ABOUT WAFER BOW AND WARP MEASUREMENT SYSTEMS
Thickness Measurement for Metrology Systems ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness encountered during a scan pattern or series of point measurements. TTV is expressed in microns or mils (thousandths of an inch). ASTM F534 3.1.2: The deviation of the center point of the median surface of a free, unclamped wafer from the median [...]
LITHOGRAPHY OPTICS POSITION FOCUS
Industry Semiconductor Applications Photolithography Using Capacitance Sensors Measurement Type Positioning Description One specific area where capacitance systems excel is high resolution focusing of complex lens systems such as those found in atomic force microscopes, vision inspection machines and photolithography tools. In a multi-million dollar photolithography tool, high accuracy, nanometer resolution and maximum thermal stability are absolutely critical to maintain proper focus and obtain integrated circuit line widths as small as 45 nanometers. Additionally, most systems demand low power consumption and maximum heat dissipation to eliminate any adverse affects from [...]
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12. GalleryCompliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12.
Application Notes-Vitrek, Brand-Vitrek, Industry-Automotive, Industry-Compliance Testing, Industry-Consumer Products, Industry-Energy, Industry-Manufacturing, Industry-Medical, Industry-Medical, Industry-OEM, Industry-R&D, Industry-Semiconductor, News-All Brands, Products-Vitrek-Power-Analyzer
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12.
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12. Using the Vitrek PA900 Precision Harmonic Power Analyzer Introduction Compliance with electromagnetic compatibility (EMC) standards is mandatory for electrical and electronic equipment sold in many global markets. Among these, the IEC61000-3-2 and IEC61000-3-12 standards specify limits for harmonic current emissions of equipment connected to low-voltage public supply systems. These limits ensure that individual devices do not contribute excessively to harmonic distortion on the power grid, which can lead to overheating in transformers, nuisance tripping of breakers, and interference with other equipment. The Vitrek PA900 Precision Power [...]
GAAS SUBSTRATE THICKNESS MEASUREMENT
Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk resistivity (>10k Ohm/cm) is a little more difficult because the wafers act as non-conductive insulators in a capacitive sensor’s measuring field. Fortunately, MTI has a solution to this problem. Solution: It’s possible to measure the thickness and TTV of high resistivity semiconducting wafers (like GaAs) using non-contact capacitive [...]
Spindle Run Out
Industry Automotive Applications Spindle Run Out Measurement Type Positioning Description Rotating targets frequently have an intermittent, uncertain or nonexistent ground path. This introduces unwanted noise, instability, drift and reduces accuracy of the measurement. MTI Instruments offers a unique “Push-Pull” capacitance measurement system that does not require a grounded target. It utilizes two probes, built into one body, that work together to complete the ground path. One probe pushes current into the brake rotor while the adjacent probe pulls the current out. The result is a “clean”, consistent electrical sensing path. As the [...]
CAPACITANCE SENSORS FACILITATE 3D IC CONSTRUCTION
[Application Note 70518] To boost device performance, today’s semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting the Z-axis avoids the power and footprint penalties associated with two-dimensional processes. Implementing the rationale, however, is not so simple. Going vertical requires coplanar surfaces to make contact with all pins, pads, and pillars. Problem Typically, manufacturers measure the angle and gap between two planes to determine coplanarity. Bonding tool actuators rely on these angle/gap measurements to adjust components and make sure all device pins and/or solder balls reside on the [...]
CAMERA SHIELD MEASUREMENT
Equipment Setup Equipment Used DTS-25-04 laser head Rotary Stage PC with Digital Microtrak Basic Support software Setup Power is automatic mode. Filter is 100Hz Sample rate is 1000 samples sec The head was operated in diffuse mode (not specular/tilted) Validation of Setup The setup should be validated by performing a total runout scan on the rotary stage with no target present. The stage should be cleaned with Isopropyl alcohol and allowed to dry prior to the scan. This reduces any dust or dirt accumulation which will give a false reading of runout. A 360-degree runout of the rotary table, [...]
MONITOR ROLLER GAPS AND PARALLELISM
Easy Roller Gap Measurement Ensures Calendering Success Many roll-to-roll finishing processes typically use a calender, or series of hard pressure rollers, to deliver smooth, high-quality products of plastic, textile, or paper (Fig 1). Ensuring a consistent material thickness, however, depends on the ability to monitor, and maintain, a precise gap between rollers. This application note describes a quick and easy means for roller gap measurement. Problem Establishing a roller gap and checking for parallelism across roller width can be a slow and cumbersome procedure. Manual measurement requires multiple sized feeler gauges which can introduce errors. Misinterpreting feeler gauge drag, [...]
ADDING A DIGITAL PANEL METER TO MTI ANALOG OUTPUT PRODUCTS
How To Use Digital Displays with Analog OutputsMTI Microtrak 3 Lasers and some of our Accumeasure amplifiers such as the Accumeasure 9000 only have analog outputs. If you wish to add a digital display, then the Lascar Panel pilot © makes a nice cost effective (~ $110) addition – Fig 1. These Digital panel meters have both 1 & 2 channel display capability and the user can customize the display with a variety of interesting formats. The meter can operate off 4-30VDC which is compatible with the MT-3 power supply and the panel meter inputs can handle 0-10V which is compatible with [...]
PRECISION LASER MEASURING TOOLS
If you are looking for high quality, reliable precision laser measurement tools and devices then you are in the right place. MTI Instruments is a manufacturer of precision tools, systems and solutions for clients requiring the precise measurement and control of products and processes, and for the development and implementation of automated manufacturing, assembly, and complex machinery operation. Our product solutions are used in: Engine vibration analysis systems for military and commercial aircraft applications Industrial manufacturing/production markets Research, design and process development market. Non-Contact Measurement Turbine Balancing & Vibration Analysis Semiconductor/Solar Metrology Systems Signal Generator Applications When it comes [...]