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Disk Drive Track Scanning

Disk Drive Track Scanning Customer Case The customer is trying to digitize an 83 millisecond long signal coming out of a disk mounted on a rotary motor. This corresponds to one full revolution of the disk. The analog signal coming out of the Device Under Test (DUT) is of approximately 2 MHz bandwidth. Currently, the customer is sampling at 10 MSPS and would like to increase the oversampling to get better time resolution. At present, they are using a CompuScope 225 - 1M, which has sufficient memory to digitize the entire revolution in on-board memory at the 10 MSPS [...]

By |March 11th, 2023|Comments Off on Disk Drive Track Scanning

EV Batteries Need Thickness Gauging for Lower Costs and Higher Performance

EV batteries need to cost less and last longer. Until the e-mobility industry solves these challenges, electric vehicle (EV) adoption won’t match the hype that’s driven by Tesla, the established automakers, and a host of startups who are attracting investors. According to Axios, the expense of owning an electric vehicle will exceed that of owning a conventional one until EV batteries cost less than $100/KWh to produce. Unfortunately, the EV industry isn’t expected to hit that target for another ten years. Yet, there is some encouraging news. Less expensive and better performing EV batteries are just a few years [...]

Transducer Selection for High Resolution Applications

High resolution applications do not always require an interferometer. If you want to make accurate measurements in the micron to picometer range, then an MTI Digital Accumeasure D100 HD or D200 system may be what you need. Laser interferometers can sell for more than $15,000 and be difficult to setup. For example, you may have to buy additional optics to guarantee a good return signal since the laser beam must reflect off a mirror surface or precision retro reflector in order for the beam to re-enter the interferometer’s optics at less than a degree of reflection angle. The downsides [...]

MEMS-Based High Throughput Screening

MEMS-Based High Throughput Screening Customer Case The customer needs to do frequency analysis to determine the resonant frequency of an oscillating micro-fabricated device. They will use a Laser Doppler Vibrometer to monitor the physical oscillation. This is an instrument that looks at the light reflected from the surface of a moving part to determine the velocity or relative position of the part. Analysis of the motion as a function of the driving frequency determines the resonant frequency. Upon excitation at the resonant frequency, the motion is at its maximum. The expected resonant frequencies are on the order of 1 [...]

By |March 11th, 2023|Comments Off on MEMS-Based High Throughput Screening

Automatic Accelerometer Calibration System

Automatic Accelerometer Calibration System Customer Case The customer's Automated Accelerometer Calibration System provides NIST traceable calibration of most accelerometer types, whether self-generating piezo-electric or accelerometers requiring current or voltage excitation. The output of the accelerometer can be charge or voltage, single- ended or differential, AC or DC coupled, isolated or grounded. In building the automatic calibration system, the need is for optimum versatility with regards to the data acquisition card. LabVIEW is the desired control software, and Signal to Noise Ratio and high vertical resolution is of utmost importance for the small variations that occur in Vibration and Shock [...]

By |March 11th, 2023|Comments Off on Automatic Accelerometer Calibration System

High Resolution Semiconductor Wafer Measurements at Lower Costs

MTI's Proforma technology characterizes semiconductor wafers in terms of bow and warp, thickness, total thickness variation (TTV) and center thickness. Until recently, semiconductor wafer measurements at resolutions less than 100 µm were cost-prohibitive.  Moreover, only expensive devices such as interferometers were capable of these measurements. Today, the semiconductor industry can use capacitance gauges instead of laser interferometers to achieve high resolution at fraction of the cost. Much like affordable CCD cameras transformed and expanded the market for video, cost-effective capacitance is disrupting the semiconductor wafer measurement market and creating new opportunities for quality testing and validation. The [...]

By |July 22nd, 2020|Categories: Application Notes-MTI, Brand-MTI, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, Products-MTI-Capacitance, Products-MTI-Semiconductor/Metrology, Z-REPUB, z1|Comments Off on High Resolution Semiconductor Wafer Measurements at Lower Costs

Measure Wafer Bow, Warp and TTV with Capacitance

The flatness of silicon wafers used to manufacture integrated circuits is controlled to tight tolerances to help ensure that the whole wafer is sufficiently flat for lithographic processing. To ensure your wafer manufacturing process is within tolerance, you need to measure the wafers being produced. Various measurement techniques exist to verify process tolerances and eliminate expensive scrap wafers. Non-contact capacitive sensing is a highly precise and cost-effective means to measure wafer flatness, bow, warp, and total thickness variation (TTV). MTI Instruments’ Proforma 300i and 300iSA systems use capacitance sensors to improve yields while reducing costs through better dimensional control of [...]

Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data

Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data Customer Case A customer wants to digitize data from a 256x256 infrared charge-couple device (CCD) array. The array data is clocked at 4 MHz through two output channels. Exactly two clock cycles occur between 12-bit line signals, and a dozen or more clock cycles occur between successive frames. The customer wants to digitize the data for a minute or more. Since light level signals from the array can vary widely in amplitude, 12-bit resolution is required. GaGe Case Solution The customer will use the CompuScope 512/PCI with the External [...]

By |March 12th, 2023|Comments Off on Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data

How to Measure Dielectric Separator Thickness in EV Batteries

The International Energy Agency predicts that as many as 125 million electric vehicles (EVs) will be on the road by 2030. At the heart of these electric cars, trucks, and buses is the lithium-ion (Li-ion) battery, a type of rechargeable battery with high energy density and low self-discharge. The plates in Li-ion batteries consist of lithium compounds that are applied to either a copper plate substrate (cathode) or an aluminum substrate (anode). In turn, these two plates are separated by a dielectric separator. All of the layers in an EV battery are extremely thin. In fact, the cathode and [...]

Medical

Medical The following example case studies demonstrate how GaGe products and services have been successfully applied in various data acquisition medical applications. We encourage you to contact us and discuss your application in more detail with our engineering team. GaGe can provide tailored custom hardware and software solutions to meet specific application requirements. Did You Know? GaGe Digitizers in Medical Applications View Article Did You Know? GaGe Digitizers in Imaging & Ultrasound Applications View Article Did You Know? GaGe Digitizers in Cancer & Diagnostic Applications View Article Did You Know? [...]

By |March 12th, 2023|Comments Off on Medical
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