Industry 4.0 for Test and Measurement
Industry 4.0 promises greater integration, interoperability, and information exchange. This Fourth Wave of the Industrial Revolution isn’t about a single technology such as machine learning. It’s not just about artificial intelligence (AI) or Big Data either. Rather, Industry 4.0 is a family of connected technologies that will enable industry to collect, analyze, and act upon massive amounts of diverse and distributed data. Smart sensors for precise test and measurement are essential for these advanced systems. MTI Instruments, a global supplier of precision measurement solutions, is developing a new class of wireless and wired sensors to support digital connections for [...]
Laser Transient Absorption Spectroscopy
Laser Transient Absorption Spectroscopy Customer Case The customer's setup is a scientific application in which transient signals from a Laser Absorption Spectroscope are transferred to a computer. The laser power is modified in steps and the process is repeated. The measurement sensitivity is limited by noise generated by the current digitizer. The customer wants to capture and continuously average very small pulse responses. The lowest signal pulse height is 0.5 milliVolts and can range up to 2 mV. The duration of each response pulse is 1 to 10 microseconds. The Pulse Repetition Frequency (PRF) is 10 Hz. The customer's [...]
Charge-Couple Device (CCD) Data Capture
Charge-Couple Device (CCD) Data Capture Customer Case The client is involved in developing a charge-couple device (CCD) based system to function as an imaging spectrometer. The spectrometer will image 5x5 mm squares that will form a 50 mm line or 1.5x1.5 mm squares in a 15 mm line. The line is to be imaged on a CCD chip. In this application the customer needs to simultaneously acquire 10 independent spectra that are 200 pixels long each with 12-bit resolution. The read-out rate is 1000 frames per second for a period of 10 seconds. The 12-bit data is to be [...]
White Paper: Precision Power Analyzers GalleryWhite Paper: Precision Power Analyzers
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White Paper: Precision Power Analyzers
White Paper All the tools needed to study and optimize virtually any power project in a single instrument Introduction The design of any power conversion system requires the measurement of a large range of electrical parameters that could be made using a lab bench full of instruments. The precision power analyzer pulls all of these measurements into a single instrument replacing meters, oscilloscopes, chart recorders, harmonic analyzers and other devices. This paper will provide a basic overview of the functions and capabilities of high-performance power analyzers. Examples of these functions and how to apply [...]
How to Reduce Inconsistent Wafer Measurements
How to Reduce Inconsistent Wafer Measurements Avoid 5 Common Mistakes That Destroy Wafer Measurement Accuracy You take pride in your work. You’re precise, accurate and depend on the right metrology equipment. Then why are your bare semi-conductor wafer measurements sometimes inconsistent? It may be something you’re doing (or not doing) — without realizing it. MTI Instruments discovered there are five common mistakes that engineers and users make with bare semi-conductor wafers. The “Five Mistakes Made When Taking Semiconductor Wafer Measurements” Tech-Brief details these all-too-typical errors that adversely impact measurements. [...]
Vitrek featured in Bodo’s Power Systems
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Laser Measurement & Characterization of Flat Panel Displays
Laser Measurement & Characterization of Flat Panel Displays Customer Case This customer's application involves the characterization of flat panel displays (used in laptop computers, computer game displays, etc.) via laser scanning. The laser is bounced off a number of mirrors and then through lenses, from which it is scattered. The scattered laser light must then be analyzed in order to determine the quality of the flat panel display. This laser measurement system is used not only by flat panel display industries, but also by disk drive manufacturers to analyze platter quality and, in the near future, for characterizing silicon [...]
Laser Signals Striking Silicon-Diode Target
Laser Signals Striking Silicon-Diode Target Customer Case The customer wants to capture the output of some silicon diodes looking at a laser target. The typical signal is anywhere from 20mv to 1V in amplitude and 0 to 15ns in length. There are up to 16 of these diodes that are looking at the same target. Each diode has a different filter so the post-trigger depth and amplitude-scale must be user-adjustable. Their main interest is to sample and digitize the signals for archiving, with later retrieval and plotting. Fancy software is not needed for display as the data is gathered [...]
Five Common Mistakes with Semiconductor Wafer Measurement GalleryFive Common Mistakes with Semiconductor Wafer Measurement
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Five Common Mistakes with Semiconductor Wafer Measurement
Semiconductor wafer measurement requires a high degree of precision. The right metrology equipment and inspection processes are important, but so is procedural consistency and attention to detail. If you’re not getting the results you want, it’s time to look beyond the measurements. With bare semiconductor wafers, users need to avoid these five common mistakes. Mistake #1 | Turning the Device Off Most users turn on metrology devices only when it’s time to use them. As soon as semiconductor wafer measurement is complete, the devices are turned off. This reduces electricity consumption but also introduces thermal instability that can cause [...]
Optical Scanning of Drive Media
Optical Scanning of Drive Media Customer Case The customer's application is optical scanning for drive testing. The goal is to identify burnt or damaged spots on the disk. The scanning system is generally used in Quality Control, Head-Disk Interaction and Failure Analysis. There is a need for continuous acquisition during the spiral scan. The speed of the disk is 10,000 RPM and the requirement is to capture 65,000 to 80,000 samples each revolution. A single channel is needed for the acquisition at 10 MegaSamples/second or greater. High vertical resolution will aid in measuring the properties and ultimately the degradation [...]