Capacitance Sensors Facilitate 3D IC Construction
Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting the Z-axis avoids the power and footprint penalties associated with two-dimensional processes. Implementing the rationale, however, is not so simple. Going vertical requires coplanar surfaces to make contact with all pins, pads, and pillars. Problem Typically, manufacturers measure the angle and gap between two planes [...]
Measuring Piezoelectric Properties with Fiber Optics
Measuring Piezoelectric Properties with Fiber Optics Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description Figure 4: Fiber Optic MTI 2100 Fotonic Sensor Introduction Researchers from the University of Arizona used the MTI-2000 Fotonic Sensor to measure the indirect piezoelectric properties (d33) and strain of bulk ferroelectric and thin film samples. The team then correlated these results with data acquired from direct piezoelectric effect measurement. By comparing data sets, the researchers concluded that the MTI-2000 provides a useful optical technique for measuring the d33 [...]
Interfacing MTI’s Digital Accumeasure to Measurement Computing’s DASYLab with Modbus
Interfacing MTI's Digital Accumeasure to Measurement Computing's DASYLab with Modbus Interfacing MTI's Digital Accumeasure to Measurement Computing's DASYLab with Modbus Displacement Description Laptop running MC DASYLab1 © and MTI Digital Capacitance sensor over Modbus TCP/IP Measurement Computing's DASYLab data acquisition software is easy to use and allows measuring with multiple system sensors (analog and digital). You can plot the results of multiple sensors versus time or encoder position and store the data with DASYLab. This application note describes how to interface MTI's Digital Capacitance Sensor over Ethernet TCP/IP. The DASYLab Modbus [...]
Dynamic Measurement of Small Oscillatory Motions
Dynamic Measurement of Small Oscillatory Motions Research & Development Piezoelectric Stack Motion Fotonic Systems Displacement Description This application note describes the measurement of a very small oscillatory motions (nanometers) produced by a piezo electric device with the MTI-2100 and the MTI-2032RX high-resolution module. Fotonic™ sensors from MTI Instruments are ideal for making dynamic measurements of very small oscillatory motions. Using the MTI-2100 Fotonic Sensor with a spectrum analyzer, angstrom level measurements are possible. Would you like to know more? Okay, let's set up some basic equipment and get started. Piezo [...]
MTI’s Accumeasure HD Amplifier vs. SmarAct’s PicoScale Interferometer GalleryMTI’s Accumeasure HD Amplifier vs. SmarAct’s PicoScale Interferometer
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MTI’s Accumeasure HD Amplifier vs. SmarAct’s PicoScale Interferometer
MTI's Accumeasure HD Amplifier vs. SmarAct's PicoScale Interferometer Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description This application note compares MTI's Accumeasure HD amplifier to SmarAct's Picoscale interferometer in terms of resolution and accuracy for very small displacement measurements. Specifically, this comparison focuses on minimum expected resolution and the effects of noise on accuracy. High resolution interferometers are widely regarded as the instrument of choice for the type of measurements described in this application note, but MTI's technology provides exceptional accuracy and stability. Moreover, the [...]
Testing for Connector Failure Due to Vibration or Shock
Testing for Connector Failure Due to Vibration or Shock Mobile Communications Equipment Needs Reliable Connectors That Will Not Disconnect with Shock or Vibration Introduction A large multinational company approached MTI to provide a sensor capable of measuring displacement that also wouldn’t load the target (connector). Shock and vibration testing would span 2-15G and the target connectors were very small. Application MTI’s 2100 optical displacement sensor system is ideal for this kind of application because very small probes can be used and they measure displacement via reflected light. Of course, reflected light does [...]
Wafer Characterization
Semiconductor Wafer Characterization Surface Overview Wafer characterization is a critical part of quality control and process optimization in the semiconductor and solar industries. Accurate characterization ensures wafers meet mechanical and dimensional standards such as thickness, bow, and warp — all essential to downstream device performance and yield. Description Thickness Measurement ASTM F657: The distance through a wafer between corresponding points on the front and back surface. Thickness is expressed in microns or mils (thousandths of an inch). Total Thickness Variation (TTV) ASTM F657: The difference between the maximum and minimum values of thickness [...]
In-Situ Particle Detection
In-Situ Particle Detection Research & Development In-Situ Particle Detection Presence/Absence Description Introduction:  Foreign particles in food stuffs, plant produce, grains, etc. can lead to customer dissatisfaction when the items are packaged for sale. In some cases — it can be dangerous. Opportunity:  A major cigarette producer contacted MTI Instruments requesting a system to detect extraneous material, metal, plastic, filter fiber, and other contaminants. Background:  A cigarette’s dielectric footprint is controlled by the tobacco packing density, moisture content and the type of tobacco leaf. - packing density is controlled by the [...]
Piezoelectric Device Amplitude
Piezoelectric Device Amplitude Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description Measuring Piezoelectric device amplitude including piezoceramic, 1-3 PZT/polymer composite and PVDF film A “PZT ” is a piezoelectric device which generates motion when a voltage is applied across the crystal. The motion can be anywhere from DC to ultrasonic and the motion is typically very small. PZT devices are used to generate sound and to convert voltage to motion. MTI's MTI-2100 controller in conjunction with a High resolution fiber optic probe such as [...]
Piezoelectric Stack Motion
Piezoelectric Stack Motion Research & Development Piezoelectric Stack Motion Displacement Description Fotonic sensors are ideal for making dynamic measurement of very small oscillatory motions. Using the MTI-2100 with a spectrum analyzer, angstrom level measurements are possible. Would you like to know more? Okay let’s set up some basic equipment and get started. Piezoelectric crystals expand and contract when voltage is applied across the stack. By controlling the amplitude of the applied signal we control the magnitude of the displacement. The test setup A Spectrum Analyzer A Signal Generator to drive piezo device [...]