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App Notes

Wafer Backgrinding and Semiconductor Thickness Measurements

Wafer Backgrinding and Thickness Measurements in Semiconductor Manufacturing Wafer backgrinding, also known as wafer thinning or wafer lapping, is a critical step in semiconductor packaging. This process, which involves grinding the backside of a semiconductor wafer, reduces its thickness to enable the stacking of integrated circuits (ICs) and support high-density packaging. The thickness of the wafer plays a crucial role in determining the overall size of the package, an important factor as modern electronics such as smartphones, laptops, and other devices continue to get thinner and more compact. In applications like MEMS (Micro-Electro-Mechanical Systems), the backgrinding process also affects [...]

Silicon Carbide vs. Silicon in EV Power Electronics

Compare silicon carbide vs. silicon for electric vehicle (EV) power electronics and learn about SiC wafer measurement. As demand for electric vehicles (EVs) continues to grow, manufacturers are comparing two semiconductor technologies, silicon carbide and silicon, for power electronics applications. Silicon carbide (SiC) provides the high temperature resistance, low power consumption, rigidity, and support for smaller, thinner designs that EV power electronics need. Examples of SiC’s current applications include on-board DC/DC converters, off-board DC fast chargers, on-board battery chargers, EV powertrains, and automotive lighting for LEDs. According to Automotive World, SiC technology could also drive future EV innovations [...]

Laser Measurement & Characterization of Flat Panel Displays

Laser Measurement & Characterization of Flat Panel Displays Customer Case This customer's application involves the characterization of flat panel displays (used in laptop computers, computer game displays, etc.) via laser scanning. The laser is bounced off a number of mirrors and then through lenses, from which it is scattered. The scattered laser light must then be analyzed in order to determine the quality of the flat panel display. This laser measurement system is used not only by flat panel display industries, but also by disk drive manufacturers to analyze platter quality and, in the near future, for characterizing silicon [...]

By |March 12th, 2023|Comments Off on Laser Measurement & Characterization of Flat Panel Displays

Laser Signals Striking Silicon-Diode Target

Laser Signals Striking Silicon-Diode Target Customer Case The customer wants to capture the output of some silicon diodes looking at a laser target. The typical signal is anywhere from 20mv to 1V in amplitude and 0 to 15ns in length. There are up to 16 of these diodes that are looking at the same target. Each diode has a different filter so the post-trigger depth and amplitude-scale must be user-adjustable. Their main interest is to sample and digitize the signals for archiving, with later retrieval and plotting. Fancy software is not needed for display as the data is gathered [...]

By |March 12th, 2023|Comments Off on Laser Signals Striking Silicon-Diode Target

MTI Instruments Fulfills Historic Order for the United States Air Force

Lockport, IL, November 16, 2020 — MTI Instruments, Inc. (“MTI Instruments”), the operating subsidiary of Mechanical Technology, Incorporated (OTC Pink: MKTY), announces the completion of its historic order for the United States Air Force, a $3.3 million contract awarded publicly in May 2020 that includes 52 PBS-4100+ engine vibration measurement and balancing systems. This order was made pursuant to the multi-year contract entered into by MTI Instruments and the United States Air Force in July 2016 and marks the single largest order of PBS-4100+ Systems received by MTI Instruments to date. MTI fulfilled the order in its entirety with [...]

By |November 17th, 2020|Categories: Application Notes-Vitrek, Brand-MTI, Industry-Aerospace, Industry-Government/Military, New & Press Releases, News-MTI, News-MTI-PBS, Press Releases-Vitrek, z1|Comments Off on MTI Instruments Fulfills Historic Order for the United States Air Force

Optical Scanning of Drive Media

Optical Scanning of Drive Media Customer Case The customer's application is optical scanning for drive testing. The goal is to identify burnt or damaged spots on the disk. The scanning system is generally used in Quality Control, Head-Disk Interaction and Failure Analysis. There is a need for continuous acquisition during the spiral scan. The speed of the disk is 10,000 RPM and the requirement is to capture 65,000 to 80,000 samples each revolution. A single channel is needed for the acquisition at 10 MegaSamples/second or greater. High vertical resolution will aid in measuring the properties and ultimately the degradation [...]

By |March 12th, 2023|Comments Off on Optical Scanning of Drive Media

Disk Drive Track Scanning

Disk Drive Track Scanning Customer Case The customer is trying to digitize an 83 millisecond long signal coming out of a disk mounted on a rotary motor. This corresponds to one full revolution of the disk. The analog signal coming out of the Device Under Test (DUT) is of approximately 2 MHz bandwidth. Currently, the customer is sampling at 10 MSPS and would like to increase the oversampling to get better time resolution. At present, they are using a CompuScope 225 - 1M, which has sufficient memory to digitize the entire revolution in on-board memory at the 10 MSPS [...]

By |March 11th, 2023|Comments Off on Disk Drive Track Scanning

EV Batteries Need Thickness Gauging for Lower Costs and Higher Performance

EV batteries need to cost less and last longer. Until the e-mobility industry solves these challenges, electric vehicle (EV) adoption won’t match the hype that’s driven by Tesla, the established automakers, and a host of startups who are attracting investors. According to Axios, the expense of owning an electric vehicle will exceed that of owning a conventional one until EV batteries cost less than $100/KWh to produce. Unfortunately, the EV industry isn’t expected to hit that target for another ten years. Yet, there is some encouraging news. Less expensive and better performing EV batteries are just a few years [...]

MEMS-Based High Throughput Screening

MEMS-Based High Throughput Screening Customer Case The customer needs to do frequency analysis to determine the resonant frequency of an oscillating micro-fabricated device. They will use a Laser Doppler Vibrometer to monitor the physical oscillation. This is an instrument that looks at the light reflected from the surface of a moving part to determine the velocity or relative position of the part. Analysis of the motion as a function of the driving frequency determines the resonant frequency. Upon excitation at the resonant frequency, the motion is at its maximum. The expected resonant frequencies are on the order of 1 [...]

By |March 11th, 2023|Comments Off on MEMS-Based High Throughput Screening

Transducer Selection for High Resolution Applications

High resolution applications do not always require an interferometer. If you want to make accurate measurements in the micron to picometer range, then an MTI Digital Accumeasure D100 HD or D200 system may be what you need. Laser interferometers can sell for more than $15,000 and be difficult to setup. For example, you may have to buy additional optics to guarantee a good return signal since the laser beam must reflect off a mirror surface or precision retro reflector in order for the beam to re-enter the interferometer’s optics at less than a degree of reflection angle. The downsides [...]

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