MTI Instruments is making its global presence known in Singapore
Click Here to View Ways to Use 1510A with the PBS-4100+ Join MTI Instruments at the Singapore Expo Convention and Exhibition Centre from September 24th to September 26th, 2019. Visit MTI Instruments in Booth #756 at the premiere event in Asia Pacific for the commercial air-transport maintenance, repair and overhaul (MRO) industry, to see its PBS-4100 line of vibration and balancing systems. Aircraft engine vibrations caused by out-of-balance parts can lead to cracked fan, turbine, and compressor components. Imbalance-induced vibrations can also cause metal fatigue and, if left unchecked, engine failure. Pinpointing the source of vibrations can be challenging [...]
How to Reduce Inconsistent Wafer Measurements
How to Reduce Inconsistent Wafer Measurements Avoid 5 Common Mistakes That Destroy Wafer Measurement Accuracy You take pride in your work. You’re precise, accurate and depend on the right metrology equipment. Then why are your bare semi-conductor wafer measurements sometimes inconsistent? It may be something you’re doing (or not doing) — without realizing it. MTI Instruments discovered there are five common mistakes that engineers and users make with bare semi-conductor wafers. The “Five Mistakes Made When Taking Semiconductor Wafer Measurements” Tech-Brief details these all-too-typical errors that adversely impact measurements. [...]
Semi-Automated Metrology System
Semi-Automated Metrology System Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness Download Brochure Download Report Request a Quote Measures Thickness, TTV, Bow, Warp, Site and Global Flatness. About the Semi-automated Metrology System The Proforma 300iSA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII’s exclusive Push-Pull capacitance technology, the Proforma 300iSA delivers full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness. User-defined and ASTM/SEMI compliant [...]
Five Common Mistakes with Semiconductor Wafer Measurement GalleryFive Common Mistakes with Semiconductor Wafer Measurement
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, Z-REPUB, z1
Five Common Mistakes with Semiconductor Wafer Measurement
Semiconductor wafer measurement requires a high degree of precision. The right metrology equipment and inspection processes are important, but so is procedural consistency and attention to detail. If you’re not getting the results you want, it’s time to look beyond the measurements. With bare semiconductor wafers, users need to avoid these five common mistakes. Mistake #1 | Turning the Device Off Most users turn on metrology devices only when it’s time to use them. As soon as semiconductor wafer measurement is complete, the devices are turned off. This reduces electricity consumption but also introduces thermal instability that can cause [...]
ProTrak G: 2D/3D Laser
ProTrak G: 2D/3D Laser Compact Size 2D / 3D profiling sensor for automation and process monitoring REQUEST A QUOTE Download Data Sheet The ProfileTrak G series are compact profiling sensors that fit in tight spaces. These 2D/3D sensors provide accurate profiling, height, width and positioning measurement using the latest CMOS technology with fast measuring rate of up to 4,000 Hz, built-in display, excellent measuring accuracy, compatible interfaces such as Gigabit Ethernet and much more. Available with measuring ranges from 36 mm to 400 mm for applications such as profiling, height, width and [...]
Capacitance Probes: Five Things You Need to Know
Capacitance probes are non-contact measurement devices with a capacitance sensor inside a protective shell or housing. They use cables and connectors to integrate with amplifiers and are an important part of capacitance measurement systems. By using capacitance, engineers can measure physical parameters such as vibration, pressure, liquid levels, metal contamination, and seismic activity – just to name a few. There’s a lot to know about capacitance probes, but five key facts to understand. Capacitance probes are highly accurate and very stable. They’re better than older devices and competing technologies. They require little calibration and support miniaturization and embedding. They [...]
Laser Thickness Gauge System-Legacy Product
Non-contact laser thickness gauge with digital thickness computation - This is a Legacy product. Contact Vitrek for information. Request Info for Replacement Product Download Data Sheet The Microtrak 3 Thickness Gauge System used for automated metal, fiberboard and cement board sheet production and QA/QC combines our proven non-contact laser triangulation sensors with a modular controller that can operate either as a standalone solution for displacement measurement or with a PLC/PC. The controller simplifies thickness applications through high speed internal sampling and digital thickness computation, reducing errors often encountered with traditional analog summing methods. The [...]
Capacitance Sensors: Three Things You Need to Know
Capacitance sensors are precision measurement tools for process automation, quality control, and tool automation control. They’re used in a many different industries and are suitable for virtually any application where accuracy is paramount. There’s a lot to know about capacitive sensors (as they’re sometimes called), but engineers need to start with three key questions. What are the parameters to specify when selecting a capacitance sensor? What are factors to consider when embedding a capacitive sensor in an industrial application? What is the future of capacitance-based measurement products? MTI Instruments has been providing U.S.-made capacitance sensor systems for over 50 [...]
55CA: Single Channel Rugged Charge Amplifier
55CA: Single Channel Rugged Charge Amplifier Accelerometer charge conversion. Request Quote Download Spec Sheet Each 55CA Charge Amplifier provides one (1) channel of charge amplification, a buffered acceleration output signal, and an integrated (velocity) signal output. It also provides single-ended and differential outputs. About the 55CA: Single Channel Rugged Charge Amplifier Accelerometer Charge Conversion The 55CA Charge Amplifier conditions and amplifies charge-mode accelerometer signals. It is a rugged device designed to be used in engine test cells and other environments where [...]
How to Implement a Complete Digital Closed Loop Control System
Co-authored by Don Welch, Director of Engineering and Business Development Cory Bufi, Software Engineer Isaac Abbott,Product Innovation Engineer – PBS Group Request Whitepaper Today’s electronic designs often call for reasonably fast and precise positioning of miniature components for process deposition elements such as ink jet nozzles, 3D printing elements etc. And as process control moves from mm positioning to micron to sub-micron positioning it becomes necessary to monitor and control positioning actuators such as piezo flexure stage and voice coil motors. Open loop control of the positioning stage may have been adequate in non-precision applications but piezo electric [...]