Vitrek Press Release: GaGe Adds New 16-Bit/14-Bit Resolution 2-Channel Models to its Razor Series of High-Speed PCIe Digitizers
GaGe Adds New 16-Bit/14-Bit Resolution 2-Channel Models to its Razor Series of High-Speed PCIe Digitizers Boasting Industry’s Best ENOB New RazorEdge Express 16-bit/14-bit digitizers support A/D sampling rates up to 250 MS/s, while new 14-bit resolution model option is added to existing 16-bit RazorPlus Express with 500 MS/s sampling rate; pricing reduced on 16-bit 500 MS/s RazorPlus/RazorMax Express models; providing best price/performance options aligning with user requirements Lockport, IL—September 6, 2023— GaGe by Vitrek, a US-based manufacturer of high-speed data acquisition and signal recording systems, announces two new versions of its popular Razor Series line of dual-channel (2-CH) [...]
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity GalleryWhitepaper: Semiconductor Wafer Measurement for Increased Productivity
Brand-GaGe, Brand-MTI, Brand-Vitrek, Brands-All, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-OEM, Industry-Semiconductor, Industry-Semiconductor-MTI, Knowledge Center-MTI, News-Industry, News-MTI, Whitepapers-MTI
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity
Semiconductor Wafer Measurement for Increased Productivity This three-part article describes how manufacturers leverage capacitance-based inspection systems for semiconductor wafers. The article reviews best-practices, consequences of failing to inspect semiconductor wafers and benefits of using semi-automated, fully-automated and manual systems for wafer metrology and inspection. Part 1: Why Disc Geometry Matters in Wafer Production Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec [...]
The Cost of Failing to Inspect Semiconductor Wafers
This is the second of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Most semiconductor wafers are made of silicon, the second most common element in the Earth’s crust. Yet, silicon’s abundance does not mean that wafers are inexpensive. The pure form of silicon that’s used in semiconductors does not occur naturally and must be refined and mixed with a dopant that alters material properties and electrical characteristics. Silicon ingots are formed, wafers [...]
Press Release: New Vitrek Website Presents Comprehensive Details of Company’s Test & Measurement Product Portfolio
New Vitrek Website Presents Comprehensive Details of Company’s Test & Measurement Product Portfolio Interactive menus provide easy access to products by type and application: test & measurement instruments, high-speed data acquisition & signal recording, metrology, signal simulation, and jet engine vibration testing systems. Poway, CA—August 10, 2023—Vitrek, a major manufacturer of precision electrical safety testing equipment, high-speed data acquisition and signal recording, and advanced metrology and simulation instruments and systems, announces the launch of its fully redesigned and expanded website. The new website at vitrek.com provides easy navigation of the company’s extensive product portfolio. Its intuitive menu [...]
Cable & Wire Troubleshooting Made Easy-Using the MTI 1510 Precision Signal Generator
Cable & Wire Troubleshooting Made Easy Using MTI Instruments 1510A Precision Signal/Function Generator Cable & Wire troubleshooting is important to identify and resolve problems with electrical or data transmission systems. Without proper troubleshooting, systems can fail, causing a range of issues including downtime, lost productivity and safety hazards. MTI Instruments 1510A is ideal for troubleshooting in the instrumentation room, factory floor, flight-line or laboratory. 1510A Key Benefits The 1510A is a portable signal source used for calibrating electronic equipment and machinery monitoring systems. Its portability and ruggedness make it ideal for use in the instrumentation room, [...]
led substrate sapphire thickness
N/A led substrate sapphire thickness Displacement Remember that old acronym, GIGO? Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be of a certain quality to ensure maximum yield. EXCESSIVE TTV, BOW, AND WARP LEAD TO PREMATURE LED FAILURE LED MANUFACTURERS NEED TO INSPECT INCOMING WAFERS. WAFER PRODUCERS ALSO NEED TO CHECK AND CONTROL TTV, BOW AND WARP. The market for sapphire wafers, driven by the growth in LED manufacturing, is booming. While the price has come down significantly since 2011, the size of the wafers [...]
Dynamic Measurement of Armature Gaps
Introduction In large motors and generators, the air gap needed to separate the revolving rotor from the stator should be as small as possible. This reduces the magnetizing power requirement which needs to be large enough to prevent contact between the two, despite manufacturing tolerances on their dimensions or movement resulting from mechanical deflection or looseness in supporting bearings. The gap should also be uniform; a non-uniform gap causes increased noise and vibration. Since large generators and motors are usually quite expensive, it's advisable to monitor the gap to prevent catastrophic failure should the rotor or stator expand due to [...]
Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution
Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution Animation showing a system setup used to measure the thickness of thin conductive films such as electric vehicle (EV) battery electrodes. Description Learn how to measure EV battery plate thickness with MTI's Digital Accumeasure, a high-precision capacitance measurement system with nanometer accuracy and stability. Problem Lithium battery plates for electric vehicles consist of lithium ion compounds applied to either a copper plate substrate (cathode plate) or an aluminum substrate (anode plate). The plates are approximately 100-200 um thick ( .004 [...]
Vibration and Balancing Systems: The Spectrum Plot
Vibration and Balancing Systems: The Spectrum Plot Aviation / Aerospace Engine Balancing Vibration Description The Spectrum Plot: Types of Aircraft Vibration One of the least understood features of the PBS series of vibration analyzers is the spectrum function. The spectrum functionality is a more difficult function to understand, but once mastered, technicians can quickly develop an extremely in-depth understanding on what is going on in an engine during a test. Figure 1, below, shows a basic spectrum from the PBS system. On the x-axis is frequency, measured in Hz (per second). [...]
Thickness Information of Composite Materials
Thickness Information of Composite Materials Industrial Thickness Information Of Composite Materials Thickness Description Introduction: Composite materials consist of two or more materials which include a substrate or base material such as paper, cotton cloth, or glass cloth along with a resin or adhesive such as epoxy, melamine, or silicone. To make a thermoset laminate, the base material is coated with the adhesive so that layers of material can be pressed under heat and pressure into sheet form. The Problem: Composite material thickness needed to be verified prior to forming or [...]