Electron Spin Resonance (ESR) Experiment
Electron Spin Resonance (ESR) Experiment Customer Case A customer has an Electronic Spin Resonance (ESR) experiment. ESR is based on the fact that the magnetic moment of an electron precesses in an applied magnetic field, not unlike a child's top in a gravitational field, at a well-defined frequency called the Larmor frequency. Electromagnetic radiation at the Larmor frequency, when impinging on such an electron, will be preferentially absorbed. This principle is identical to that employed in Nuclear Magnetic Resonance (NMR), where the atomic nucleus precesses. In NMR, Larmor frequencies are of order 100 MHz. Because the electron is 2000 [...]
Microsoft Windows 7 Security Advisory and Impact on MTI PBS-4100+ Users
Learn about this important security advisory and its impact on MTI-PBS-4100+ users. What is the Microsoft Windows 7 Security Advisory? Microsoft will no longer provide maintenance on Windows Version 7 in January of this year after 10-years of supporting the product. Microsoft does this across their product lines (not just Windows) in order to continue to evolve their products and invest their resources on the more recent versions. This means that Microsoft will no longer release any updates for that version of Windows, including bug fixes or security updates. For details on this activity by Microsoft, please visit their [...]
Nuclear Ion Testing
Nuclear Ion Testing Customer Case This customer is involved in nuclear ion testing. The pulse amplitudes of nuclear ions from a detector must be measured and sorted into a histogram, which will show the number of times a given amplitude was received. The customer wants a "multi-channel analyzer" capable of analyzing 4,000 to 8,000 "channels." In the customer's terminology, "channels" are actually histogram bins. The customer has pulses coming in at 20 - 30 ms minimum interval and needs to peak detect (calculate the maximum value of the pulse). Then, based on peak height, each is stored in a [...]
Trends in High Resolution Sensors for Semiconductor Metrology and Inspection GalleryTrends in High Resolution Sensors for Semiconductor Metrology and Inspection
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Trends in High Resolution Sensors for Semiconductor Metrology and Inspection
High resolution sensors are supporting improvements in semiconductor metrology and inspection at vital points in the production process. Because the fabrication of semiconductor wafers may require hundreds of steps and weeks of manufacturing time, early-stage defects that go undetected can have costly downstream consequences. Plus, because semiconductor processing always requires a high degree of precision, advances in fabrication methods seem to require ever-finer measurements in a never-ending quest. Today’s metrology instruments are incorporating high resolution sensors for automated wafer inspection. Resolution, the smallest measurement that a sensor can reliably indicate, may be given in dimensional units such as nanometers [...]
Alpha Particle Counting
Alpha Particle Counting Customer Case A customer has to characterize a new design for a solid state alpha particle detector. The detector is essentially a silicon diode with a large area face. Because alpha particles, which are high-speed helium nuclei, are electrically charged, they interact strongly with matter and lose their energy quickly upon entering a solid. When an alpha particle decelerates within the depletion region of the diode, it creates electron-hole pairs. The carriers are collected by the diode's electrodes and create a measurable current pulse. The customer's experimental solid state detector has two implanted electrodes whose signals [...]
Laser Spectroscopy
Laser Spectroscopy Customer Case An academic researcher is studying the attenuation properties of different materials inside Laser cavities for applications in Laser Spectroscopy. The Laser pulses are generated by one Laser, and are then transmitted by mirrors into another cavity filled with gaseous material. In the second cavity, the light pulses are continuously reflected by opposite mirrors and their intensities are measured by a transducer which converts them into decaying pulses of 30 nanosecond width. The decay takes about 40 microseconds to settle. The researcher is required to capture the decaying pulses and save the captured data onto the [...]
Fiber Optic Sensor Measures Very Small Movements in Piezo Stacks
MTI Instruments, a global supplier of precision measurement solutions, has released an application note that explains how to measure very small movements in piezo devices that convert mechanical energy into electrical energy. Precision measurement of these dynamic, oscillatory motions is required for the research and development (R&D), testing, and troubleshooting of piezo ceramic materials, advanced ceramics that are used in actuators, sensors, and the power modules of ultrasonic welders. Piezo applications range from automotive sensors and medical devices to engineering projects and consumer products. MTI’s App Note explains how its MTI-2100 Fotonic sensor, when used in conjunction with a [...]
Laser Transient Absorption Spectroscopy
Laser Transient Absorption Spectroscopy Customer Case The customer's setup is a scientific application in which transient signals from a Laser Absorption Spectroscope are transferred to a computer. The laser power is modified in steps and the process is repeated. The measurement sensitivity is limited by noise generated by the current digitizer. The customer wants to capture and continuously average very small pulse responses. The lowest signal pulse height is 0.5 milliVolts and can range up to 2 mV. The duration of each response pulse is 1 to 10 microseconds. The Pulse Repetition Frequency (PRF) is 10 Hz. The customer's [...]
Laser Measurement & Characterization of Flat Panel Displays
Laser Measurement & Characterization of Flat Panel Displays Customer Case This customer's application involves the characterization of flat panel displays (used in laptop computers, computer game displays, etc.) via laser scanning. The laser is bounced off a number of mirrors and then through lenses, from which it is scattered. The scattered laser light must then be analyzed in order to determine the quality of the flat panel display. This laser measurement system is used not only by flat panel display industries, but also by disk drive manufacturers to analyze platter quality and, in the near future, for characterizing silicon [...]
Laser Signals Striking Silicon-Diode Target
Laser Signals Striking Silicon-Diode Target Customer Case The customer wants to capture the output of some silicon diodes looking at a laser target. The typical signal is anywhere from 20mv to 1V in amplitude and 0 to 15ns in length. There are up to 16 of these diodes that are looking at the same target. Each diode has a different filter so the post-trigger depth and amplitude-scale must be user-adjustable. Their main interest is to sample and digitize the signals for archiving, with later retrieval and plotting. Fancy software is not needed for display as the data is gathered [...]