About Wafer Bow And Warp Measurement Systems
About Wafer Bow And Warp Measurement Systems Semiconductor/Solar Wafer Bow And Warp Metrology/Surface Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness encountered during a scan pattern or series of point measurements. TTV is expressed in microns or mils (thousandths of an inch). Figure above shows a wafer placed between two non-contact [...]
Perspective: The Importance of Aviation Engine Vibration Testing
A White Paper by Rick Jones, President and CEO of MTI Instruments, addressing the industry-wide challenge of aviation safety and service and the importance of jet engine testing.
Three Vibration / Balancing Solutions for the Aviation Industry
A technical White Paper by Isaac Abbott, Lead Engineer for MTI Instruments, on three vibration/balancing solutions for the aviation industry.
About MTI Instruments
About MTI Instruments About MTI Instruments MTI Instruments is a US-based manufacturer of precision tools, systems and solutions for clients requiring the precise measurement and control of products and processes, and for the development and implementation of automated manufacturing, assembly, and complex machinery operation. Our product solutions are used in: Engine vibration analysis systems for military and commercial aircraft applications Industrial manufacturing/production markets Research, design and process development market. Quality Policy MTI’s policy is to provide professional and efficient service to meet or exceed each of our customers’ requirements; providing products services of the highest quality. MTI maintains [...]
MTI Instruments Calibration & Repair
MTI Instruments maintains a Quality Management System (QMS) in accordance with ISO9001:2015 MTI Instruments is pleased to provide world class customer support – before, during and after the sale. Our highly skilled factory service technicians take pride in getting the job done right and providing standard cal/repair turnaround times that are among the fastest in the test equipment industry. To arrange to have your unit factory serviced, contact us to request an RMA number. Please include model number, serial number, type of service requested and a description of the problem [...]
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All statements and expressions are the sole opinion of the company and are subject to change without notice. The Company is not liable for any investment decisions by its readers or subscribers. It is strongly recommended that any purchase or sale decision be discussed with a financial advisor, or a broker-dealer, or a member of any financial regulatory bodies. The information contained herein has been provided as an information service only. The accuracy or completeness of the information is not warranted and is only as reliable as the sources from which it was obtained. Investors are cautioned that they may [...]
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Legacy Products
Vitrek Legacy Products Vitrek 944i Dielectric Analyzer and 930i Ground Bond Tester See 95x This product line has been replaced by the 95x Series. Vitrek V3, V50 & V60 Series (V3, V50, V51, V52, V53, V60, V61, V63, V4) Testers See V7X This product line has been replaced by the V7X Series. Vitrek 4600, 4600A, and 46XXB Series High Voltage Meters See 4700 This product line has been replaced by the 4700 HV Meter. Vitrek 948i High Voltage Switching System See 964i [...]
Measurements Using Capacitive Sensors
Precise Measurements Using Capacitive Sensors Capacitive sensors can be divided into two categories based upon their performance and intended use. High resolution sensors are typically used in displacement and position monitoring applications where high accuracy, stability and low temperature drift are required. Quite frequently these sensors are used in process monitoring and closed-loop feedback control systems. Proximity type capacitive sensors are much less expensive and are typically used to detect the presence of a part or used in counting applications. Applications Position Sensing General positioning is probably the most [...]
Semi-Automated Metrology System
Semi-Automated Metrology System Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness Download Brochure Download Report Request a Quote Measures Thickness, TTV, Bow, Warp, Site and Global Flatness. About the Semi-automated Metrology System The Proforma 300iSA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300iSA delivers full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness. User-defined and ASTM/SEMI compliant [...]