Pipeline Testing
Pipeline Testing Customer Case The customer wants to test pipelines for corrosion and cracks. They intend to use a small robot which they can send into the pipeline. This robot's purpose is to test the pipe by ultrasound and magnetic field for cracks, corrosion and other damage. The customer is using 2 different types of transducers, one for ultrasound and one for the magnetic field. They are sending a pulse with a magnetic field generator, capturing the received signal, rotating the transducer 1/2 degree and then sending another pulse and capturing signal again. After a complete 360 degree rotation, [...]
Plasma Coating of Airplane Parts
Plasma Coating of Airplane Parts Customer Case The customer produces plasma coating for airplane parts. They need to count the number of plasma particles on these parts so that they can adjust the plasma torch to be less or more powerful in order to obtain the required thickness of plasma coating. Using a particle detector, they are able to measure temperature, speed and quantity of particles. These parameters are used as feedback to control the plasma coating process. GaGe Case Solution The customer requires a scope card that has both high-resolution and a fast sampling rate. At the time [...]
Whitepaper: Why Capacitance? Benefits and Applications of Digital Capacitive Sensors GalleryWhitepaper: Why Capacitance? Benefits and Applications of Digital Capacitive Sensors
Brand-MTI, Industry-Automotive, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Industrial Processing, Industry-Manufacturing, Industry-Measurement Applications, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Knowledge Center-MTI, News-MTI, News-Vitrek, Whitepapers-MTI
Whitepaper: Why Capacitance? Benefits and Applications of Digital Capacitive Sensors
Industry applications illustrate the versatility and benefits of today's digital capacitive sensor technology. The electrical capacitance formed between a capacitance probe and target surface varies as a function of the distance, or gap, between those two surfaces.
Avionics Bus Monitoring
Avionics Bus Monitoring Customer Case The requirement is to monitor anomalies on an avionics bus that controls systems aboard spacecrafts. The customer will know typical rise times, and therefore, will look for anomalous high-voltage pulses that may occur due to sunspots or cosmic rays. An A/D card with at least 12-bits of vertical resolution is required to capture anomalous glitches for characterization. The required sampling speed is 50 KHz, on two simultaneous channels that monitor two bus lines. The input signal bandwidth is typically 4 KHz. The customer would like to write his own data acquisition application programs in [...]
Industrial
Industrial The following example case studies demonstrate how GaGe products and services have been successfully applied in various data acquisition industrial applications. We encourage you to contact us and discuss your application in more detail with our engineering team. GaGe can provide tailored custom hardware and software solutions to meet specific application requirements. Industrial Avionics Bus Monitoring Gas Turbine Monitoring Plasma Coating of Airplane Parts Monitoring Critical Variables Nuclear Reactor Cooling Liquid Flow Measurements Pulsed Electric Field Food Processing Galvannealing Phosphor Thermometry Airborne Communications Signal Monitoring Non-Destructive Testing (NDT) NDT for Steel Manufacturing NDT of [...]
Interfacing to Offset IF Radar Altimeter
Interfacing to Offset IF Radar Altimeter Customer Case The customer is using an offset IF radar to map forest terrain density. The equipment will be mounted in an aircraft, which will also be carrying a Global Positioning System (GPS) for reference. The plane will fly at an altitude of 10,000 feet. A 512 ns radar pulse will be sent out and a return pulse will be received about 20 uS later, from which 10,000 samples will be acquired. After the pulse is received, there will be a relatively long re-arm time of about 250 to 300 uS for the [...]
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity GalleryWhitepaper: Semiconductor Wafer Measurement for Increased Productivity
Brand-GaGe, Brand-MTI, Brand-Vitrek, Brands-All, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-OEM, Industry-Semiconductor, Industry-Semiconductor-MTI, Knowledge Center-MTI, News-Industry, News-MTI, Whitepapers-MTI
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity
Semiconductor Wafer Measurement for Increased Productivity This three-part article describes how manufacturers leverage capacitance-based inspection systems for semiconductor wafers. The article reviews best-practices, consequences of failing to inspect semiconductor wafers and benefits of using semi-automated, fully-automated and manual systems for wafer metrology and inspection. Part 1: Why Disc Geometry Matters in Wafer Production Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec [...]
Hopkinson Bar Testing (Stress Pulse Reaction Testing)
Hopkinson Bar Testing (Stress Pulse Reaction Testing) Customer Case This customer is involved in testing materials for how they react to stress pulses. The idea is to introduce a stress pulse into the Material Under Test (MUT) and monitor it as it travels through the material. This method of material characterization is also known as "Hopkinson Bar" testing. Multiple sensors pick up the reaction of the material and provide outputs which need to be digitized. These outputs are transient signals of approximately 2 Volts and have a rise time of approximately 600 nanoseconds. The resulting system must be programmable [...]
The Cost of Failing to Inspect Semiconductor Wafers
This is the second of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Most semiconductor wafers are made of silicon, the second most common element in the Earth’s crust. Yet, silicon’s abundance does not mean that wafers are inexpensive. The pure form of silicon that’s used in semiconductors does not occur naturally and must be refined and mixed with a dopant that alters material properties and electrical characteristics. Silicon ingots are formed, wafers [...]
Cable & Wire Troubleshooting Made Easy-Using the MTI 1510 Precision Signal Generator
Cable & Wire Troubleshooting Made Easy Using MTI Instruments 1510A Precision Signal/Function Generator Cable & Wire troubleshooting is important to identify and resolve problems with electrical or data transmission systems. Without proper troubleshooting, systems can fail, causing a range of issues including downtime, lost productivity and safety hazards. MTI Instruments 1510A is ideal for troubleshooting in the instrumentation room, factory floor, flight-line or laboratory. 1510A Key Benefits The 1510A is a portable signal source used for calibrating electronic equipment and machinery monitoring systems. Its portability and ruggedness make it ideal for use in the instrumentation room, [...]