Electron Paramagnetic Resonance Imaging (EPRI) Measuring of Tumor Oxygen Levels
Electron Paramagnetic Resonance Imaging (EPRI) Measuring of Tumor Oxygen Levels Customer Case The customer is improving their Electron Paramagnetic Resonance Imaging (EPRI) system that is used for the diagnosis of tumors. Using this non-invasive method, the concentration of oxygen in living tissues can be determined without the need for biopsies. Tumors that have little or no oxygen content (i.e. hypoxia) also have increased resistance to radio-frequency radiation, making it less effective as a choice for cancer treatment. Identifying those patients with hypoxic tumors allow alternative treatments to be used instead. The requirement is to capture the returned RF signals [...]
Transmission Electron Microscopy for Imaging of Biological Molecules
Transmission Electron Microscopy for Imaging of Biological Molecules Customer Case The customer is improving their customized Transmission Electron Microscope (TEM) that is optimized for imaging unstained biological molecules with minimal radiation damage. Diffraction-limited resolution of 0.25 nm is routinely obtained with a cold field-emission electron-gun operating at 40 keV. The sample is maintained at about 123 K (i.e. -150°C), both to eliminate contamination and to reduce mass-loss. The scan raster is 512 x 512 points with a dwell time of 30 microseconds per pixel (over 8.5 seconds per raster-scan). For most mass measurements, the pixels are separated by 1 [...]
Advantages of Measuring Semiconductor Thin Film Thickness with Capacitance GalleryAdvantages of Measuring Semiconductor Thin Film Thickness with Capacitance
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Electronics, Industry-Manufacturing, Industry-R&D, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Products-MTI-Capacitance, Products-MTI-Laser/Fiber Optic, Products-MTI-Semiconductor/Metrology, Z-REPUB, z1
Advantages of Measuring Semiconductor Thin Film Thickness with Capacitance
Thin Film Thickness Measurement Using Capacitance in the Semiconductor Industry In the semiconductor industry, the precise measurement of thin film thickness is crucial for ensuring the quality and functionality of wafer coatings. Thin films are deposited onto silicon and other wafer materials one atomic layer at a time, and the thickness of these coatings significantly impacts the wafer’s electrical, optical, and mechanical properties. Thin film thickness measurement is particularly important for semiconductor wafers, which may have either conductive metallic films or non-conductive metal oxide films deposited onto them. Common deposition methods include chemical vapor deposition (CVD) and physical vapor [...]
Treadmill Power Glitch Monitoring
Treadmill Power Glitch Monitoring Customer Case A customer develops gym equipment such as treadmills. The requirement is for an inexpensive way to monitor voltage signals for long periods of time. The treadmills are controlled by microprocessors that drive the LED displays. The customer has observed that some units intermittently fail during testing, a condition known as a "glitch" or a "brown-out". A glitch can have many causes, one of which is a weak power supply. The customer needs to capture certain key signals when a glitch occurs. At that stage, based on the captured data, it can be determined [...]
Capacitive Displacement Sensors: Working Principle & Precision Measurement Applications
Capacitive Displacement Sensors: Working Principle & Precision Measurement Applications Capacitive displacement sensors are precision non-contact measurement devices that utilize capacitance changes to determine position, distance, and thickness with exceptional accuracy. These capacitive distance sensors offer superior performance in applications requiring high-resolution measurements, making them essential tools across manufacturing, automation, and research industries. How Capacitive Displacement Sensors Work Capacitive Sensor Working Principle Capacitive displacement sensors operate on the fundamental principle of measuring capacitance variations between two conductive surfaces. The sensor probe acts as one plate of a parallel plate capacitor, while the [...]
How Often Should Vibration Analysis Be Performed?
How Often Should Vibration Analysis Be Performed? Once a customer takes delivery of a PBS system and learns how to use it, the next logical question is: “How often should we use it?” At a minimum, your approved maintenance program (whether it’s a program developed by your operation, or the maintenance procedures outlined by the engine/airframe manufacturer) will tell you about the intervals at which to perform a vibration analysis. Usually, there is a procedure to specify how an engine vibration analysis and balance need be only completed when squawked by a pilot or after the completion of maintenance [...]
Contact vs. Non-Contact Measurement and Linear Displacement Sensors GalleryContact vs. Non-Contact Measurement and Linear Displacement Sensors
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Products-MTI-Capacitance, Z-REPUB, z1, ZOK
Contact vs. Non-Contact Measurement and Linear Displacement Sensors
Contact vs. Non-Contact Measurements Choosing between a contact measurement system and a non-contact measurement system requires careful evaluation of your application’s performance needs, material properties, environmental conditions, and measurement goals. Each system type offers unique advantages- and understanding these distinctions can help you make a more informed decision. Let's explores how contact and non-contact measurement techniques work, their strengths and limitations, and where they’re best applied. What Are Contact Measurement Systems? Contact measurement systems involve tools and sensors that physically touch the object to determine various physical characteristics. These systems are widely used in dimensional metrology, offering high precision, [...]
Capacitance Sensors vs. Eddy Current Sensors Application Note
Capacitance Sensors vs. Eddy Current Sensors Application Note Capacitance sensors and Eddy current sensors are both used for non-contact measurements. Capacitive probes use electric fields to measure the distance from the sensor face to the surface of a target that is typically conductive and grounded. Eddy current probes use an alternating AC current to induce a magnetic field in a conductive target instead. In turn, the induced magnetic field produces a back magnetic field that is proportional to the gap between the probe face and the target. In a recent application note, MTI Instruments examines the differences between capacitance [...]
White Paper: Hipot Testing of Military/Aerospace Interconnect Components
Introduction Operational performance and safety are paramount concerns when determining the acceptability of a range of interconnection products in military and aerospace applications. Connectors and relays, wires, wire bundled into cables and harnesses, all must be tested against stringent standards. The number and range of these standards is mind-numbing — and this paper makes no attempt to catalog them all. Rather, notable and salient MIL standards and similar aerospace standards will be used to site the key role that high-performance electrical safety testers, ancillary equipment and software play in effecting reliable and cost-effective compliance testing of components as [...]
Using Capacitance Sensors for Non-Conductive Material Measurement GalleryUsing Capacitance Sensors for Non-Conductive Material Measurement
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Sensors, News-MTI, News-MTI-Instrumentation, Products-MTI-Capacitance, Z-REPUB, z1
Using Capacitance Sensors for Non-Conductive Material Measurement
Non-Conductive Material Measurement with Capacitance Sensors Capacitance sensors are non-contact devices that can be used to obtain position, thickness, and dynamic measurements with a high degree of precision, accuracy, and resolution. Capacitive measurement is used with electrically-conductive materials such as metals but can also be used to measure non-conductive materials such as glass, sapphire, and many plastics. Even if a non-conductive material is relatively inexpensive (such as closed cell foam), manufacturers want to avoid errors that can result in significant waste across high volumes. Importantly, capacitance measurement is also used with semi-insulating materials such as gallium arsenide (GaAs) and [...]