Webinar Recap: Vitrek Products for Metrology and Calibration Labs
Metrology requires equipment capable of precise measurements and accurate readings. Taking the time to ensure that the instruments you use remain properly calibrated requires the right tools and training to ensure that they are in good working order. In our webinar: Vitrek Products for Metrology and Calibration Labs, we cover why you need the right calibration tools and why Vitrek offers the best high voltage tester options on the market in the form of our 4700 High Voltage Meter, PA920 Power Analyzer, and 2000MN Calibrator. […]
Synchronizing Over A Wide Sampling Speed Range
Synchronizing Over A Wide Sampling Speed Range Customer Case The client has set up an experiment where he needs to generate a stimulus signal and apply it to a He-Ne Laser with some polarizing optics. The response signal is a measurement of the Faraday effect. The signal is noisy and requires averaging over a very long time. The stimulus and response must be synchronized over a wide frequency range. For synchronization, the application requires a wide band of sampling speed from, 1 KS/s to 50 MS/s. GaGe Case Solution While GaGe's CompuScope 14100 provides the required digitizer performance, it [...]
Using Capacitance Sensors for Non-Conductive Material Measurement GalleryUsing Capacitance Sensors for Non-Conductive Material Measurement
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Sensors, News-MTI, News-MTI-Instrumentation, Products-MTI-Capacitance, Z-REPUB, z1
Using Capacitance Sensors for Non-Conductive Material Measurement
Non-Conductive Material Measurement with Capacitance Sensors Capacitance sensors are non-contact devices that can be used to obtain position, thickness, and dynamic measurements with a high degree of precision, accuracy, and resolution. Capacitive measurement is used with electrically-conductive materials such as metals but can also be used to measure non-conductive materials such as glass, sapphire, and many plastics. Even if a non-conductive material is relatively inexpensive (such as closed cell foam), manufacturers want to avoid errors that can result in significant waste across high volumes. Importantly, capacitance measurement is also used with semi-insulating materials such as gallium arsenide (GaAs) and [...]
Research & Development
Research & Development The following example case studies demonstrate how GaGe products and services have been successfully applied in various data acquisition national research & development laboratory applications. We encourage you to contact us and discuss your application in more detail with our engineering team. GaGe can provide tailored custom hardware and software solutions to meet specific application requirements. Atomic GaGe Digitizers Reveal Atomic Structure Laser Synchronizing over a Wide Sampling Speed Range High-Power Laser Lamp Array Tester Laser Based Position Measurement Systems Laser Excitation of Single Atoms Particle Physics Neutrinos Study Radioactive Nuclear-Decay Detection Neutrino Detection [...]
Semiconductor Wafer Lapping and Displacement Measurement
Semiconductor Wafer Lapping and Displacement Measurement Semiconductor Semiconductor Wafer Manufacturing Displacement Description Semiconductor Wafer Lapping and Displacement Measurement This application note explains how MTI’s Accumeasure technology was used with a lapping machine to measure displacement (wafer material removal) and determine the new semiconductor wafer thickness. Changes in electrical capacitance (displacement) were measured and then directly converted into a 24-bit digital reading to obtain precise digital thickness measurements. During lapping, a wafer of known start thickness is placed on a rotary lapping table. The backside of the wafer faces downward and toward [...]
Time Resolved Spectroscopy of Protein Crystals
Time Resolved Spectroscopy of Protein Crystals Customer Case The customer is involved in Time Resolved Spectroscopy of protein crystals. This involves shooting a laser onto the protein crystals and measuring the pulses generated by the crystals (as they are projected out of the sample) and their decay over time. Due to the very noisy nature of the return signals, it is essential to average many pulses in order to recover the pulse shape and measure the decay. The decay takes place over many tens of milliseconds, so it is necessary to acquire very long records (in the order of [...]
Why Demand for SiC Wafers is Soaring and Durable GalleryWhy Demand for SiC Wafers is Soaring and Durable
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Why Demand for SiC Wafers is Soaring and Durable
Silicon carbide (SiC) wafers are in high demand, particularly in high-temperature applications. Silicon carbide (SiC), a semiconductor material made of both silicon and carbon, can withstand extreme temperatures of up to 2700°C. Often referred to as carborundum, SiC’s unique properties also make it a key material in non-electronic applications such as bulletproof vests, extrusion dies, sandpaper, and high-performance disc brakes. In the electronics industry, SiC wafers are crucial for devices operating under high temperatures, high voltages, or both. For example, they are used in electric vehicle (EV) power electronics, 5G communication systems, and LED technology, making SiC a material [...]
Hyper Remote Laser Sensor
Hyper Remote Laser Sensor Customer Case The customer is at the prototype stage for building a hyper remote sensor which will fly over the ocean and be able to see 100 to 200 feet below the surface. The sensor is being designed in order to determine the composition of the ocean and the ocean floor. This remote sensor will be extremely useful in the detection of pollution and studying the way pollution is being distributed by ocean currents. It will also be useful to the military (navy) for creating mine-finding systems. A deep blue laser will be used to [...]
Wafer Stress Analysis Using the 300iSA
Wafer Stress Analysis Using MTI Instruments Proforma 300iSA Wafer processing involves several stages that can lead to mechanical changes in the wafer structure. These changes, or stresses, may result in deformities, making the wafer either unusable or only marginally usable. To evaluate these stresses and determine the wafer's quality, wafer stress measurement is essential. The Proforma 300iSA wafer characterization tool offers a powerful solution for wafer stress analysis. It allows for the analysis of a wafer both before and after processing. By comparing these two states, the Proforma 300iSA effectively evaluates the wafer's stress levels and mechanical alterations, providing [...]
Laser Induced Fluorescence (LIF)
Laser Induced Fluorescence (LIF) Customer Case A customer has developed a breakthrough technique for the application of laser-induced fluorescence (LIF) detection to high performance liquid chromatography, capillary e lectrophoresis, sequencing and microbial analysis. The technique involves using fluorescence decay curves at multiple wavelengths simultaneously, leading to true 3-D fluorescence spectroscopy (i.e., fluorescence intensity as a function of wavelength and delay time relative to pulsed excitation). They have a requirement to increase the laser pulse repetition frequency (PRF) from 20-50 pulses per second to 500-1000 pulses per second. Basically, they want to collect and time resolve the fluorescence signal for [...]