Capacitance Guide to Industrial Applications This guide from MTI Instruments explains what you need to know about using electrical capacitance for measurement in industrial applications, including advanced manufacturing. Basic Principles Capacitance is the ratio of the change in an electric charge to the corresponding change [...]
Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting [...]
Measuring Piezoelectric Properties with Fiber Optics Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description MTI-2000 Fotonic Sensor Introduction Researchers from the University of Arizona used the MTI-2000 Fotonic Sensor to measure the indirect piezoelectric properties (d33) and [...]
MTI's Accumeasure HD Amplifier vs. SmarAct's PicoScale Interferometer Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description This application note compares MTI's Accumeasure HD amplifier to SmarAct's Picoscale interferometer in terms of resolution and accuracy for very small displacement measurements. [...]
Testing for Connector Failure Due to Vibration or Shock Mobile Communications Equipment Needs Reliable Connectors That Will Not Disconnect with Shock or Vibration Introduction A large multinational company approached MTI to provide a sensor capable of measuring displacement that also wouldn’t load the target (connector). Shock and [...]
Interfacing MTI's Digital Accumeasure to Measurement Computing's DASYLab with Modbus Interfacing MTI's Digital Accumeasure to Measurement Computing's DASYLab with Modbus Displacement Description Laptop running MC DASYLab1 © and MTI Digital Capacitance sensor over Modbus TCP/IP Measurement Computing's DASYLab data acquisition software is easy to use [...]
Dynamic Measurement of Small Oscillatory Motions Research & Development Piezoelectric Stack Motion Fotonic Systems Displacement Description This application note describes the measurement of a very small oscillatory motions (nanometers) produced by a piezo electric device with the MTI-2100 and the MTI-2032RX high-resolution module. Fotonic™ sensors from [...]
Semiconductor Wafer Characterization Surface Description Thickness Measurement ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the [...]
