GAAS SUBSTRATE THICKNESS MEASUREMENT
Industry Semiconductor Applications Gaas Substrate Thickness Measurement Measurement Type Thickness Description Measuring Thickness of Wafers with Different Chemistries Introduction: Silicon wafers are ordinarily highly conductive and easy to measure with standard capacitive displacement sensors (See MTI’s Proforma 300i). Measuring the thickness of GaAs wafers that have high bulk resistivity (>10k Ohm/cm) is a little more difficult because the wafers act as non-conductive insulators in a capacitive sensor’s measuring field. Fortunately, MTI has a solution to this problem. Solution: It’s possible to measure the thickness and TTV of high resistivity semiconducting wafers (like GaAs) using non-contact capacitive [...]
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12. GalleryCompliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12.
Application Notes-Vitrek, Brand-Vitrek, Industry-Automotive, Industry-Compliance Testing, Industry-Consumer Products, Industry-Energy, Industry-Manufacturing, Industry-Medical, Industry-Medical, Industry-OEM, Industry-R&D, Industry-Semiconductor, News-All Brands, Products-Vitrek-Power-Analyzer
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12.
Compliance Testing of Harmonic Current Emissions According to IEC61000-3-2 and IEC61000-3-12. Using the Vitrek PA900 Precision Harmonic Power Analyzer Introduction Compliance with electromagnetic compatibility (EMC) standards is mandatory for electrical and electronic equipment sold in many global markets. Among these, the IEC61000-3-2 and IEC61000-3-12 standards specify limits for harmonic current emissions of equipment connected to low-voltage public supply systems. These limits ensure that individual devices do not contribute excessively to harmonic distortion on the power grid, which can lead to overheating in transformers, nuisance tripping of breakers, and interference with other equipment. The Vitrek PA900 Precision Power [...]
Power Analyzers: The Backbone of Modern Electrical Engineering GalleryPower Analyzers: The Backbone of Modern Electrical Engineering
Brand-Vitrek, Industry-Automotive, Industry-Compliance Testing, Industry-Consumer Products, Industry-Energy, Industry-Manufacturing, Industry-Medical, Industry-Medical, Industry-OEM, Industry-R&D, Industry-Semiconductor, News-All Brands, Products-Vitrek-Power-Analyzer, Whitepapers-Vitrek
Power Analyzers: The Backbone of Modern Electrical Engineering
Introduction In the fast-paced world of electrical engineering, ensuring accurate power measurement is crucial for efficiency, reliability, and compliance. Power analyzers play a key role in industries ranging from renewable energy to semiconductor manufacturing, providing engineers with the insights needed to optimize performance and troubleshoot electrical systems. At the forefront of this technology is Vitrek, a leading provider of high-accuracy power analyzers designed for demanding applications. The Role of Power Analyzers in Engineering Power analyzers measure critical electrical parameters such as voltage, current, power factor, and harmonic distortion. Unlike basic meters, these advanced instruments offer high precision measurements over [...]
Did You Know? GaGe Digitizers in Particle Physics Applications
Introduction Discover the fascinating world of particle physics through our detailed document on scattering experiments. Learn how targets are hit by incident particles, leading to scattered particles and fragments that are studied using advanced particle detectors. Explore the roles of Photomultiplier Tubes (PMTs) and solid-state detectors in converting detected particles into electrical pulses, and understand how the Multi-Channel Analyzer (MCA) and RazorMax CompuScope perform Pulse Height Analysis (PHA) for more complex measurements. Particle Physics Experiments In a scattering experiment in nuclear or particle physics, a target is hit by incident particles, which are [...]
MTI Instruments Whitepaper: Capacitance Guide for Industrial Applications GalleryMTI Instruments Whitepaper: Capacitance Guide for Industrial Applications
Brand-MTI, Industry-Aerospace, Industry-Automotive, Industry-Battery, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Energy, Industry-Government/Military, Industry-Industrial Processing, Industry-Lighting, Industry-Manufacturing, Industry-Measurement Applications, Industry-OEM, Industry-R&D, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Industry: Transportation, Knowledge Center-MTI, News-MTI, Whitepapers-MTI
MTI Instruments Whitepaper: Capacitance Guide for Industrial Applications
Capacitance Guide for Industrial Applications This guide from MTI Instruments explains what you need to know about using electrical capacitance for measurement in industrial applications, including advanced manufacturing. Basic Principles Capacitance is the ratio of the change in an electric charge to the corresponding change in its electrical potential (i.e., voltage). Capacitors, components that that have the “capacity” to store an electric charge, consist of conductive parallel plates that don’t touch or connect with each other. Instead, these metal plates are electrically-separated by air or a layer of insulating material (i.e., the dielectric). MTI’s [...]
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity GalleryWhitepaper: Semiconductor Wafer Measurement for Increased Productivity
Brand-GaGe, Brand-MTI, Brand-Vitrek, Brands-All, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-OEM, Industry-Semiconductor, Industry-Semiconductor-MTI, Knowledge Center-MTI, News-Industry, News-MTI, Whitepapers-MTI
Whitepaper: Semiconductor Wafer Measurement for Increased Productivity
Semiconductor Wafer Measurement for Increased Productivity This three-part article describes how manufacturers leverage capacitance-based inspection systems for semiconductor wafers. The article reviews best-practices, consequences of failing to inspect semiconductor wafers and benefits of using semi-automated, fully-automated and manual systems for wafer metrology and inspection. Part 1: Why Disc Geometry Matters in Wafer Production Semiconductor wafers are cut from cylindrical silicon crystals, or ingots. The flatness of these disc-shaped wafers is controlled to tight tolerances to ensure that the entire wafer surface is suitable for integrated circuit (IC) production. If disc geometry is out-of-spec [...]
MTI Video: Wafer Inspection & Metrology Startup (Proforma 300iSA)
https://youtu.be/mawagL6Yg3U
Product Education & Training
Education & Training Vibration Measurement & Engine Rotor Balancing High-Speed Data Acquisition Products for Streaming Applications Industry Application Webinars Test & Measurement Solutions for Semiconductor Manufacturers GaGe Digitizers in Ultrasonic Applications Electrical Safety & Compliance Testing for Printed Circuit Board Manufacturers Vitrek Products for Metrologists & Calibration Labs Vitrek Electrical Safety Testing for the Appliance & Consumer Product Industries Compliance Testing for the Lighting Industry Webinar Vitrek [...]
Selecting a Displacement Sensor / Measuring System
Capacitive displacement sensors Capacitive displacement sensors are non-contact devices that are used for measurements at a high-resolution. It can also be used to check the position of any conductive object as well as measure the width or density of non-conductive materials. Capacitive displacement sensors have a large variety of uses including precision thickness measurements, assembly line testing, assembly metrology, and semiconductor processing. Capacitive displacement sensors can be found in manufacturing facilities all around the globe. There’s more to selecting the proper type of displacement sensor and measurement system than meets the eye. To select the appropriate type of device [...]
Target Material and Characteristics
Target Material and Characteristics Transparent/Opaque Targets There are a number of measurement systems that are capable of measuring a target that is opaque. When it comes to transparent targets, the measurement system being used must match the material of the target being measured. For example, if you’re attempting to measure plastic you should use a contact-type measurement system such as a micrometer. When performing a soft target measurement, such as film, a non-contact measurement system (such as a laser displacement sensor) should be utilized. Hard/Soft Targets Objects made out of hard material (such as a block of wood), would [...]