Avionics Bus Monitoring
Avionics Bus Monitoring Customer Case The requirement is to monitor anomalies on an avionics bus that controls systems aboard spacecrafts. The customer will know typical rise times, and therefore, will look for anomalous high-voltage pulses that may occur due to sunspots or cosmic rays. An A/D card with at least 12-bits of vertical resolution is required to capture anomalous glitches for characterization. The required sampling speed is 50 KHz, on two simultaneous channels that monitor two bus lines. The input signal bandwidth is typically 4 KHz. The customer would like to write his own data acquisition application programs in [...]
Signal Generator Calibrates Strain Gauge Electronics
Signal Generator Calibrates Strain Gauge Electronics Industrial, Automotive, Transportation, Research & Development, Civil Engineering Calibration of Strain Gauge Electronics Amplitude; Bending, Tensile & Compression Description [Application Note 31218] The strain gauge has been in use many years and is the fundamental sensing element for many types of sensors, including pressure sensors, load cells, torque sensors, and position sensors. The majority of strain gauges are metallic foil types, available in a wide choice of shapes and sizes to suit a variety of applications. Foil type strain gauges feature a pattern or [...]
Signal Generator Simulates Eddy Current Probe
Signal Generator Simulates Eddy Current Probe Industrial, Power Generation, Automotive, Power Generation, R& D, Solar Simulation of Eddy Current Probe Gap, Amplitude, Displacement, Positioning, Thickness Description [Application Note 31218] Non-contact eddy current probes can be used to measure the position, or position change, of conductive targets in real time. Typical monitoring applications include shaft runout and/or vibration. Probe setup requires an oscillator demodulator circuit. This circuit converts the probe’s magnetic field readings into output voltages proportional to the gap between probe and target. Portal signal conditioning electronics are then used [...]
Industrial
Industrial The following example case studies demonstrate how GaGe products and services have been successfully applied in various data acquisition industrial applications. We encourage you to contact us and discuss your application in more detail with our engineering team. GaGe can provide tailored custom hardware and software solutions to meet specific application requirements. Industrial Avionics Bus Monitoring Gas Turbine Monitoring Plasma Coating of Airplane Parts Monitoring Critical Variables Nuclear Reactor Cooling Liquid Flow Measurements Pulsed Electric Field Food Processing Galvannealing Phosphor Thermometry Airborne Communications Signal Monitoring Non-Destructive Testing (NDT) NDT for Steel Manufacturing NDT of [...]
Capacitance Sensors Facilitate 3D IC Construction
Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting the Z-axis avoids the power and footprint penalties associated with two-dimensional processes. Implementing the rationale, however, is not so simple. Going vertical requires coplanar surfaces to make contact with all pins, pads, and pillars. Problem Typically, manufacturers measure the angle and gap between two planes [...]
Adding a Digital Panel Meter to MTI Analog Output Products
Adding a Digital Panel Meter to MTI Analog Output Products Consumer Electronics Electronics Parts Profiling Thickness Description Some MTI Products with Analog outputs, Accumeasure 9000 and Microtrak 3 laser  How To Use Digital Displays with Analog Outputs MTI Microtrak 3 Lasers and some of our Accumeasure amplifiers such as the Accumeasure 9000 only have analog outputs. If you wish to add a digital display, then the Lascar Panel pilot © makes a nice cost effective (~ $110) addition - Fig 1. These Digital panel meters have both 1 & [...]
Thickness Gauge Measurement With Conductive Wafers and Thin Films
Thickness Gauge Measurement With Conductive Wafers and Thin Films Consumer Electronics Electronics Parts Profiling Thickness Description Using MTI's capacitive thickness gauge Proforma 300i with conductive wafers and thin films G = (a+b+t1+t2 ) Where G is the fixed gap between two probes When making the thickness measurement t2 can appear as t2 (film thickness) when it is a conductor, or 0 thickness when t2 is just air. So t2 will vary between the actual film thickness t2 if it's a conductor all the way down to 0 thickness if the [...]
Interfacing to Offset IF Radar Altimeter
Interfacing to Offset IF Radar Altimeter Customer Case The customer is using an offset IF radar to map forest terrain density. The equipment will be mounted in an aircraft, which will also be carrying a Global Positioning System (GPS) for reference. The plane will fly at an altitude of 10,000 feet. A 512 ns radar pulse will be sent out and a return pulse will be received about 20 uS later, from which 10,000 samples will be acquired. After the pulse is received, there will be a relatively long re-arm time of about 250 to 300 uS for the [...]
Measuring Piezoelectric Properties with Fiber Optics
Measuring Piezoelectric Properties with Fiber Optics Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description Figure 4: Fiber Optic MTI 2100 Fotonic Sensor Introduction Researchers from the University of Arizona used the MTI-2000 Fotonic Sensor to measure the indirect piezoelectric properties (d33) and strain of bulk ferroelectric and thin film samples. The team then correlated these results with data acquired from direct piezoelectric effect measurement. By comparing data sets, the researchers concluded that the MTI-2000 provides a useful optical technique for measuring the [...]
Semiconductor Wafer Lapping and Displacement Measurement
Introduction This application note explains how MTI's Accumeasure technology was used with a lapping machine to measure displacement (wafer material removal) and determine the new semiconductor wafer thickness. Changes in electrical capacitance (displacement) were measured and then directly converted into a 24-bit digital reading to obtain precise digital thickness measurements. During lapping, a wafer of known start thickness is placed on a rotary lapping table. The backside of the wafer faces downward and toward a lapping surface that rotates and removes unwanted material. The amount of material that is removed varies by device type, and the entire semiconductor [...]