Blogs
Whitepaper: Mastering High Voltage: The Importance of Accurate Test Equipment
Introduction Accurate definition and measurement of critical electrical performance parameters is essential for ensuring the reliability and safety of high-voltage equipment and cabling. For applications which can involve tens of thousands of volts, safety risks are high, as are the demands on the test equipment used to measure the equipment and cables. Proper calibration of the test instruments themselves is critical to achieving the strict performance needs of many equipment types. Calibration results must often meet national and international specific standards and calibration measurements are typically conducted by certified laboratories with traceability to national standards, like [...]
The Answer Vault: GaGe CompuScope Digitizers — Q & A with Dr. Andrew Dawson
Introduction This document explores the advanced features of GaGe CompuScope Digitizers in a variety of applications, featuring insights from Dr. Andrew Dawson. A seasoned physicist and leader, Dr. Dawson holds a Doctorate in experimental solid-state physics from McGill University and has extensive experience in ultrasonic material analysis. As an application engineer for GaGe, his experience has exposed him to a wide variety of digitizer applications, making this a valuable resource for understanding cutting edge advancements in the field. Question 1: Can You Provide some Features of GaGe CompuScope Digitizers that are useful in Non-Destructive Testing (NDT) applications? [...]
Case-In-Point: MTI Turbine Vibration Analyzer/Balancing System Technology Principles
What do you think when you’re flying home, cruising at 30,000 feet and the drinks have just been served? Our engineers think about the ripple in the glass. That ripple signals vibration and is an indication that the engine may be in need of a balance.
Article: High-Performance Digitizers in Semiconductor Manufacturing Applications
High-Performance Digitizers in Semiconductor Manufacturing Applications PC-based high-speed, high-resolution digitizers perform critical data acquisition functions during semiconductor fabrication, die packaging, and final chip testing. Introduction Data acquisition is a critical element of quality control and compliance testing during three stages of semiconductor manufacture. The first stage is fabrication, in which single-crystal semiconductor wafers are subject to various operations that leave them imprinted with micro-circuitry patterns. During the second stage, the wafers are diced up into individual silicon “die” that are packaged into final chips. The third stage involves functional testing of the final chips to [...]
MTI Instruments Whitepaper: Capacitance Guide for Industrial Applications
Capacitance Guide for Industrial Applications This guide from MTI Instruments explains what you need to know about using electrical capacitance for measurement in industrial applications, including advanced manufacturing. Basic Principles Capacitance is the ratio of the change in an electric charge to the corresponding change in its electrical potential (i.e., voltage). Capacitors, components that that have the “capacity” to store an electric charge, consist of conductive parallel plates that don’t touch or connect with each other. Instead, these metal plates are electrically-separated by air or a layer of insulating material (i.e., the dielectric). MTI’s [...]
Whitepaper: Why Capacitance? Benefits and Applications of Digital Capacitive Sensors
Industry applications illustrate the versatility and benefits of today's digital capacitive sensor technology. The electrical capacitance formed between a capacitance probe and target surface varies as a function of the distance, or gap, between those two surfaces.
LED SUBSTRATE THICKNESS
Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description Remember that old acronym, GIGO? Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be of a certain quality to ensure maximum yield. Excessive TTV, Bow, and Warp lead to premature LED failure. LED manufacturers need to inspect incoming wafers. Wafer producers also need to check and control TTV, Bow and Warp. The market for sapphire wafers, driven by the growth in LED manufacturing, is booming. While the price [...]
GAAS SUBSTRATE THICKNESS MEASUREMENT
Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk resistivity (>10k Ohm/cm) is a little more difficult because the wafers act as non-conductive insulators in a capacitive sensor’s measuring field. Fortunately, MTI has a solution to this problem. Solution: It’s possible to measure the thickness and TTV of high resistivity semiconducting wafers (like GaAs) using non-contact capacitive [...]