Offshore Wind Supply Chain Uses MTI Capacitance Sensors
Capacitance sensors from MTI Instruments are an important part of the supply chain for offshore wind (OSW) in New York State. According to a recent report from the Center for Economic Growth (CEG), New York’s Capital Region is home to MTI Instruments and dozens of other manufacturers who support this growing form of wind power. The Capital Region also offers essential infrastructure for OSW. As the CEG report explains, the New York State Energy Research Development Authority (NYSERDA) has assessed 54 waterfront sites for OSW-related projects such as component staging, manufacturing, and fabrication. Two of the most promising sites [...]
MICROTRAK 3: 1D Laser Displacement Sensor
MICROTRAK 3: 1D Laser Displacement Sensor An essential measurement tool for process automation, quality control and tool automation control. Request Quote Download Brochure Compact laser triangulation sensor head for easy integration to machine control system High resolution, high speed laser displacement sensor (non-contact linear displacement sensor) utilizes the latest CMOS sensor technology that challenges even the most difficult measurement applications. The Microtrak™ 3 is an essential measurement tool for process automation, quality control and tool automation control, for applications such as, thickness measurement, dimensional displacement, part profiling, vibrations testing, build-up [...]
MICROTRAK 4: 1D Laser Displacement Sensor
MICROTRAK 4: 1D Laser Displacement Sensor Accurate and repeatable displacement measurements from highly reflective to dull surfaces Request a Quote Download Microtrak 4 Brochure Compact digital laser displacement sensor head with stable and accurate measurements The latest 1D laser displacement sensor from MTI provides excellent speed and accuracy for even the most difficult applications and provides data output and power through a single USB cable. The MicroTrak 4 is the ultimate 1D laser sensor for measuring height, thickness, displacement, vibration, and more, with a sensor frame rate of 40k Samples/sec. and [...]
Fiber Optic Sensor Principles
The Fotonic Sensor™ is a non-contact instrument, which uses the fiber optics lever principle to perform displacement measurement, vibration analysis and surface-condition measurements. The Fotonic Sensor transmits a beam of light through a flexible fiber-optic probe, receives light reflected from a target surface, and converts this light into an electrical signal proportional to the distance between the probe tip and the target being measured. A simplified example of the fiber optic principal is shown in Figure 2. The output signal voltage from the fiber optic sensor is then used to determine position, displacement, vibration amplitude, frequency and waveshape of a [...]
About Wafer Bow And Warp Measurement Systems
About Wafer Bow And Warp Measurement Systems Semiconductor/Solar Wafer Bow And Warp Metrology/Surface Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness encountered during a scan pattern or series of point measurements. TTV is expressed in microns or mils (thousandths of an inch). Figure above shows a wafer placed between two non-contact [...]
Common Test and Calibration Uses of the 1510A Portable Signal Generator
Introduction As one of the most versatile and powerful hand-held signal generators on the market, the 1510A is a two-channel, battery-powered, microprocessor-controlled direct digital signal generator. It has an average battery life of 3 hours of continuous use. Weighing in at under two pounds, makes it ideal for use in the field. There are many different ways this sophisticated device can be leveraged to perform precise test and calibration of equipment, wires, cables, sensors and much more. Use Case #1 | Sensor Simulation You can simulate sensors during system development, bring-up, and test. Often during [...]
Download How to Reduce Inconsistent Wafer Measurements
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Vitrek Academic Discount Program
Supporting Academic Advancement for 25+ Years. Vitrek is proud to support the education industry with our Academic Discount Program. Universities, vocational schools, graduate schools, technical colleges, and training facilities receive a 15% academic discount on Vitrek brands of products and accessories. Vitrek, GaGe and MTI Instruments products are used in university and research laboratories around the world. We understand the unique needs and requirements of the education/research arena, including ever-tighter budget constraints in the face of increasing workloads. Graduate to Vitrek Test & Measurement Solutions That is why we have introduced our special Academic Discount Program. It is [...]
Capacitance Guide for Industrial Applications
Accumeasure Digital Capacitance System D Series Gen 3 View Product Capacitance Displacement and Gap Measurement Probes View Product Accumeasure Analog Capacitance System View Product Basic Principles of Capacitance Capacitance is defined as the ratio of the change in an electric charge to the corresponding change in its electrical potential (or voltage). Capacitors ; components designed to store electrical charge, consist of conductive parallel plates that are electrically separated by a dielectric material, such as air or an insulating layer. MTI’s technology is built on the principles of parallel plate capacitor measurement. A probe [...]
Increase SiC Wafer Production Yield
Demand for SiC wafers is growing rapidly and production needs to keep up. Speeding up production can result in higher defect rates without the proper inspection equipment in place during the R&D process, where poor verification of your process tools can dramatically reduce yield. MTI Instruments 300iSA system can help measure TTV, flatness, bow and warp of up to 20 wafers per hour. Our solution helps you perform wafer inspection verifications at scale and increases the throughput of your production yield as the demand grows for 100-200mm diameter wafers. Finding defects at volume can be difficult, but MTI’s superior [...]