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App Notes

Optical Scanning of Drive Media

Optical Scanning of Drive Media Customer Case The customer's application is optical scanning for drive testing. The goal is to identify burnt or damaged spots on the disk. The scanning system is generally used in Quality Control, Head-Disk Interaction and Failure Analysis. There is a need for continuous acquisition during the spiral scan. The speed of the disk is 10,000 RPM and the requirement is to capture 65,000 to 80,000 samples each revolution. A single channel is needed for the acquisition at 10 MegaSamples/second or greater. High vertical resolution will aid in measuring the properties and ultimately the degradation [...]

By |March 12th, 2023|Comments Off on Optical Scanning of Drive Media

Disk Drive Track Scanning

Disk Drive Track Scanning Customer Case The customer is trying to digitize an 83 millisecond long signal coming out of a disk mounted on a rotary motor. This corresponds to one full revolution of the disk. The analog signal coming out of the Device Under Test (DUT) is of approximately 2 MHz bandwidth. Currently, the customer is sampling at 10 MSPS and would like to increase the oversampling to get better time resolution. At present, they are using a CompuScope 225 - 1M, which has sufficient memory to digitize the entire revolution in on-board memory at the 10 MSPS [...]

By |March 11th, 2023|Comments Off on Disk Drive Track Scanning

The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology

This is the third of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The second article examines the cost of failing to inspect semiconductor wafers. Fully automated systems that can load, scan, and unload wafers are fast, convenient, and efficient at high volumes. They’re useful for checking every wafer in every batch, but these systems are expensive. Semi-automated and manual systems cost significantly less and are generally used for lower volumes; however, they’re also easy-to-use and can make fast, accurate measurements that support production flow. Semi-automated and [...]

By |February 8th, 2022|Categories: Application Notes-MTI, Brand-MTI, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, News-MTI-Metrology, Products-MTI-Semiconductor/Metrology, z1|Comments Off on The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology

Why Disc Geometry Matters In Wafer Production

This is the first of three articles in Semiconductor Wafer Measurement for Increased Profitability. The second article examines the cost of failing to inspect semiconductor wafers. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec after cutting, it may be possible to reprocess the wafer. Cutting is only the first [...]

MEMS-Based High Throughput Screening

MEMS-Based High Throughput Screening Customer Case The customer needs to do frequency analysis to determine the resonant frequency of an oscillating micro-fabricated device. They will use a Laser Doppler Vibrometer to monitor the physical oscillation. This is an instrument that looks at the light reflected from the surface of a moving part to determine the velocity or relative position of the part. Analysis of the motion as a function of the driving frequency determines the resonant frequency. Upon excitation at the resonant frequency, the motion is at its maximum. The expected resonant frequencies are on the order of 1 [...]

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Automatic Accelerometer Calibration System

Automatic Accelerometer Calibration System Customer Case The customer's Automated Accelerometer Calibration System provides NIST traceable calibration of most accelerometer types, whether self-generating piezo-electric or accelerometers requiring current or voltage excitation. The output of the accelerometer can be charge or voltage, single- ended or differential, AC or DC coupled, isolated or grounded. In building the automatic calibration system, the need is for optimum versatility with regards to the data acquisition card. LabVIEW is the desired control software, and Signal to Noise Ratio and high vertical resolution is of utmost importance for the small variations that occur in Vibration and Shock [...]

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Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data

Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data Customer Case A customer wants to digitize data from a 256x256 infrared charge-couple device (CCD) array. The array data is clocked at 4 MHz through two output channels. Exactly two clock cycles occur between 12-bit line signals, and a dozen or more clock cycles occur between successive frames. The customer wants to digitize the data for a minute or more. Since light level signals from the array can vary widely in amplitude, 12-bit resolution is required. GaGe Case Solution The customer will use the CompuScope 512/PCI with the External [...]

By |March 12th, 2023|Comments Off on Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data

Medical

Medical The following example case studies demonstrate how GaGe products and services have been successfully applied in various data acquisition medical applications. We encourage you to contact us and discuss your application in more detail with our engineering team. GaGe can provide tailored custom hardware and software solutions to meet specific application requirements. Did You Know? GaGe Digitizers in Medical Applications View Article Did You Know? GaGe Digitizers in Imaging & Ultrasound Applications View Article Did You Know? GaGe Digitizers in Cancer & Diagnostic Applications View Article Did You Know? [...]

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Laser Scanning for Eye Diseases

Laser Scanning for Eye Diseases Customer Case In scanning for non-ablative eye diseases, the customer has a requirement for high vertical resolution while remaining cost effective. By shooting a low-powered laser into the eye (low enough to not cause lasting damage), they are able to determine whether there are any problems in the eye cells. The laser does cause minute damage that is repaired by the antibodies of the eye. The requirement is to capture laser reflections and analyze them. The scan takes place over the entire eye and there are therefore multiple acquisitions. The main obstacle is that [...]

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Echocardiography Experiment

Echocardiography Experiment Customer Case This customer is involved in an Echocardiography experiment. The customer already has an ultrasound imager with a built-in A/D converter which can output 12-bit image data which must be analyzed with the customer's proprietary algorithms on a PC platform. In order to accomplish this, it is required to bring 12-bit digital data at 35 MHz clock rate into a PC. This data is arriving in a burst mode with a repeat frequency of 12.8 KHz with 1000 samples arriving in 28 us followed by no data for the next 50 us. There are 512 such [...]

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