Using Capacitance Sensors for Non-Conductive Material Measurement GalleryUsing Capacitance Sensors for Non-Conductive Material Measurement
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Using Capacitance Sensors for Non-Conductive Material Measurement
Non-Conductive Material Measurement with Capacitance Sensors Capacitance sensors are non-contact devices that can be used to obtain position, thickness, and dynamic measurements with a high degree of precision, accuracy, and resolution. Capacitive measurement is used with electrically-conductive materials such as metals but can also be used to measure non-conductive materials such as glass, sapphire, and many plastics. Even if a non-conductive material is relatively inexpensive (such as closed cell foam), manufacturers want to avoid errors that can result in significant waste across high volumes. Importantly, capacitance measurement is also used with semi-insulating materials such as gallium arsenide (GaAs) and [...]
Laser Transient Absorption Spectroscopy
Laser Transient Absorption Spectroscopy Customer Case The customer's setup is a scientific application in which transient signals from a Laser Absorption Spectroscope are transferred to a computer. The laser power is modified in steps and the process is repeated. The measurement sensitivity is limited by noise generated by the current digitizer. The customer wants to capture and continuously average very small pulse responses. The lowest signal pulse height is 0.5 milliVolts and can range up to 2 mV. The duration of each response pulse is 1 to 10 microseconds. The Pulse Repetition Frequency (PRF) is 10 Hz. The customer's [...]
Why Demand for SiC Wafers is Soaring and Durable GalleryWhy Demand for SiC Wafers is Soaring and Durable
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Why Demand for SiC Wafers is Soaring and Durable
Silicon carbide (SiC) wafers are in high demand, particularly in high-temperature applications. Silicon carbide (SiC), a semiconductor material made of both silicon and carbon, can withstand extreme temperatures of up to 2700°C. Often referred to as carborundum, SiC’s unique properties also make it a key material in non-electronic applications such as bulletproof vests, extrusion dies, sandpaper, and high-performance disc brakes. In the electronics industry, SiC wafers are crucial for devices operating under high temperatures, high voltages, or both. For example, they are used in electric vehicle (EV) power electronics, 5G communication systems, and LED technology, making SiC a material [...]
Wafer Stress Analysis Using the 300iSA
Wafer Stress Analysis Using MTI Instruments Proforma 300iSA Wafer processing involves several stages that can lead to mechanical changes in the wafer structure. These changes, or stresses, may result in deformities, making the wafer either unusable or only marginally usable. To evaluate these stresses and determine the wafer's quality, wafer stress measurement is essential. The Proforma 300iSA wafer characterization tool offers a powerful solution for wafer stress analysis. It allows for the analysis of a wafer both before and after processing. By comparing these two states, the Proforma 300iSA effectively evaluates the wafer's stress levels and mechanical alterations, providing [...]
Laser Measurement & Characterization of Flat Panel Displays
Laser Measurement & Characterization of Flat Panel Displays Customer Case This customer's application involves the characterization of flat panel displays (used in laptop computers, computer game displays, etc.) via laser scanning. The laser is bounced off a number of mirrors and then through lenses, from which it is scattered. The scattered laser light must then be analyzed in order to determine the quality of the flat panel display. This laser measurement system is used not only by flat panel display industries, but also by disk drive manufacturers to analyze platter quality and, in the near future, for characterizing silicon [...]
Laser Signals Striking Silicon-Diode Target
Laser Signals Striking Silicon-Diode Target Customer Case The customer wants to capture the output of some silicon diodes looking at a laser target. The typical signal is anywhere from 20mv to 1V in amplitude and 0 to 15ns in length. There are up to 16 of these diodes that are looking at the same target. Each diode has a different filter so the post-trigger depth and amplitude-scale must be user-adjustable. Their main interest is to sample and digitize the signals for archiving, with later retrieval and plotting. Fancy software is not needed for display as the data is gathered [...]
Weathering the storm: Keys to resiliency in MRO
Weathering the storm: Keys to resiliency in MRO By Ken Ameika It’s no secret that COVID-19 has adversely affected the airline industry, and consequently the MRO and test cell markets. But the impacts are nuanced. Commercial aircraft utilization is way down; meanwhile, freight carrier business is expanding markedly. Operators are spending less; but they still have needs, which often require quick turnaround. It’s been hard for many. But there’s good news: COVID provided lessons that we can all use to make our businesses, or our careers, more resilient to the next major disruption. Diversify Your Business Commercial passenger traffic—or [...]
Optical Scanning of Drive Media
Optical Scanning of Drive Media Customer Case The customer's application is optical scanning for drive testing. The goal is to identify burnt or damaged spots on the disk. The scanning system is generally used in Quality Control, Head-Disk Interaction and Failure Analysis. There is a need for continuous acquisition during the spiral scan. The speed of the disk is 10,000 RPM and the requirement is to capture 65,000 to 80,000 samples each revolution. A single channel is needed for the acquisition at 10 MegaSamples/second or greater. High vertical resolution will aid in measuring the properties and ultimately the degradation [...]
Disk Drive Track Scanning
Disk Drive Track Scanning Customer Case The customer is trying to digitize an 83 millisecond long signal coming out of a disk mounted on a rotary motor. This corresponds to one full revolution of the disk. The analog signal coming out of the Device Under Test (DUT) is of approximately 2 MHz bandwidth. Currently, the customer is sampling at 10 MSPS and would like to increase the oversampling to get better time resolution. At present, they are using a CompuScope 225 - 1M, which has sufficient memory to digitize the entire revolution in on-board memory at the 10 MSPS [...]
MEMS-Based High Throughput Screening
MEMS-Based High Throughput Screening Customer Case The customer needs to do frequency analysis to determine the resonant frequency of an oscillating micro-fabricated device. They will use a Laser Doppler Vibrometer to monitor the physical oscillation. This is an instrument that looks at the light reflected from the surface of a moving part to determine the velocity or relative position of the part. Analysis of the motion as a function of the driving frequency determines the resonant frequency. Upon excitation at the resonant frequency, the motion is at its maximum. The expected resonant frequencies are on the order of 1 [...]