Automotive Engine Controller Monitoring
Automotive Engine Controller Monitoring Customer Case The customer is a major electronics manufacturer who wants to find a cost effective replacement to VXI digitizers in testing automotive engine control signals. The requirement is for several ATE stations. Each one will require 4 single-ended channels or 2 "true differential" channels, 4 MHz of input analog bandwidth (mostly single shot) with voltage ranges from 0.05 to 70 volts. The digitizers must have at least 12 bits of vertical resolution, 0.5% accuracy and ½ MegaSample per channel of acquisition memory. The customer would like to operate the station under a controlling LabVIEW [...]
GaGe White Paper: ENOB: The Best Digitizer Performance Metric
Introduction Figure 1. GaGe High-Speed Digitizers including PC Oscilloscope Software, powerful SDKs for custom application development and turnkey integrated PC-based measurement systems. While the nominal vertical resolution of a high-speed waveform digitizer (specified in bits) is often promoted, its true performance is provided by its measured Dynamic Parameters and in particular by its Effective Number of Bits (ENOB). This article describes measurement of the Dynamic Parameters and presents measurements for a leading-edge GaGe 12-bit Digitizer. A widely used digitizer-like device, the Digital Storage Oscilloscope (DSO), is optimized for the visualization of unknown signals. The relatively [...]
Fiber Optic Automated Measurement System
Fiber Optic Automated Measurement System Customer Case The customer is in the business of developing lasers and LED components for fiber optic data \ telecommunications applications. The requirement is for an automated test system to monitor the pulse characteristics of the laser. The customer will require 3 channels at high vertical resolution due to the fact that some variances in amplitude will be only 1 mV and need to be detected. The goal is to capture 10,000 samples per channel at 50 MegaSamples per second with a 1 KHz to 5 KHz Pulse Repeat Frequency (PRF). The customer would [...]
Non-Contact Displacement Sensors for Detection and Measurement
Non-contact displacement sensors are designed to detect or measure physical properties such as linear displacement, thickness, proximity, and distance without physically touching the target. By emitting various forms of energy, such as capacitance, fiber optic, or laser triangulation, these sensors capture highly accurate readings without physically touching the object. This contrasts with traditional contact sensors, which rely on direct mechanical contact to gauge displacement or other physical properties. Benefits of Non-Contact vs. Contact Displacement Sensors Compared to contact sensors, non-contact displacement sensors offer faster response times, higher sampling rates, and minimal interference with the object being measured. They are [...]
Google Scholar
Visit and View "GaGe Digitizer" on Google Scholar Visit and View "GaGe Applied Technologies" on Google Scholar Google Scholar is a dedicated search site for scholarly literature that includes academic research papers, technical articles, patents, and more. Use the above links to review results of all articles in which GaGe products and services have been cited for various applications in fields such as: Wideband Signal Analysis RADAR Design and Test Signals Intelligence (SIGINT) Ultrasonic Non-Destructive Testing (NDT) LIDAR Systems Communications Optical Coherence Tomography (OCT) Mass Spectroscopy Ultrasound Imaging Time of Flight (TOF) Life Sciences [...]
Advantages of Measuring Semiconductor Thin Film Thickness with Capacitance GalleryAdvantages of Measuring Semiconductor Thin Film Thickness with Capacitance
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Electronics, Industry-Manufacturing, Industry-R&D, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Products-MTI-Capacitance, Products-MTI-Laser/Fiber Optic, Products-MTI-Semiconductor/Metrology, Z-REPUB, z1
Advantages of Measuring Semiconductor Thin Film Thickness with Capacitance
Thin Film Thickness Measurement Using Capacitance in the Semiconductor Industry In the semiconductor industry, the precise measurement of thin film thickness is crucial for ensuring the quality and functionality of wafer coatings. Thin films are deposited onto silicon and other wafer materials one atomic layer at a time, and the thickness of these coatings significantly impacts the wafer’s electrical, optical, and mechanical properties. Thin film thickness measurement is particularly important for semiconductor wafers, which may have either conductive metallic films or non-conductive metal oxide films deposited onto them. Common deposition methods include chemical vapor deposition (CVD) and physical vapor [...]
How Often Should Vibration Analysis Be Performed?
How Often Should Vibration Analysis Be Performed? Once a customer takes delivery of a PBS system and learns how to use it, the next logical question is: “How often should we use it?” At a minimum, your approved maintenance program (whether it’s a program developed by your operation, or the maintenance procedures outlined by the engine/airframe manufacturer) will tell you about the intervals at which to perform a vibration analysis. Usually, there is a procedure to specify how an engine vibration analysis and balance need be only completed when squawked by a pilot or after the completion of maintenance [...]
Contact vs. Non-Contact Measurement and Linear Displacement Sensors GalleryContact vs. Non-Contact Measurement and Linear Displacement Sensors
Application Notes-MTI, Brand-MTI, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Products-MTI-Capacitance, Z-REPUB, z1, ZOK
Contact vs. Non-Contact Measurement and Linear Displacement Sensors
Contact vs. Non-Contact Measurements Choosing between a contact measurement system and a non-contact measurement system requires careful evaluation of your application’s performance needs, material properties, environmental conditions, and measurement goals. Each system type offers unique advantages- and understanding these distinctions can help you make a more informed decision. Let's explores how contact and non-contact measurement techniques work, their strengths and limitations, and where they’re best applied. What Are Contact Measurement Systems? Contact measurement systems involve tools and sensors that physically touch the object to determine various physical characteristics. These systems are widely used in dimensional metrology, offering high precision, [...]
Capacitance Sensors vs. Eddy Current Sensors Application Note
Capacitance Sensors vs. Eddy Current Sensors Application Note Capacitance sensors and Eddy current sensors are both used for non-contact measurements. Capacitive probes use electric fields to measure the distance from the sensor face to the surface of a target that is typically conductive and grounded. Eddy current probes use an alternating AC current to induce a magnetic field in a conductive target instead. In turn, the induced magnetic field produces a back magnetic field that is proportional to the gap between the probe face and the target. In a recent application note, MTI Instruments examines the differences between capacitance [...]
TESTING CHARGE AMPLIFIER GAIN AND FREQUENCY RESPONSE WITH A SIGNAL GENERATOR
[Application Note 40518] Piezoelectric transducers produce small electrical charges in response to pressure. Their sensitivity, ruggedness, and stability at high temperatures make them an essential building block of many accelerometers and pressure sensors. Applications include turbine vibration measurement (accelerometers) and combustion dynamics monitoring (pressure sensors). Typically, the high-impedance charge output produced by a piezoelectric transducer must be conditioned and amplified before transmission across system cabling to the data acquisition and measurement instrumentation. This conversion is accomplished with a device called a charge amplifier. Problem Over time, a charge amplifier’s signal response can drift. Damage to the charge amplifier or associated [...]