Soluna Holdings Announces Sale of its MTI Instruments Business
$10.75 Million Sale Price Allows for Further Acceleration of Cryptocurrency Mining Business Soluna Holdings, Inc. (“SHI” or the “Company”), (NASDAQ: SLNH), the parent company of Soluna Computing, Inc. (“SCI”), a developer of green data centers for cryptocurrency mining and other intensive computing, today announced the sale of its MTI Instruments subsidiary to Vitrek LLC, a strategic buyer in the test and measurement space. Per the sale agreement, the Buyer is acquiring 100% of the common stock of MTI Instruments for $10.75 million. With the sale completed, Soluna Holdings expects that it will be solely focused on developing and monetizing [...]
Optical Scanning of Drive Media
Optical Scanning of Drive Media Customer Case The customer's application is optical scanning for drive testing. The goal is to identify burnt or damaged spots on the disk. The scanning system is generally used in Quality Control, Head-Disk Interaction and Failure Analysis. There is a need for continuous acquisition during the spiral scan. The speed of the disk is 10,000 RPM and the requirement is to capture 65,000 to 80,000 samples each revolution. A single channel is needed for the acquisition at 10 MegaSamples/second or greater. High vertical resolution will aid in measuring the properties and ultimately the degradation [...]
White Paper: High Performance Test Equipment Assures LED Lighting Products Comply with Industry Standards GalleryWhite Paper: High Performance Test Equipment Assures LED Lighting Products Comply with Industry Standards
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White Paper: High Performance Test Equipment Assures LED Lighting Products Comply with Industry Standards
Introduction Manufacturers and users of LED lighting applications need to be assured that their products will be qualified according to a multitude of reliability and efficiency standards. In addition to voluntary initiatives and programs like EnergyStar, mandatory standards and specifications for the lighting industry must be kept in mind during project development, including the latest IES LM-79-19 and the ANSI C82.16 documents. This article gives an overview of relevant lighting standards and specifications for LED lighting products. It also describes the features of Vitrek’s test equipment, including the PA900 power analyzer — featuring built-in lighting specifications — as [...]
Disk Drive Track Scanning
Disk Drive Track Scanning Customer Case The customer is trying to digitize an 83 millisecond long signal coming out of a disk mounted on a rotary motor. This corresponds to one full revolution of the disk. The analog signal coming out of the Device Under Test (DUT) is of approximately 2 MHz bandwidth. Currently, the customer is sampling at 10 MSPS and would like to increase the oversampling to get better time resolution. At present, they are using a CompuScope 225 - 1M, which has sufficient memory to digitize the entire revolution in on-board memory at the 10 MSPS [...]
The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology GalleryThe Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology
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The Benefits of Manual, Semi-Automated, and Fully-Automated Systems for Semiconductor Wafer Inspection and Metrology
This is the third of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The second article examines the cost of failing to inspect semiconductor wafers. Fully automated systems that can load, scan, and unload wafers are fast, convenient, and efficient at high volumes. They’re useful for checking every wafer in every batch, but these systems are expensive. Semi-automated and manual systems cost significantly less and are generally used for lower volumes; however, they’re also easy-to-use and can make fast, accurate measurements that support production flow. Semi-automated and [...]
Why Disc Geometry Matters In Wafer Production GalleryWhy Disc Geometry Matters In Wafer Production
Application Notes-MTI, Brand-MTI, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, News-MTI-Metrology, Products-MTI-Semiconductor/Metrology, z1
Why Disc Geometry Matters In Wafer Production
This is the first of three articles in Semiconductor Wafer Measurement for Increased Profitability. The second article examines the cost of failing to inspect semiconductor wafers. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec after cutting, it may be possible to reprocess the wafer. Cutting is only the first [...]
MEMS-Based High Throughput Screening
MEMS-Based High Throughput Screening Customer Case The customer needs to do frequency analysis to determine the resonant frequency of an oscillating micro-fabricated device. They will use a Laser Doppler Vibrometer to monitor the physical oscillation. This is an instrument that looks at the light reflected from the surface of a moving part to determine the velocity or relative position of the part. Analysis of the motion as a function of the driving frequency determines the resonant frequency. Upon excitation at the resonant frequency, the motion is at its maximum. The expected resonant frequencies are on the order of 1 [...]
Vitrek Returns to the APEC Conference This March
In the world of power electronics, one event has defined the industry for the last 35+ years, setting expectations, introducing new technologies, and providing networking opportunities. The Applied Power Electronics Conference — APEC — has brought together generations of power electronic professionals from across multiple industries to learn and grow their knowledge base. Vitrek is proud to announce our return to the APEC conference in Houston, TX, this year! […]
Automatic Accelerometer Calibration System
Automatic Accelerometer Calibration System Customer Case The customer's Automated Accelerometer Calibration System provides NIST traceable calibration of most accelerometer types, whether self-generating piezo-electric or accelerometers requiring current or voltage excitation. The output of the accelerometer can be charge or voltage, single- ended or differential, AC or DC coupled, isolated or grounded. In building the automatic calibration system, the need is for optimum versatility with regards to the data acquisition card. LabVIEW is the desired control software, and Signal to Noise Ratio and high vertical resolution is of utmost importance for the small variations that occur in Vibration and Shock [...]
White Paper: Fundamentals of Electrical Safety Testing-TEQ
Part 1 - Functions & Features of Advanced Hipot Testers Introduction Electrical safety testers - often referred to as "hipot" testers - are an integral part of electrical and electronic equipment manufacturing. Hipot testers get their name from the high potential (high voltage) they produce to perform dielectric withstand and insulation resistance tests. In addition to these tests, many hipot testers provide accurate low-resistance measurements and low-resistance/high-current outputs to test ground resistance and ground bond integrity. Hipot testing has long been a standard procedure for assuring the electrical safety of electronic equipment. Early commercial hipot testers were actually [...]