Press Release: Vitrek Announces New SE Series High Voltage Safety Enclosures GalleryPress Release: Vitrek Announces New SE Series High Voltage Safety Enclosures
Brand-Vitrek, Industry-Automotive, Industry-Cable Test, Industry-Compliance Testing, Industry-Consumer Products, Industry-Education, Industry-Electronics, Industry-Lighting, Industry-Manufacturing, New & Press Releases, News-Products, News-Vitrek, Press Releases-Vitrek, Products-Vitrek-Hipot, z1
Press Release: Vitrek Announces New SE Series High Voltage Safety Enclosures
Vitrek Announces the SE Series of High Voltage Safety Enclosures The SE Series offers the utmost in operator safety for high voltage testing with solid aluminum frame construction, a durable acrylic cover and a magnetic interlock safety switch. […]
EV Batteries Need Thickness Gauging for Lower Costs and Higher Performance GalleryEV Batteries Need Thickness Gauging for Lower Costs and Higher Performance
Application Notes-MTI, Brand-MTI, Industry-Automotive, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry: Transportation, News-MTI, Products-MTI, Products-MTI-Capacitance, Products-MTI-Laser/Fiber Optic, Z-REPUB, z1
EV Batteries Need Thickness Gauging for Lower Costs and Higher Performance
EV batteries need to cost less and last longer. Until the e-mobility industry solves these challenges, electric vehicle (EV) adoption won’t match the hype that’s driven by Tesla, the established automakers, and a host of startups who are attracting investors. According to Axios, the expense of owning an electric vehicle will exceed that of owning a conventional one until EV batteries cost less than $100/KWh to produce. Unfortunately, the EV industry isn’t expected to hit that target for another ten years. Yet, there is some encouraging news. Less expensive and better performing EV batteries are just a few years [...]
Automatic Accelerometer Calibration System
Automatic Accelerometer Calibration System Customer Case The customer's Automated Accelerometer Calibration System provides NIST traceable calibration of most accelerometer types, whether self-generating piezo-electric or accelerometers requiring current or voltage excitation. The output of the accelerometer can be charge or voltage, single- ended or differential, AC or DC coupled, isolated or grounded. In building the automatic calibration system, the need is for optimum versatility with regards to the data acquisition card. LabVIEW is the desired control software, and Signal to Noise Ratio and high vertical resolution is of utmost importance for the small variations that occur in Vibration and Shock [...]
Transducer Selection for High Resolution Applications GalleryTransducer Selection for High Resolution Applications
Application Notes-MTI, Brand-MTI, News-MTI-Instrumentation, News-MTI-Metrology, News-Product Updates, News-Products, Products-MTI-Capacitance, Products-MTI-Laser/Fiber Optic, Products-MTI-Semiconductor/Metrology, Products-MTI-Signal Generators, Z-REPUB, z1
Transducer Selection for High Resolution Applications
High resolution applications do not always require an interferometer. If you want to make accurate measurements in the micron to picometer range, then an MTI Digital Accumeasure D100 HD or D200 system may be what you need. Laser interferometers can sell for more than $15,000 and be difficult to setup. For example, you may have to buy additional optics to guarantee a good return signal since the laser beam must reflect off a mirror surface or precision retro reflector in order for the beam to re-enter the interferometer’s optics at less than a degree of reflection angle. The downsides [...]
Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data
Deep PCI Capture of Fast Charge-Couple Device (CCD) Array Data Customer Case A customer wants to digitize data from a 256x256 infrared charge-couple device (CCD) array. The array data is clocked at 4 MHz through two output channels. Exactly two clock cycles occur between 12-bit line signals, and a dozen or more clock cycles occur between successive frames. The customer wants to digitize the data for a minute or more. Since light level signals from the array can vary widely in amplitude, 12-bit resolution is required. GaGe Case Solution The customer will use the CompuScope 512/PCI with the External [...]
Check Out Vitrek’s Available Education and Product Training Resources
At Vitrek, we do more than just design and build high-quality electrical testing equipment — we ensure that our customers have all of the tools that they need to succeed when using our products. Here, we offer an overview of the plethora of educational resources that we have available on our website. […]
High Resolution Semiconductor Wafer Measurements at Lower Costs
MTI's Proforma technology characterizes semiconductor wafers in terms of bow and warp, thickness, total thickness variation (TTV) and center thickness. Until recently, semiconductor wafer measurements at resolutions less than 100 µm were cost-prohibitive. Moreover, only expensive devices such as interferometers were capable of these measurements. Today, the semiconductor industry can use capacitance gauges instead of laser interferometers to achieve high resolution at fraction of the cost. Much like affordable CCD cameras transformed and expanded the market for video, cost-effective capacitance is disrupting the semiconductor wafer measurement market and creating new opportunities for quality testing and validation. The [...]
Measure Wafer Bow, Warp and TTV with Capacitance GalleryMeasure Wafer Bow, Warp and TTV with Capacitance
Application Notes-MTI, Brand-MTI, Industry-Battery, Industry-Compliance Testing, Industry-Consumer Products, Industry-Electronics, Industry-Manufacturing, Industry-Semiconductor, Industry-Semiconductor-MTI, Industry-Sensors, Products-MTI-Capacitance, Z-REPUB, z1, ZOK
Measure Wafer Bow, Warp and TTV with Capacitance
The flatness of silicon wafers used to manufacture integrated circuits is controlled to tight tolerances to help ensure that the whole wafer is sufficiently flat for lithographic processing. To ensure your wafer manufacturing process is within tolerance, you need to measure the wafers being produced. Various measurement techniques exist to verify process tolerances and eliminate expensive scrap wafers. Non-contact capacitive sensing is a highly precise and cost-effective means to measure wafer flatness, bow, warp, and total thickness variation (TTV). MTI Instruments’ Proforma 300i and 300iSA systems use capacitance sensors to improve yields while reducing costs through better dimensional control of [...]
Medical
Medical The following example case studies demonstrate how GaGe products and services have been successfully applied in various data acquisition medical applications. We encourage you to contact us and discuss your application in more detail with our engineering team. GaGe can provide tailored custom hardware and software solutions to meet specific application requirements. Did You Know? GaGe Digitizers in Medical Applications View Article Did You Know? GaGe Digitizers in Imaging & Ultrasound Applications View Article Did You Know? GaGe Digitizers in Cancer & Diagnostic Applications View Article Did You Know? [...]
Laser Scanning for Eye Diseases
Laser Scanning for Eye Diseases Customer Case In scanning for non-ablative eye diseases, the customer has a requirement for high vertical resolution while remaining cost effective. By shooting a low-powered laser into the eye (low enough to not cause lasting damage), they are able to determine whether there are any problems in the eye cells. The laser does cause minute damage that is repaired by the antibodies of the eye. The requirement is to capture laser reflections and analyze them. The scan takes place over the entire eye and there are therefore multiple acquisitions. The main obstacle is that [...]