Video: MTI Products for the Semiconductor Industry

Creating a Compensation File for a Recipe for the Proforma 300iSA – Video

Measuring Glass wafer thickness with a Proforma 300i

Measuring glass substrate thickness with a Proforma 300i Semiconductor Glass Wafer Thickness Measurement Thickness Applications testing of glass (substrate) thickness An applications experiment was made with the MTI Proforma 300i Semiconductor thickness system to determine if it’s useful to measure glass substrate thicknesses typically found as [...]

Proforma 300i SA Video Shows Semiconductor Metrology

MTI Instruments, a worldwide leader in precision measurement solutions, has released a YouTube video that shows how its Proforma™ 300i SA semi-automated measurement tool measures silicon carbide wafers for semiconductors. George Relan, MTI’s Global Director of Sales, demonstrates how the desktop metrology system provides non-contact full wafer scanning and 3D mapping of measurement features [...]


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