Optical Spectroscopy
Optical Spectroscopy Customer Case A customer who is completing his doctorate in Chemistry at the California Institute of Technology has identified the need to measure fast optical signals using fast photo-detectors. The signal pulse width is as short as 2ns. Signals will be acquired at a 1KHz repetition rate, with a record length of 1,000 to 10,000 data points. GaGe Case Solution The CompuScope 82G, an 8-bit, 2GS/s A/D and Scope card for PCI Bus, is the best solution for this customer. With relatively small record sets, the customer is able to keep up with the 1KHz Pulse Repeat [...]
Transducer Selection for High Resolution Applications GalleryTransducer Selection for High Resolution Applications
Application Notes-MTI, Brand-MTI, News-MTI-Instrumentation, News-MTI-Metrology, News-Product Updates, News-Products, Products-MTI-Capacitance, Products-MTI-Laser/Fiber Optic, Products-MTI-Semiconductor/Metrology, Products-MTI-Signal Generators, Z-REPUB, z1
Transducer Selection for High Resolution Applications
High resolution applications do not always require an interferometer. If you want to make accurate measurements in the micron to picometer range, then an MTI Digital Accumeasure D100 HD or D200 system may be what you need. Laser interferometers can sell for more than $15,000 and be difficult to setup. For example, you may have to buy additional optics to guarantee a good return signal since the laser beam must reflect off a mirror surface or precision retro reflector in order for the beam to re-enter the interferometer’s optics at less than a degree of reflection angle. The downsides [...]
Kinetics of Protein Dynamics
Kinetics of Preotein Dynamics Customer Case The customer is measuring kinetics of protein dynamics with a time scale of between a few nanoseconds and about a hundred milliseconds. The customer's two response signals occur after a few-nanosecond-pulse excitation that repeats at a rate of 1-10Hz. This requires a bandwidth from DC to a few hundred MHz, sampling speed of about 1-2GS/s, and processing time for one acquisition that is less than 1-0.1secs. An analog signal of about 10-30mV comes from a Photo-Multiplier Tube (PMT) or a photo-diode with a trans-impedance pre-amplifier. The customer is currently using a couple of [...]
Radioactive Nuclear-Decay Detection
Radioactive Nuclear-Decay Detection Customer Case The customer has a requirement for PC-based waveform digitizer cards to digitize shaped pulses derived from nuclear-decay detectors. These pulses vary in their rate (frequency of occurrence) and amplitude. Their shape is approximately Gaussian with a full-width at half the maximum amplitude (FWHM) of 3-5 microseconds. The characterization of each pulse is critical for the accurate and precise determination of the activity of radioactive materials. These materials have very low count-rates (0.02 pulses per minute) to relatively high count-rates (>1000 pulses per minute). Important to the measurement process are the speed and reliability of [...]
High Resolution Semiconductor Wafer Measurements at Lower Costs GalleryHigh Resolution Semiconductor Wafer Measurements at Lower Costs
Application Notes-MTI, Brand-MTI, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, Products-MTI-Capacitance, Products-MTI-Semiconductor/Metrology, Z-REPUB, z1
High Resolution Semiconductor Wafer Measurements at Lower Costs
MTI's Proforma technology characterizes semiconductor wafers in terms of bow and warp, thickness, total thickness variation (TTV) and center thickness. Until recently, semiconductor wafer measurements at resolutions less than 100 µm were cost-prohibitive. Moreover, only expensive devices such as interferometers were capable of these measurements. Today, the semiconductor industry can use capacitance gauges instead of laser interferometers to achieve high resolution at fraction of the cost. Much like affordable CCD cameras transformed and expanded the market for video, cost-effective capacitance is disrupting the semiconductor wafer measurement market and creating new opportunities for quality testing and validation. The [...]
Measure Wafer Bow, Warp and TTV with Capacitance GalleryMeasure Wafer Bow, Warp and TTV with Capacitance
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Measure Wafer Bow, Warp and TTV with Capacitance
The flatness of silicon wafers used to manufacture integrated circuits is controlled to tight tolerances to help ensure that the whole wafer is sufficiently flat for lithographic processing. To ensure your wafer manufacturing process is within tolerance, you need to measure the wafers being produced. Various measurement techniques exist to verify process tolerances and eliminate expensive scrap wafers. Non-contact capacitive sensing is a highly precise and cost-effective means to measure wafer flatness, bow, warp, and total thickness variation (TTV). MTI Instruments’ Proforma 300i and 300iSA systems use capacitance sensors to improve yields while reducing costs through better dimensional control of [...]
Neutrino Detection System
Neutrino Detection System Customer Case Neutrinos are tiny (possibly massless) neutral elementary particles which interact with matter via the weak nuclear force. The weakness of the weak force gives neutrinos the property that matter is almost transparent to them. The sun, and all other stars, produce neutrinos copiously due to nuclear fusion and decay processes within the core. Since they rarely interact, these neutrinos pass through the sun and the earth (and you) unhindered. Other sources of neutrinos include exploding stars (supernovae), relic neutrinos (from the birth of the universe) and nuclear power plants (in fact a lot of [...]
Nuclear Particle Location
Nuclear Particle Location Customer Case The customer studies nuclear particles traveling in an electrically charged medium. The particles emit two types of short 53 MHz signal bursts. The first type lasts for 1.6 ms, the second type lasts for 6 ms. The customer had to capture these bursts in at least two locations and analyze their amplitudes in order to determine the position and some of the characteristics of the nuclear particles. The application requires two channels of capture at speeds of at least 500 MS/s. The depth of capture at 1 GS/s is 6,000 samples for the 6 [...]
How to Measure Dielectric Separator Thickness in EV Batteries GalleryHow to Measure Dielectric Separator Thickness in EV Batteries
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How to Measure Dielectric Separator Thickness in EV Batteries
The International Energy Agency predicts that as many as 125 million electric vehicles (EVs) will be on the road by 2030. At the heart of these electric cars, trucks, and buses is the lithium-ion (Li-ion) battery, a type of rechargeable battery with high energy density and low self-discharge. The plates in Li-ion batteries consist of lithium compounds that are applied to either a copper plate substrate (cathode) or an aluminum substrate (anode). In turn, these two plates are separated by a dielectric separator. All of the layers in an EV battery are extremely thin. In fact, the cathode and [...]
Ozone Profiling Lidar System
Ozone Profiling Lidar System Customer Case The customer is designing an ozone-profiling lidar system for measuring the concentration of ozone from ground level up to about 4 kilometer (km) altitude. The system operates in the ultraviolet range and uses multiple receiver telescopes to cover the range. The dynamic range of the signal is enormous, so small aperture telescopes are used to collect backscattered light from low altitudes and large ones are used to collect backscattered light from high altitudes. The customer is operating simultaneously at three laser wavelengths, and the current design requires a total of nine photodetectors (three [...]