek’s 95X Series Achieves 100 Pico-Amp Resolution to Detect Micro-Level Insulation Defects in Medical Devices and Aerospace Electronics Vitrek 95X Series offers 100 pico-amp resolution for detecting micro-level insulation defects in safety-critical industries. Lockport, IL—February 11, 2026 — Vitrek, a US-based manufacturer of high-precision test and measurement equipment, offers the 95X Series hipot tester with 100 pico-amp leakage current resolution for detecting micro-level insulation defects in safety-critical industries. Designed for medical devices, aerospace avionics, and high-reliability electronics, the Vitrek 95X Series ensures that early-stage insulation degradation is detected before catastrophic failures occur. Why 100 Pico-Amp Resolution Matters [...]
LITHOGRAPHY OPTICS POSITION FOCUS
Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex lens systems such as those found in atomic force microscopes, vision inspection machines and photolithography tools. In a multi-million dollar photolithography tool, high accuracy, nanometer resolution and maximum thermal stability are absolutely critical to maintain proper focus and obtain integrated circuit line widths as small as 45 nanometers. Additionally, most systems demand low power consumption and maximum heat dissipation to eliminate any adverse affects from [...]
Press Release: Accumeasure Capacitive Wafer Measurement Tools Reduce Start-up Costs for Specialty Fabs & Their Tier Ones
Accumeasure™ Capacitive Wafer Measurement Tools Reduce Start-up Costs for Specialty Fabs & Their Tier Ones Vitrek’s Cost-Sensitive Accumeasure Capacitance-Based Metrology System Simplifies the Development of Adaptable High-Precision Equipment—Especially in USA Lockport, IL — February 5, 2026 — Vitrek, a US-based leader in precision measurement instruments, today announced the expanded capabilities of its MTI Accumeasure Capacitance Technology. Designed to make high-precision wafer metrology more accessible to start-up and smaller niche semiconductor equipment makers, Vitrek’s Accumeasure technology provides a compact, cost-effective alternative to traditional high-end optical systems that are often too bulky or expensive for new market entrants. Key [...]
Press Release: MTI Instruments’ Proforma 300iSA Handles Critical Multi-Material Wafer Inspection for a Rapidly Evolving Industry
MTI Instruments’ Proforma 300iSA Handles Critical Multi-Material Wafer Inspection for a Rapidly Evolving Industry Universal semi-automated platform measures diverse wafer materials and surfaces with SEMI and ASTM standard compliance. Lockport, IL—20 January 2026-Vitrek announced today that its Proforma 300iSA semi-automated metrology system has proven capable of supporting wafer inspection across a growing range of semiconductor materials, wafer sizes, and surface finishes including silicon (Si), silicon carbide (SiC), gallium arsenide (GaAs), and indium phosphide (InP). Inspection systems are being pushed to handle more various materials and tighter processes as device manufacturers move beyond traditional silicone into compound semiconductors [...]
GAAS SUBSTRATE THICKNESS MEASUREMENT
Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk resistivity (>10k Ohm/cm) is a little more difficult because the wafers act as non-conductive insulators in a capacitive sensor’s measuring field. Fortunately, MTI has a solution to this problem. Solution: It’s possible to measure the thickness and TTV of high resistivity semiconducting wafers (like GaAs) using non-contact capacitive [...]
Radio Astronomy Measurements Using a GaGe RazorMax Digitizer
Radio Astronomy Measurements Using a GaGe RazorMax Digitizer Introduction Radio astronomy relies on highly sensitive measurements of weak electromagnetic emissions originating from cosmic sources, including galactic hydrogen clouds, star-forming regions, pulsars, and the Cosmic Microwave Background (CMB). These emissions typically fall below 10 GHz, spanning the radio-frequency (RF) and microwave bands. In many cosmological studies—particularly those investigating early-universe star formation—signals of interest are concentrated well below 300 MHz. In the application described here, a customer is monitoring astronomical RF emissions centered near 100 MHz, originating from extremely distant sources. At [...]
Testing Energy-Efficient Washing Machines with the PA900 Power Analyzer GalleryTesting Energy-Efficient Washing Machines with the PA900 Power Analyzer
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Testing Energy-Efficient Washing Machines with the PA900 Power Analyzer
Application Note: Testing Energy-Efficient Washing Machines with the PA900 Power Analyzer Introduction Today’s consumers demand home appliances that use less energy and water. Washing machines are no exception. Manufacturers must meet strict energy labeling standards and provide proof that their products are truly efficient. This means accurate, repeatable measurements of electrical power and energy use throughout a full wash cycle are essential. The Vitrek PA900 Power Analyzer is an ideal tool for this task. Testing Challenges Testing a washing machine for energy efficiency isn’t as simple as reading its average power draw. Wash cycles can last over an [...]
Spindle Run Out
Industry Automotive Applications Spindle Run Out Measurement Type Positioning Description Rotating targets frequently have an intermittent, uncertain or nonexistent ground path. This introduces unwanted noise, instability, drift and reduces accuracy of the measurement. MTI Instruments offers a unique “Push-Pull” capacitance measurement system that does not require a grounded target. It utilizes two probes, built into one body, that work together to complete the ground path. One probe pushes current into the brake rotor while the adjacent probe pulls the current out. The result is a “clean”, consistent electrical sensing path. As the [...]