Nuclear Ion Testing
Nuclear Ion Testing Customer Case This customer is involved in nuclear ion testing. The pulse amplitudes of nuclear ions from a detector must be measured and sorted into a histogram, which will show the number of times a given amplitude was received. The customer wants a "multi-channel analyzer" capable of analyzing 4,000 to 8,000 "channels." In the customer's terminology, "channels" are actually histogram bins. The customer has pulses coming in at 20 - 30 ms minimum interval and needs to peak detect (calculate the maximum value of the pulse). Then, based on peak height, each is stored in a [...]
Microsoft Windows 7 Security Advisory and Impact on MTI PBS-4100+ Users
Learn about this important security advisory and its impact on MTI-PBS-4100+ users. What is the Microsoft Windows 7 Security Advisory? Microsoft will no longer provide maintenance on Windows Version 7 in January of this year after 10-years of supporting the product. Microsoft does this across their product lines (not just Windows) in order to continue to evolve their products and invest their resources on the more recent versions. This means that Microsoft will no longer release any updates for that version of Windows, including bug fixes or security updates. For details on this activity by Microsoft, please visit their [...]
Alpha Particle Counting
Alpha Particle Counting Customer Case A customer has to characterize a new design for a solid state alpha particle detector. The detector is essentially a silicon diode with a large area face. Because alpha particles, which are high-speed helium nuclei, are electrically charged, they interact strongly with matter and lose their energy quickly upon entering a solid. When an alpha particle decelerates within the depletion region of the diode, it creates electron-hole pairs. The carriers are collected by the diode's electrodes and create a measurable current pulse. The customer's experimental solid state detector has two implanted electrodes whose signals [...]
Trends in High Resolution Sensors for Semiconductor Metrology and Inspection
High resolution sensors are supporting improvements in semiconductor metrology and inspection at vital points in the production process. Because the fabrication of semiconductor wafers may require hundreds of steps and weeks of manufacturing time, early-stage defects that go undetected can have costly downstream consequences. Plus, because semiconductor processing always requires a high degree of precision, advances in fabrication methods seem to require ever-finer measurements in a never-ending quest. Today’s metrology instruments are incorporating high resolution sensors for automated wafer inspection. Resolution, the smallest measurement that a sensor can reliably indicate, may be given in dimensional units such as nanometers [...]
Vitrek to Launch New DL Series of DC Loads
This month, Vitrek introduced a new product to our ever-expanding catalog of high-voltage testing and measurement equipment. Our latest product, the DL Series Electronic DC Load, is intended to improve testing for a series of power supplies, testers, and drivers. The new device is designed to be accurate, flexible, and easy-to-use, rivaling all other similar DC loads on the market with superior performance and results. […]
Laser Spectroscopy
Laser Spectroscopy Customer Case An academic researcher is studying the attenuation properties of different materials inside Laser cavities for applications in Laser Spectroscopy. The Laser pulses are generated by one Laser, and are then transmitted by mirrors into another cavity filled with gaseous material. In the second cavity, the light pulses are continuously reflected by opposite mirrors and their intensities are measured by a transducer which converts them into decaying pulses of 30 nanosecond width. The decay takes about 40 microseconds to settle. The researcher is required to capture the decaying pulses and save the captured data onto the [...]
Laser Transient Absorption Spectroscopy
Laser Transient Absorption Spectroscopy Customer Case The customer's setup is a scientific application in which transient signals from a Laser Absorption Spectroscope are transferred to a computer. The laser power is modified in steps and the process is repeated. The measurement sensitivity is limited by noise generated by the current digitizer. The customer wants to capture and continuously average very small pulse responses. The lowest signal pulse height is 0.5 milliVolts and can range up to 2 mV. The duration of each response pulse is 1 to 10 microseconds. The Pulse Repetition Frequency (PRF) is 10 Hz. The customer's [...]
Press Release: Vitrek Launches New Electrical Safety and Test Equipment Catalog
Vitrek Launches New Electrical Safety and Test Equipment Catalog Vitrek’s new product catalog features sales, application and technical information for the company’s extensive line of electrical safety and test equipment. […]
Fiber Optic Sensor Measures Very Small Movements in Piezo Stacks
MTI Instruments, a global supplier of precision measurement solutions, has released an application note that explains how to measure very small movements in piezo devices that convert mechanical energy into electrical energy. Precision measurement of these dynamic, oscillatory motions is required for the research and development (R&D), testing, and troubleshooting of piezo ceramic materials, advanced ceramics that are used in actuators, sensors, and the power modules of ultrasonic welders. Piezo applications range from automotive sensors and medical devices to engineering projects and consumer products. MTI’s App Note explains how its MTI-2100 Fotonic sensor, when used in conjunction with a [...]
Join Vitrek at Booth #3478 at the ATX Trade Show!
We are incredibly excited to announce that Vitrek will be attending the ATX West Expo in Anaheim, California! The nation’s largest annual automation technology event is going to be taking place from February 11th-13th at the Anaheim Convention Center. Be sure to stop by and visit us at booth #3478 to network with our team about how our selection of high-voltage test and measurement equipment can help your operations. […]


