Vitrek featured in Bodo’s Power Systems
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Intra-Vascular Ultrasound
Intra-Vascular Ultrasound Customer Case The customer does intra-vascular diagnostic ultrasound. In this novel technique, an ultrasonic catheter is guided through a patient's blood vessel. Throughout its helical or corkscrew-like path, the ultrasonic transducer-tipped catheter emits bursts of ultrasonic energy. Reflections from the vessel wall return into the transducer and can be used to characterize such features as plaque deposits. The customer wishes to resolve features as small as 3 mm. The amount of time, D t, required for ultrasound to reflect off an interface that is a distance x away and return to the transducer is: D t = [...]
White Paper: High Accuracy, High Voltage Measurement – April, 2019
Introduction One of the first principals learned as an engineering student is the “observer effect” which states that simply observing a situation or phenomenon necessarily changes that phenomenon. This is often the result of instruments that, by necessity, alter the state of what they measure in some manner. Accurate high-voltage measurement is a clear example of the validity of this theory. The accuracy of the resulting measurements is affected by three important elements: environmental factors, errors that are introduced by the measurement probe, and the intrinsic accuracy and performance of the measuring instrument. This article will address each of [...]
New Product Release: Vitrek’s 98i Series Teraohmmeter Meets Demands for Higher Voltage IR Testing
New Product Release: Vitrek’s 98xi Series Teraohmmeter Meets Demands for Higher Voltage IR Testing Meets requirements for emerging higher voltage electric vehicle battery system and solar array insulation resistance testing; offers unique combination of operational features; capacitive load capability facilitates solar system and cable harness testing […]
Proforma 300i SA Video Shows Semiconductor Metrology
MTI Instruments, a worldwide leader in precision measurement solutions, has released a YouTube video that shows how its Proforma™ 300i SA semi-automated measurement tool measures silicon carbide wafers for semiconductors. George Relan, MTI’s Global Director of Sales, demonstrates how the desktop metrology system provides non-contact full wafer scanning and 3D mapping of measurement features such as thickness and shape. MTI’s video also shows how the Proforma 300i SA interfaces with an external computer and provides powerful Windows-based software for analysis and reporting. By utilizing MTI push/pull technology, the Proforma 300i SA doesn’t require the semiconductor wafers to have a [...]
Capacitance Guide for Industrial Applications
Accumeasure Digital Capacitance System D Series Gen 3 View Product Capacitance Displacement and Gap Measurement Probes View Product Accumeasure Analog Capacitance System View Product Basic Principles of Capacitance Capacitance is defined as the ratio of the change in an electric charge to the corresponding change in its electrical potential (or voltage). Capacitors ; components designed to store electrical charge, consist of conductive parallel plates that are electrically separated by a dielectric material, such as air or an insulating layer. MTI’s technology is built on the principles of parallel plate capacitor measurement. A probe [...]
Product Education & Training
Education & Training Vibration Measurement & Engine Rotor Balancing High-Speed Data Acquisition Products for Streaming Applications Industry Application Webinars Test & Measurement Solutions for Semiconductor Manufacturers GaGe Digitizers in Ultrasonic Applications Electrical Safety & Compliance Testing for Printed Circuit Board Manufacturers Vitrek Products for Metrologists & Calibration Labs Vitrek Electrical Safety Testing for the Appliance & Consumer Product Industries Compliance Testing for the Lighting Industry Webinar Vitrek [...]




