HEIGHT GAP OF INKJET PRINTERS
Industry Consumer Electronics Applications Height Gap Of Inkjet Printers Measurement Type Positioning Description Introduction: Inkjet printers require a certain distance between the inkjet print head and the paper. If the distance is set incorrectly, the printed images get blurry. Current state of the art printers have the print head nozzles built right into the bottom of the ink reservoir (B) as shown below. When the ink cartridge is installed in the printer, the inkjet nozzles (made out of silicon) essentially become a grounded target through the connections shown at [...]
NUCLEAR HEAT EXCHANGER VIBRATION
Power plants, particularly nuclear power plants, require heat exchangers to cool down the primary working fluid for the power plant. Excessive vibration can lead to cracking and premature failure of the heat exchanger. Problem: A major power plant company approached MTI looking for a sensor that could measure vibration of a heat exchanger assembly that was immersed under water. Additionally, the water could reach 250 F and up to 220 PSI; the probe had to be sealed with a gland at a bulkhead feed through area. Solution: MTI developed a special fiber optic probe based on the MTI-2125H probe configuration. The [...]
GaGe on Google Scholar
Visit and View "GaGe Digitizer" on Google Scholar Visit and View "GaGe Applied Technologies" on Google Scholar Google Scholar is a dedicated search site for scholarly literature that includes academic research papers, technical articles, patents, and more. Use the above links to review results of all articles in which GaGe products and services have been cited for various applications in fields such as: Wideband Signal Analysis RADAR Design and Test Signals Intelligence (SIGINT) Ultrasonic Non-Destructive Testing (NDT) LIDAR Systems Communications Optical Coherence Tomography (OCT) Mass Spectroscopy Ultrasound Imaging Time of Flight (TOF) Life Sciences Particle Physics [...]
Standardizing Electrical Safety Testing Across Global Aerospace Manufacturing GalleryStandardizing Electrical Safety Testing Across Global Aerospace Manufacturing
Application Notes-Vitrek, Brand-Vitrek, Industry-Aerospace, Industry-Cable Test, Industry-Compliance Testing, Industry-Government/Military, Industry-Manufacturing
Standardizing Electrical Safety Testing Across Global Aerospace Manufacturing
Introduction Modern aerospace manufacturing demands more than accurate electrical safety testing. As production programs expand across multiple facilities worldwide, manufacturers must ensure every product is tested using identical procedures while maintaining complete traceability and documentation. For one of the world’s leading business jet manufacturers, introducing a newly developed electronic device into global production required a standardized electrical safety testing solution.. The device required dielectric withstand (hipot) and insulation resistance (IR) testing before deployment at manufacturing sites around the world. Because production personnel had limited experience with high-voltage electrical safety testing, the company needed a solution that was easy to [...]
Automating Complex Cable Testing with the Vitrek V10X and 964i GalleryAutomating Complex Cable Testing with the Vitrek V10X and 964i
Application Notes-Vitrek, Brand-Vitrek, Industry-Aerospace, Industry-Automotive, Industry-Cable Test, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Government/Military, Industry-Lighting, Industry-Manufacturing, Industry-Medical, Whitepapers-Vitrek
Automating Complex Cable Testing with the Vitrek V10X and 964i
Introduction Cable assemblies are no longer simple pass/fail products. Modern harnesses may contain dozens—or hundreds—of conductors, shielding paths, insulation systems, and termination points. Testing them manually is slow, labor intensive, and prone to inconsistency. The combination of the Vitrek V10X Hipot Tester and Vitrek 964i High Voltage Switching System creates a modern automated platform for validating cable safety and integrity with higher speed and repeatability. The Challenge Manufacturers of advanced cable assemblies are under constant pressure to improve quality while keeping production moving. Many products now use large pin-count connectors and complex multi-conductor designs that require access to numerous [...]
Technology Brief: GaGe Digitizers — Powering the Next Generation of Distributed Fiber Sensing
Introduction An exciting new technology called Distributed Fiber Optic Sensing (DFOS) transforms ordinary communications fiber into a continuous sensing array that extends over kilometers. Communications fiber is designed to minimize optical attenuation and maximize the transmitted optical signal. Nonetheless, a small amount of light is backscattered towards the light source. This backscatter is routinely acquired by Optical Time-Domain Reflectometers (OTDRs) to characterize fiber. Modern communications fiber typically has a very low attenuation of about 0.2 dB/km. DFOS instruments similar to OTDRs are generally called interrogators. Backscatter is divided into two types. Elastic backscatter occurs at the same energy (or, [...]
Application Note: GaGe Digitizers — Configuring GaGe Digitizers for Distributed Fiber Optic Sensing (DFOS)
Introduction Distributed fiber optic sensing (DFOS) uses optical fiber to measure temperature, strain, or vibration at many locations along its length. By analyzing changes in backscattered light, a DFOS interrogator can monitor conditions across extended assets such as pipelines, bridges, and railway infrastructure. In pulse-based systems, the arrival time of the returned light identifies its position along the fiber, while the optical sensing method determines which physical quantities can be measured. A photodetector converts the returning light into an electrical waveform, which a high-speed digitizer captures for processing. Selecting and configuring the digitizer requires attention to sampling rate, input [...]
Application Note: Wafer & Thin-Film Stress Characterization Using the Proforma 300iSA
Introduction Thin films are essential to modern semiconductor devices, but every deposited, grown, bonded, or processed layer can introduce mechanical stress into the wafer. When that stress becomes excessive or inconsistent, the effects can extend well beyond the deposition step—contributing to wafer bow, cracking, delamination, overlay error, handling problems, yield loss, and downstream process instability. The MTI Instruments Proforma™ 300iSA semi-automated metrology system provides the full-wafer thickness and shape data needed to evaluate these risks. By measuring wafer geometry before and after a process step, engineers can quantify curvature change and use established film-stress relationships to calculate and trend [...]
Application Note: Replace Three Legacy Systems with One: Modernizing Aerospace/Defense Test Cells with PBS eXpress GalleryApplication Note: Replace Three Legacy Systems with One: Modernizing Aerospace/Defense Test Cells with PBS eXpress
Application Notes-MTI, Brand-MTI, Industry-Aerospace, New & Press Releases, News-Industry, News-MTI, Whitepapers-MTI
Application Note: Replace Three Legacy Systems with One: Modernizing Aerospace/Defense Test Cells with PBS eXpress
Introduction Many military/defense and commercial aerospace test cells still rely on aging analog instruments that, while functional, introduces risk through calibration challenges, legacy components, and lack of digital data access. As testing demands evolve, the industry is moving toward compact, digital platforms that simplify workflows and improve data usability. A Vitrek customer faced this challenge across multiple engine test cells. Their solution: replace two legacy systems with a single PBS eXpress R+, enabling faster setup, digital data acquisition, and automated reporting. The Challenge The customer’s test cells were built around a mix of aging instrumentation, including TrigTek tracking filters, [...]
Application Note: Why Charge Amplifiers Remain Essential in Aerospace Test Systems
Introduction Many aerospace test programs rely on charge-output piezoelectric accelerometers, force sensors, and dynamic pressure transducers because of their wide frequency response, rugged construction, and ability to capture rapidly changing events. These sensors generate extremely small electrical charge signals—often measured in picocoulombs (pC)—that are susceptible to cable capacitance effects, electrical noise, leakage currents, and environmental influences that can compromise measurement accuracy. Charge amplifiers address these challenges by converting the sensor’s high-impedance charge output into a stable, low impedance voltage signal suitable for transmission, recording, and analysis. By making measurements largely independent of cable capacitance while maintaining low noise, stable [...]